Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2012
12/26/2012CN102841271A Electromagnetic compatibility testing platform for electric control unit of double-clutch automatic transmission
12/26/2012CN102841270A Capacitive touch screen testing device
12/26/2012CN102841269A Comprehensive power protection method and device
12/26/2012CN102841238A Over-current detection circuit for motor
12/26/2012CN102841222A Multiple direction burn-in testing apparatus of display-panel modules
12/26/2012CN102841049A Method and device for controlling dust tester for carrying out testing
12/26/2012CN102840954A Mechanical vibration testing method of lightning arrester used for 1000-kV alternative-current transmission line
12/26/2012CN102840917A Transmission and distribution electromagnetic spectrum joint detector
12/26/2012CN102837620A Electric quantity detection and display device and method thereof
12/26/2012CN102837614A Failure detection device for vehicle
12/26/2012CN102338672B Internal temperature rise test and monitoring method of GIS
12/26/2012CN102253330B Dynamometric electric servo loading device
12/26/2012CN102184656B Power frequency parameter simulation system for power transmission line and control method of power frequency parameter simulation system
12/26/2012CN102184432B System for testing reflecting sensitivity of electronic label
12/26/2012CN102183699B Method for model mismatching detection and positioning of multivariate predictive control system in chemical process
12/26/2012CN102169158B Steady state oscillograph for power system
12/26/2012CN102162829B Experimental device for multiple lightning current return strokes of surge protection device (SPD)
12/26/2012CN102156254B Automatic cruise detection system for detecting damage and aging of battery cell in solar photovoltaic cell component
12/26/2012CN102110626B Method for determining minimum measurable length of serpentine metal wires in wafer
12/26/2012CN102103170B In-situ detection device of anti-skidding electrical control system
12/26/2012CN102095950B Overall test and construction method of differential protection system of large-scale transformer
12/26/2012CN102087321B Internal temperature rise on-line monitoring method of traction transformer of V/X connection
12/26/2012CN102081137B Intelligent AC withstand-voltage test system and full-automatic high-voltage test box special for same
12/26/2012CN102043117B Test apparatus for electronic device package and method for testing electronic device package
12/26/2012CN101980037B Comprehensive test device for linear motor motion system
12/26/2012CN101937034B Durability test stand for vehicle distribution box
12/26/2012CN101902054B Charging state indication device and charger
12/26/2012CN101865970B Automatic voltage-withstanding grounding test system for display and voltage-withstanding grounding test method thereof
12/26/2012CN101839956B Secondary cable alignment device
12/26/2012CN101828122B Don't-care bit extraction method
12/26/2012CN101828121B Logical value determination method
12/26/2012CN101825679B Method for measuring cathode characteristic of discharge lamp
12/26/2012CN101788646B ATE (Automatic Test Equipment) test method of FPGA (Field Programmable Gate Array) configuration device
12/26/2012CN101706541B Detection device for fault current experiment of direct-current transmission converter valve
12/26/2012CN101666826B Overvoltage online monitoring device based on dual time base sampling technology
12/26/2012CN101661082B Method for measuring power angle of synchronous generator
12/26/2012CN101614885B Device and method for contactless contacting of conducting structure
12/26/2012CN101141125B Fet monitoring and protecting system
12/25/2012US8341503 Methods and systems for storing data in memory using zoning
12/25/2012US8341482 User equipment using hybrid automatic repeat request
12/25/2012US8341477 Test board having a plurality of test modules and a test system having the same
12/25/2012US8341476 I-R voltage drop screening when executing a memory built-in self test
12/25/2012US8341475 Microprocessor comprising signature means for detecting an attack by error injection
12/25/2012US8341474 Moving all TAP controllers through update-IR state after selecting individual TAPs
12/25/2012US8341473 Microprocessor and method for detecting faults therein
12/25/2012US8341472 Apparatus and method for tamper protection of a microprocessor fuse array
12/25/2012US8341471 Apparatus and method for synchronization within systems having modules processing a clock signal at different rates
