Patents for B82Y 35 - Methods or apparatus for measurement or analysis of nano-structures (309)
03/2015
03/03/2015US8973161 Method and apparatus for nanomechanical measurement using an atomic force microscope
03/03/2015US8969827 Specimen preparation for transmission electron microscopy
03/03/2015US8968545 Apparatus and method for molecular separation, purification, and sensing
02/2015
02/25/2015EP2839933A1 Particle adsorption probe
02/24/2015US8966661 System for fabricating nanoscale probe and method thereof
02/17/2015US8959661 Atomic force microscope probe, method for preparing same, and uses thereof
02/17/2015US8956813 Method and system for detection of a selected type of molecules in a sample
02/12/2015WO2015018865A1 Sample holder for an afm
02/12/2015WO2015018674A1 Insulator coated conductive probe and method of production thereof
02/11/2015EP2835654A1 Insulator coated conductive probe and method of production thereof
02/11/2015EP2835653A1 Sample holder for an AFM
02/11/2015EP2834652A1 Calibration of a mechanical property of spm cantilevers
02/11/2015EP2834651A1 Touch-screen based scanning probe microscopy (spm)
02/11/2015CN104345739A 原子力显微镜针尖基底微小距离控制方法 AFM tip base tiny distance control method
02/03/2015US8950011 Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope
02/03/2015US8950010 Method for measuring a piezoelectric response by means of a scanning probe microscope
02/03/2015US8945912 DNA sequencing and amplification systems using nanoscale field effect sensor arrays
01/2015
01/27/2015US8941057 Probe and method for obtaining three-dimensional compositional maps of a biological sample
01/22/2015WO2015007559A1 Method and device for bioassays
01/21/2015CN102928492B 二氧化钛纳米管阵列精密制备和原位测试分析系统 Titania nanotube arrays precise preparation and in situ measurement and analysis system
01/13/2015US8935811 Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage
01/13/2015US8934683 Model-based fusion of scanning probe microscopic images for detection and identification of molecular structures
01/13/2015US8932473 Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method
01/08/2015WO2015001119A1 Sample holder for an atomic force microscope
01/08/2015US20150013037 Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
01/07/2015EP2821796A1 Sample holder for an atomic force microscope
01/07/2015CN104271320A 颗粒吸附探头 Particles adsorbed probe
01/06/2015US8925376 Fully digitally controller for cantilever-based instruments
12/2014
12/30/2014US8923595 Method of identification of cancerous and normal cells
12/16/2014US8914911 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
12/16/2014US8914909 Frequency measuring and control apparatus with integrated parallel synchronized oscillators
12/16/2014US8912789 Magnetic force microscope and magnetic field observation method using same
12/10/2014CN104198663A 一种材料全温度段多场耦合性能的压痕系统及方法 Full temperature of a material segment multi-field coupling properties indentation system and method
12/10/2014CN103191589B 一种基于比吸光度的纳米流体的制备方法 A method for preparing absorbance ratio based nanofluids
12/09/2014US8910311 Probe assembly for a scanning probe microscope
12/02/2014US8904560 Closed loop controller and method for fast scanning probe microscopy
11/2014
11/25/2014US8898810 High throughout reproducible cantilever functionalization
11/25/2014US8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzed
11/18/2014US8893311 Three-dimensional imaging and manipulation
11/18/2014US8893309 Scanning tunneling microscope assembly, reactor, and system
11/18/2014US8887584 Load measuring apparatus
11/11/2014US8884222 Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package
11/04/2014US8878147 Method and apparatus for in situ preparation of serial planar surfaces for microscopy
10/2014
10/21/2014US8869311 Displacement detection mechanism and scanning probe microscope using the same
10/21/2014US8869310 Low drift scanning probe microscope
10/21/2014US8866505 Measurement apparatus
10/14/2014US8860260 High-scan rate positioner for scanned probe microscopy
10/14/2014US8857248 Piezoelectric microcantilevers and uses in atomic force microscopy
10/14/2014US8857247 Probe for a scanning probe microscope and method of manufacture
10/07/2014US8853856 Methodology for evaluation of electrical characteristics of carbon nanotubes
09/2014
