Patents for B82Y 35 - Methods or apparatus for measurement or analysis of nano-structures (309) |
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05/10/2012 | WO2012061636A2 Improved system and methods for detection of airborne agents |
05/10/2012 | WO2012060782A1 Hard tip for scanning probe microscopy and method of its production |
05/02/2012 | EP2447723A1 Scanning probe microscope and probe proximity detection method therefor |
04/26/2012 | US20120097059 Nanowire ink compositions and printing of same |
04/19/2012 | DE102009023796B4 Vorrichtung und Verfahren zur Metallisierung von Rastersondenspitzen Apparatus and method for metallization of scanning probe tips |
04/04/2012 | EP2435829A1 Imaging method and use thereof |
03/28/2012 | EP2434521A2 Laser atom probe and laser atom probe analysis methods |
03/08/2012 | WO2012028822A1 Storage box for afm probes |
03/08/2012 | WO2012028314A1 Method for producing a measuring tip for a scanning probe microscope and measuring probe having a measuring tip produced according to said method |
03/01/2012 | US20120051973 TiO2 NANOSTRUCTURES, MEMBRANES AND FILMS, AND APPLICATIONS OF SAME |
02/23/2012 | US20120045838 Customized molecularly imprinted polymer (mip) units |
02/16/2012 | WO2012020264A1 Pipets containing electrolyte and electrodes |
02/16/2012 | US20120037515 Impedimetric sensors using dielectric nanoparticles |
02/08/2012 | EP2416164A2 Band excitation method applicable to scanning probe microscopy |
02/08/2012 | CN202141647U 跨尺度微纳米级原位三点弯曲力学性能测试平台 Cross-scale micro-situ nanoscale mechanical properties of three-point bending test platform |
01/25/2012 | CN102331376A Cross-scale micro-nano in-situ three-point bending mechanical performance testing platform |
01/11/2012 | EP2404164A1 A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid |
12/15/2011 | WO2011154877A1 Device for topographical characterisation and chemical mapping of surfaces |
12/15/2011 | US20110306084 Tritiated Planar Carbon Forms |
12/15/2011 | US20110305916 Polymer dispersions of vinylaromatic compounds and acrylate monomers prepared in the presence of seed latex and carbohydrate compounds |
12/06/2011 | CA2556562C Carbon nanotube structure-selective separation and surface fixation |
11/30/2011 | CN202057559U 基于双位移检测的微纳米尺度原位压痕测试装置 Based on double displacement detection of micro and nano-scale in situ indentation testing device |
11/30/2011 | CN202057549U 跨尺度微纳米级原位复合载荷力学性能测试平台 Cross-scale micro-nano-mechanical properties in situ composite load test platform |
11/30/2011 | CN102262016A 跨尺度微纳米级原位复合载荷力学性能测试平台 Cross-scale micro-nano-mechanical properties in situ composite load test platform |
11/03/2011 | WO2011134593A1 Photoconducting measuring tip, measurement arrangement, and method for producing and/or detecting electromagnetic field signals |
10/27/2011 | US20110259082 Method and capacitive sensor for counting aerosol nanoparticles |
10/12/2011 | CN102213669A Device and method for measuring granularity of dynamic light scattering nano particles of image |
09/29/2011 | US20110237000 Method for detecting an analyte molecule |
09/22/2011 | US20110226960 Carbon nanotube film composite structure, transmission electron microscope grid using the same, and method for making the same |
09/21/2011 | EP2367016A1 Method for processing output of scanning type probe microscope, and scanning type probe microscope |
09/14/2011 | CN102183535A Low-dimensional nano material identification method based on SEM image |
09/01/2011 | US20110212510 Polarization-enhanced detector with gold nanorods for detecting nanoscale rotational motion and method therefor |
08/25/2011 | US20110204258 Spectral imaging of photoluminescent materials |
08/16/2011 | US7999028 Method for fast dispersing carbon nanotube in aqueous solution |
08/03/2011 | EP2349638A1 A positioning system and method |
07/13/2011 | EP2342532A1 Modular atomic force microscope |
06/28/2011 | US7966881 Arrangement for detecting resonance frequency shifts |
06/09/2011 | US20110135061 Device and method for analyzing nanoparticles by combination of field-flow fractionation and x-ray small angle scattering |
05/25/2011 | EP2325657A1 Scanning type probe microscope |
05/05/2011 | US20110107473 Diamond-like carbon coated nanoprobes |
03/16/2011 | EP2296027A1 Optical microscope |
02/09/2011 | EP2282218A1 Microprobe with spring hanger array |
02/09/2011 | CN1957250B Electrochemical electrode using nickel-containing nanostructured material having dendrite structure as active layer, and method for producing the same |
01/19/2011 | EP2275798A1 Dynamic mode afm apparatus |
12/29/2010 | EP2267428A1 Scanning probe microscope and method of observing sample using the same |
12/08/2010 | EP2259043A1 Carbon nanotube support and process for producing the carbon nanotube support |
10/06/2010 | EP2235723A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby |
09/29/2010 | EP2232544A1 Defect classification utilizing data from a non-vibrating contact potential difference sensor |
09/08/2010 | EP2225557A1 A method of preserving a sensor in a container and a container containing a sensor and a storage solution |
08/31/2010 | US7785472 light irradiation in presence of a metal to cause carbon nanotubes to selectively induce a photocatalytic reaction, so metal ions are reduced resulting in metal deposition; selecting desired physical property by applying magnetic field or chromatography to precipitate; different redox potential |
