| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/14/2012 | CN102778628A Integrated circuit chip and testing method thereof |
| 11/14/2012 | CN102778627A Method and device for determining current-carrying capacity of cable |
| 11/14/2012 | CN102778626A Method and device for detecting overheat faults of GIS (Gas Insulated Switchgear) busbar joints |
| 11/14/2012 | CN102778625A Infrared detection method and device for power equipment |
| 11/14/2012 | CN102778624A Device and method for verifying power unit design of cascaded high-voltage frequency converter |
| 11/14/2012 | CN102778623A Self-powered electric power circuit fault detector |
| 11/14/2012 | CN102778622A Noise-contained small-signal detecting circuit based on non-saturation stochastic resonance mathematical model |
| 11/14/2012 | CN102778621A Portable test device for direct-current turnout switch machines |
| 11/14/2012 | CN102778620A Portable test device for alternating-current turnout switch machines |
| 11/14/2012 | CN102778619A Method for detecting maximum current-carrying capacity of transmission conductor of high-voltage transmission line |
| 11/14/2012 | CN102778618A Intelligent telegraph pole device |
| 11/14/2012 | CN102778617A Automatic testing method for reliability of keyboard input system |
| 11/14/2012 | CN102778616A Method of testing and monitoring joint health |
| 11/14/2012 | CN102778615A Error experiment device of zero sequence voltage mutual inductors |
| 11/14/2012 | CN102778614A Intelligent on-line monitoring system of lightning arrester |
| 11/14/2012 | CN102778613A Performance index test method of PIN-FET (p-intrinsic-n field effect transistor) light receiving assembly |
| 11/14/2012 | CN102778594A Insulation measurement probe unit and insulation measurement device |
| 11/14/2012 | CN102778292A Semiconductor examining device |
| 11/14/2012 | CN102774634A Integrated circuit turning device and control method |
| 11/14/2012 | CN102774401A System for automatic testing of shed-in and shed-out of locomotive |
| 11/14/2012 | CN102141188B Cable clamping device of electric power circuit fault indicator |
| 11/14/2012 | CN102128955B Auxiliary safety measure device for high-voltage test |
| 11/14/2012 | CN102116822B Method for detecting power failure of power grid for three-phase uninterruptable power supply |
| 11/14/2012 | CN102055408B Down-conversion and signal-conversion integrated system |
| 11/14/2012 | CN102055201B Power system low-frequency oscillation mechanism analysis method based on micro-disturbance signal oscillation mode recognition |
| 11/14/2012 | CN102054719B Method and structure for measuring circuit offset by using circuit substrate |
| 11/14/2012 | CN102054056B Rapid simulation method for anti-radiation property of field programmable gate array (FPGA) |
| 11/14/2012 | CN102053216B Static discharge test method |
| 11/14/2012 | CN102043112B Two-in-one audio line detector |
| 11/14/2012 | CN102043094B Super-high-temperature high-voltage dust specific resistance measuring device |
| 11/14/2012 | CN102012486B Voltage measuring tool special for storage battery |
| 11/14/2012 | CN101975878B Bistable radiation comb signal source |
| 11/14/2012 | CN101950000B Dragging device for large and medium hydro-generator attribute test |
| 11/14/2012 | CN101915889B Conductor sag on-line monitoring system |
| 11/14/2012 | CN101826490B Packaging structure and test method of semiconductor elements |
| 11/14/2012 | CN101799509B System and method for detecting armature winding of motor |
| 11/14/2012 | CN101776716B Line material mechanical &electrical integration testing machine and dedicated tensile test stand thereof |
| 11/14/2012 | CN101772709B Lifetime estimating method and deterioration suppressing method for lithium secondary cell, lifetime estimator and deterioration suppressor, battery pack using the same, and charger |
| 11/14/2012 | CN101762782B Method for compressing built-off self-test data of system-on-a-chip and special decoding unit thereof |
| 11/14/2012 | CN101755194B Method for monitoring the state of a force measuring device, force measuring device and force measuring module |
| 11/14/2012 | CN101751599B Circuit for improving test speed of contact type intelligent card chip |
| 11/14/2012 | CN101726667B Insulation detecting method and device for electric automobile |
| 11/14/2012 | CN101650975B Static random access memory ageing and screening method and chip ageing and screening method |
| 11/14/2012 | CN101617240B Traffic routing |
| 11/14/2012 | CN101606074B A method for processing data pertaining to an activity of partial electrical discharges |
| 11/14/2012 | CN101535824B Side-docking type test handler and apparatus for transferring test tray for same |
| 11/14/2012 | CN101495876B Power supply device and sequencer system |