09/30/2014US8849611 Intermodulation scanning force spectroscopy
09/23/2014US8844061 Scanning probe microscope
09/18/2014WO2014142710A1 Non-invasive method for laser nanodiagnostics of oncological diseases
09/17/2014EP2778649A1 Nanometer standard prototype and method for manufacturing nanometer standard prototype
09/16/2014US8835191 Nanowire stress sensors and stress sensor integrated circuits, design structures for a stress sensor integrated circuit, and related methods
09/09/2014US8832861 Near field optical microscope
09/09/2014US8832859 Probe alignment tool for the scanning probe microscope
09/09/2014US8831899 Inspecting apparatus and an inspecting method
09/09/2014US8828749 Methodology for evaluation of electrical characteristics of carbon nanotubes
09/09/2014US8828243 Scanning probe having integrated silicon tip with cantilever
09/02/2014US8822026 Carbon nanotube transparent films
08/2014
08/20/2014EP2766722A1 Nanoscale motion detector
08/19/2014US8813261 Scanning probe microscope
08/19/2014US8811631 Thermoacoustic device
08/19/2014US8810110 Micro-mechanical component with cantilever integrated electrical functional element
08/13/2014CN102569262B 一种纳米线围栅器件散热特性的测试结构和测试方法 A nano-wire fence device test structures and test methods of heat dissipation characteristics
08/07/2014WO2014105246A3 Nanofluidic sorting system for gene synthesis and pcr reaction products
08/05/2014US8798935 Imaging method and use thereof
08/05/2014US8796654 Scan device for microscope measurement instrument
07/2014
07/22/2014US8785850 Charging of a hole-free thin film phase plate
07/15/2014US8782810 Scanning probe microscope having support stage incorporating a kinematic flexure arrangement
07/02/2014CN103903942A 一种适用于纳米材料操控的多自由度纳米操作台 One for multi-degree of freedom manipulation of nanomaterials Nano Station
07/01/2014US8766630 Method and apparatus for monitoring a property of a sample
06/2014
06/25/2014CN103878392A 基于sem原位在线观测的纳米切削装置 Cutting means sem based on nano-situ observations online
06/19/2014WO2014090971A1 Method and device for controlling a scanning probe microscope
06/18/2014CN103868810A Loading fatigue property test system of micromechanical device
06/11/2014CN103858015A A microdevice for emitting electromagnetic radiation
06/11/2014CN102901763B Deoxyribonucleic acid (DNA) sequencing device based on graphene nanopore-microcavity-solid-state nanopore and manufacturing method
06/05/2014WO2014083358A1 Probe calibration or measurement routine
05/2014
05/30/2014WO2014080999A1 Noble metal nanoparticle aggregate reagent, and detection and heat generation method using said reagent
05/30/2014WO2014079450A1 Super-resolution near field imaging device
05/20/2014US8728286 Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same
05/14/2014EP2729816A1 A microdevice for emitting electromagnetic radiation
04/2014
04/22/2014US8702944 Nanopore device wetting
04/22/2014US8702940 Increased molecule capture rate into a nanopore
04/17/2014WO2014057268A1 Multiple probe actuation
04/16/2014CN103733051A Graphene defect detection
04/15/2014CA2702194C Gradient structures interfacing microfluidics and nanofluidics, methods for fabrication and uses thereof
04/10/2014WO2014055046A1 Method for performing the local charge transient analysis
03/2014
03/27/2014WO2014022330A3 Dispersible surface-enhanced raman scattering nanosheets
03/26/2014EP2710386A1 Device for ultra-precise positioning of an element and positioning system comprising such a device
03/06/2014WO2014033452A1 Multiple probe actuation
03/06/2014WO2014033451A1 Multiple probe detection and actuation
03/06/2014WO2014033430A1 Photothermal actuation of a probe for scanning probe microscopy
03/06/2014US20140060213 Portable nanoparticle sampler
02/2014
02/20/2014WO2014027928A1 Nanoscopy method
02/19/2014CN203443871U Free-surface-orientated ultra-precision nanoindentation and nanoscratch processing system
02/05/2014EP2693271A1 Apparatus and method for measuring the dimensions of 1-dimensional and 0-dimensional nanostructures in real-time during epitaxial growth
01/2014
01/30/2014WO2014016526A1 Device and method for characterizing a sample using localized measurements
01/22/2014CN103528996A Preparation method of gold nanorod SPR probe and method for detecting drug loading release kinetic process of the probe
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