08/11/2010 | EP2215637A1 Iterative feedback tuning in a scanning probe microscope |
06/16/2010 | EP2195635A2 Method and apparatus of automatic scanning probe imaging |
05/19/2010 | EP2187197A1 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program |
05/12/2010 | EP2183569A2 Fast-scanning spm and method of operating same |
05/12/2010 | CN1922106B Carbon nanotube structure-selective separation and surface fixation |
01/21/2010 | US20100013456 Arrangement for Detecting Resonance Frequency Shifts |
12/09/2009 | EP2131180A1 Atomic force microscope |
11/18/2009 | EP2120036A1 Measuring probe having one or more support elements for a measuring instrument |
11/18/2009 | EP2118637A2 Carbon nanotube device and process for manufacturing same |
11/11/2009 | EP2115423A1 Apparatus and method for the detection of forces in the sub-micronewton range |
10/01/2009 | US20090243637 Measuring apparatus having nanotube probe |
09/16/2009 | EP2101165A1 Method for creating and/or detecting a pyroelectric response, detector comprising a pyroelectric material and apparatus for investigating a sample comprising a pyroelectric material |
08/19/2009 | EP2090880A1 Pump probe measuring device, and scanning probe microscope apparatus using the device |
06/30/2009 | US7553513 Electrochemical electrode using nickel-containing nanostructured material having dendritic structure as active layer, and method for producing the same |
06/03/2009 | EP2065696A1 Simulator, simulation method and simulation program |
04/22/2009 | CN100481531C Luminous body, and electronic beam detector, scanning type electron microscope, quality analysis device comprising the same |
04/15/2009 | EP2048487A1 Scanning probe microscope |
03/25/2009 | EP2038087A2 Multiple frequency atomic force microscope |
01/28/2009 | EP2018527A1 An arrangement for detecting resonance frequency shifts |
01/21/2009 | EP2017610A1 Ionizing method and device by electrospray |
10/29/2008 | EP1985991A1 Measuring probe, sample surface measuring apparatus and sample surface measuring method |
10/08/2008 | EP1978348A1 Scanning probe microscope |
09/24/2008 | EP1972920A1 Scan type probe microscope |
08/13/2008 | EP1956607A1 AFM probe with variable stiffness |
04/16/2008 | EP1912055A1 Method of using an atomic force microscope and microscope |
03/19/2008 | EP1899107A2 Integrated displacement sensors for probe microscopy and force spectroscopy |
03/12/2008 | EP1307726B1 Method for detecting the wavelength-dependent behavior of an illuminated specimen |
02/27/2008 | EP1892499A2 Atomic force microscope for generating a small incident beam spot |
11/28/2007 | EP1860396A1 Homodyne laser interferometer probe and displacement measurement system using the same |
11/08/2007 | US20070258880 light irradiation in presence of a metal to cause carbon nanotubes to selectively induce a photocatalytic reaction, so metal ions are reduced resulting in metal deposition; selecting desired physical property by applying magnetic field or chromatography to precipitate; different redox potential |
11/01/2007 | WO2007123473A1 An arrangement for detecting resonance frequency shifts |
10/09/2007 | US7278299 Method of processing vertical cross-section using atomic force microscope |
07/18/2007 | EP1807684A2 Method and apparatus for enhanced nano-spectroscopic scanning |
05/02/2007 | EP1780529A1 Molecule measuring device and molecule measuring method |
05/02/2007 | CN1957250A Electrochemical electrode using nickel-containing nanostructured material having dendrite structure as active layer, and method for producing the same |
02/28/2007 | EP1756835A1 Method and apparatus for obtaining quantitative measurements using a probe based instrument |
02/28/2007 | CN1922106A Carbon nanotube structure-selective separation and surface fixation |
02/15/2007 | US20070037055 Electrochemical electrode using nickel-containing nanostructured material having dendritic structure as active layer, and method for producing the same |
12/13/2006 | EP1731894A1 Atom probe equipment and preliminary processing method for sample by it |
12/07/2006 | WO2006129413A1 Electrochemical electrode utilizing nickeliferous nanostructure of dendritic structure in active layer thereof and process for producing the same |
11/16/2006 | US20060254348 Scanning probe device and processing method of scanning probe |
11/16/2006 | US20060254347 Scanning probe device and processing method by scanning probe |
11/15/2006 | EP1722374A1 Method for determining the state of activation of a protein |
11/02/2006 | EP1717200A1 Carbon nanotube structure-selective separation and surface fixation |
09/27/2006 | EP1705475A2 Optical waveguide probe and its manufacturing method |
09/19/2006 | US7107826 Scanning probe device and processing method by scanning probe |
04/18/2006 | US7030388 Illuminant, and, electron beam detector, scanning electron microscope and mass spectroscope each including the same |
01/04/2006 | EP1611607A1 Method of fabricating semiconductor probe with resistive tip |
12/01/2005 | US20050262685 Method of processing vertical cross-section using atomic force microscope |
10/19/2005 | EP1587113A2 Stylus system for modifying small structures |