| 11/14/2012 | CN101405609B Multi-stage test response compactors |
| 11/14/2012 | CN101371155B Battery state of charge voltage hysteresis estimator |
| 11/14/2012 | CN101344567B Method for determining location of phase-to-earth fault |
| 11/14/2012 | CN101223449B Apparatus, system and method for testing electronic elements |
| 11/14/2012 | CN101086521B Method and apparatus for real-time life estimation of an electric energy storage device |
| 11/14/2012 | CN101082632B Testing tool for circuit board |
| 11/14/2012 | CN101021490B Automatic detecting system and method for planar substrate |
| 11/13/2012 | US8312407 Integration of open space/dummy metal at CAD for physical debug of new silicon |
| 11/13/2012 | US8312334 Semiconductor test apparatus |
| 11/13/2012 | US8312333 Substrate processing system and data retrieval method |
| 11/13/2012 | US8312332 Device and method for testing and for diagnosing digital circuits |
| 11/13/2012 | US8312330 System and method for testing wireless devices |
| 11/13/2012 | US8312329 System and method for using a single vector signal generator to verify device under test |
| 11/13/2012 | US8312134 Reporting link layer status information using heterogeneous network handover module in mobile communication system |
| 11/13/2012 | US8311666 System and method for separating defective dies from wafer |
| 11/13/2012 | US8310956 System and method for implementing PNRP locality |
| 11/13/2012 | US8310949 System and method for enhanced physical layer device autonegotiation |
| 11/13/2012 | US8310941 Data driven connection fault management (DDCFM) in CFM maintenance points |
| 11/13/2012 | US8310939 Method, system, and device for configuring operation, administration and maintenance properties |
| 11/13/2012 | US8310933 Method and a device for reporting the number of correctly decoded transport blocks in a wireless system |
| 11/13/2012 | US8310932 System and method for sharing an access line bandwidth |
| 11/13/2012 | US8310929 Method and system for controlling data rates based on backhaul capacity |
| 11/13/2012 | US8310920 Method and system for accelerating transmission of data between network devices |
| 11/13/2012 | US8310916 Data transmission apparatus and a data transmission method |
| 11/13/2012 | US8310326 Method and apparatus for adjusting displacement current in an energy transfer element |
| 11/13/2012 | US8310273 Method of inspecting power converter and inspecting device |
| 11/13/2012 | US8310272 Method and system for testing electric automotive drive systems |
| 11/13/2012 | US8310271 Starter zero current test apparatus and method |
| 11/13/2012 | US8310270 Emulating behavior of a legacy test system |
| 11/13/2012 | US8310269 Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions |
| 11/13/2012 | US8310268 Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design |
| 11/13/2012 | US8310267 Semiconductor integrated circuit, and method for testing semiconductor integrated circuit |
| 11/13/2012 | US8310266 Device for characterizing the electro-optical performance of a semiconductor component |
| 11/13/2012 | US8310265 IC testing methods and apparatus |
| 11/13/2012 | US8310264 Method for configuring combinational switching matrix and testing system for semiconductor devices using the same |
| 11/13/2012 | US8310263 Control of tristate buses during scan test |
| 11/13/2012 | US8310262 Multiple testing bars for testing liquid crystal display and method thereof |
| 11/13/2012 | US8310261 Probing apparatus and probing method |
| 11/13/2012 | US8310260 Connecting device |
| 11/13/2012 | US8310259 Silicon carrier space transformer and temporary chip attach burn-in vehicle for high density connections |
| 11/13/2012 | US8310258 Probe for testing electrical properties of a test sample |
| 11/13/2012 | US8310257 Contact structure for inspection |
| 11/13/2012 | US8310256 Capacitive opens testing in low signal environments |
| 11/13/2012 | US8310255 Sensing probe for measuring device performance |
| 11/13/2012 | US8310254 Probe pin |
| 11/13/2012 | US8310253 Hybrid probe card |
| 11/13/2012 | US8310252 Testing a nonvolatile circuit element having multiple intermediate states |
| 11/13/2012 | US8310245 Modelling a power production network for distributing the load |
| 11/13/2012 | US8310244 Power interruption detecting system, electronic device and power interruption detecting device thereof |
| 11/13/2012 | US8310243 Local electrochemical impedance spectroscopy (LEIS) for detecting coating defects in buried pipelines |
| 11/13/2012 | US8310242 Circuit arrangement and method for insulation monitoring for inverter applications |
| 11/13/2012 | US8310240 Monitoring circuit for an energy store and method for monitoring an energy store |
| 11/13/2012 | US8310224 Automatic calibration circuit |