B82Y 35 - Methods or apparatus for measurement or analysis of nano-structures

Patents for B82Y 35 - Methods or apparatus for measurement or analysis of nano-structures (309)
10/2005
10/13/2005	US20050223785 Scanning probe device and processing method by scanning probe
08/2005
08/25/2005	WO2005077827A1 Carbon nanotube structure-selective separation and surface fixation
04/2005
04/06/2005	EP1520292A2 Software synchronization of multiple scanning probes
12/2004
12/22/2004	EP1488193A1 Device and method for maskless afm microlithography
07/2004
07/08/2004	US20040129891 Illuminant, and, electron beam detector, scanning electron microscope and mass spectroscope each including the same
05/2004
05/19/2004	CN1497657A Luminous body and electronic beam detector, scanning type electron microscope, quality analysis device containing it
01/2004
01/07/2004	EP1377794A1 Improved scanning probe microscope
10/2002
10/23/2002	EP1251383A2 Near-field light-generating element, near-field optical recording device, and near-field optical microscope
09/2000
09/06/2000	EP1032828A1 Electrostatic force detector with cantilever for an electrostatic force microscope

1 2 3 4