12/25/2012US8341469 Configuration device for configuring FPGA
12/25/2012US8341283 Method and system for peer-to-peer content dissemination
12/25/2012US8340940 Multiply apparatus for semiconductor test pattern signal
12/25/2012US8340939 Method and apparatus for selecting paths for use in at-speed testing
12/25/2012US8340934 Method of performance analysis for VRLA battery
12/25/2012US8340933 Method and apparatus for performing power supply self-diagnostics in redundant power architectures
12/25/2012US8340932 Vehicle power supply device and method of estimating state of charge of power storage device in vehicle power supply device
12/25/2012US8340930 Arrangement for protecting equipment of a power system
12/25/2012US8340829 Method and apparatus of detecting and compensating for DC residual fault currents on electrical systems
12/25/2012US8339987 Determining a congestion metric for a path in a network
12/25/2012US8339982 Method and device for power reduction in an LTE system
12/25/2012US8339979 Method and system for detecting a single data flow in an aggregate packet data flow and for identifying the application generating said single data flow
12/25/2012US8339976 Method of determining video quality
12/25/2012US8339974 Method and system for detecting and mitigating RTP-based denial of service attacks
12/25/2012US8339966 Adaptive error counter for a wireless field device
12/25/2012US8339961 Dynamic bandwidth allocation method and dynamic bandwidth allocation device
12/25/2012US8339960 Congestion control system
12/25/2012US8339957 Aggregate transport control
12/25/2012US8339942 RSVP-TE graceful restart under fast re-route conditions
12/25/2012US8339940 Multi-active detection method and stack member device
12/25/2012US8339939 Re-routing traffic flow in a packet switched communications transport network
12/25/2012US8339938 Method and system for automatically tracking the rerouting of logical circuit data in a data network
12/25/2012US8339275 AC voltage phase discriminator for circuit breaker locators
12/25/2012US8339272 Circuit breaker locator
12/25/2012US8339154 Built-in line test method
12/25/2012US8339153 Fault current test equipment of direct current thyristor valve
12/25/2012US8339152 Test structure activated by probe needle
12/25/2012US8339151 High voltage thyristor valve multi-injection test method
12/25/2012US8339150 Semiconductor integrated circuit
12/25/2012US8339145 Line testing
12/25/2012US8339143 Lens connector-testing device
12/25/2012US8339142 System for diagnosing sensors to find out abnormality therein
12/25/2012US8339141 Method and apparatus for locating a fault in an electrical conductor, with interference compensation
12/25/2012US8339139 System and method for testing a circuit
12/25/2012US8338758 Heater power control circuit and burn-in apparatus using the same
12/25/2012US8338215 Solar cell module and method for manufacturing the same
12/25/2012US8336651 Charge/discharge control device for secondary battery and hybrid vehicle using the same
12/25/2012US8336352 Transient detector and fault classifier for a power distribution system
12/25/2012US8336190 Method of calibrating a test instrument
12/21/2012CA2743892A1 Dc power supply insulation fault detection circuit
12/20/2012WO2012174281A1 An integrated circuit for testing using a high-speed input/output interface
12/20/2012WO2012173937A2 Cell modeling
12/20/2012WO2012173777A2 Probe module with interleaved serpentine test contacts for electronic device testing
12/20/2012WO2012173775A2 Shallow angle vertical rotary loader for electronic device testing
12/20/2012WO2012173627A1 Dynamic traffic offloading
12/20/2012WO2012173624A1 High speed controllable load
12/20/2012WO2012173507A1 Circuit arrangement, lighting apparatus and method of crosstalk-compensated current sensing
12/20/2012WO2012173379A2 Pin for a semiconductor chip test, and socket for a semiconductor chip test including same
12/20/2012WO2012173285A1 Vision inspection system for a semiconductor device of a test handler, and method therefor
12/20/2012WO2012173093A1 Method for measuring characteristics of electronic component
12/20/2012WO2012172976A1 Semiconductor integrated device, display device, and debugging method for semiconductor integrated device
12/20/2012WO2012172938A1 Method for inspecting electronic device and electronic device inspection apparatus
12/20/2012WO2012172620A1 Semiconductor integrated circuit and debug method