Patents for B82Y 35 - Methods or apparatus for measurement or analysis of nano-structures (309)
05/2012
05/10/2012WO2012061636A2 Improved system and methods for detection of airborne agents
05/10/2012WO2012060782A1 Hard tip for scanning probe microscopy and method of its production
05/02/2012EP2447723A1 Scanning probe microscope and probe proximity detection method therefor
04/2012
04/26/2012US20120097059 Nanowire ink compositions and printing of same
04/19/2012DE102009023796B4 Vorrichtung und Verfahren zur Metallisierung von Rastersondenspitzen Apparatus and method for metallization of scanning probe tips
04/04/2012EP2435829A1 Imaging method and use thereof
03/2012
03/28/2012EP2434521A2 Laser atom probe and laser atom probe analysis methods
03/08/2012WO2012028822A1 Storage box for afm probes
03/08/2012WO2012028314A1 Method for producing a measuring tip for a scanning probe microscope and measuring probe having a measuring tip produced according to said method
03/01/2012US20120051973 TiO2 NANOSTRUCTURES, MEMBRANES AND FILMS, AND APPLICATIONS OF SAME
02/2012
02/23/2012US20120045838 Customized molecularly imprinted polymer (mip) units
02/16/2012WO2012020264A1 Pipets containing electrolyte and electrodes
02/16/2012US20120037515 Impedimetric sensors using dielectric nanoparticles
02/08/2012EP2416164A2 Band excitation method applicable to scanning probe microscopy
02/08/2012CN202141647U 跨尺度微纳米级原位三点弯曲力学性能测试平台 Cross-scale micro-situ nanoscale mechanical properties of three-point bending test platform
01/2012
01/25/2012CN102331376A Cross-scale micro-nano in-situ three-point bending mechanical performance testing platform
01/11/2012EP2404164A1 A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid
12/2011
12/15/2011WO2011154877A1 Device for topographical characterisation and chemical mapping of surfaces
12/15/2011US20110306084 Tritiated Planar Carbon Forms
12/15/2011US20110305916 Polymer dispersions of vinylaromatic compounds and acrylate monomers prepared in the presence of seed latex and carbohydrate compounds
12/06/2011CA2556562C Carbon nanotube structure-selective separation and surface fixation
11/2011
11/30/2011CN202057559U 基于双位移检测的微纳米尺度原位压痕测试装置 Based on double displacement detection of micro and nano-scale in situ indentation testing device
11/30/2011CN202057549U 跨尺度微纳米级原位复合载荷力学性能测试平台 Cross-scale micro-nano-mechanical properties in situ composite load test platform
11/30/2011CN102262016A 跨尺度微纳米级原位复合载荷力学性能测试平台 Cross-scale micro-nano-mechanical properties in situ composite load test platform
11/03/2011WO2011134593A1 Photoconducting measuring tip, measurement arrangement, and method for producing and/or detecting electromagnetic field signals
10/2011
10/27/2011US20110259082 Method and capacitive sensor for counting aerosol nanoparticles
10/12/2011CN102213669A Device and method for measuring granularity of dynamic light scattering nano particles of image
09/2011
09/29/2011US20110237000 Method for detecting an analyte molecule
09/22/2011US20110226960 Carbon nanotube film composite structure, transmission electron microscope grid using the same, and method for making the same
09/21/2011EP2367016A1 Method for processing output of scanning type probe microscope, and scanning type probe microscope
09/14/2011CN102183535A Low-dimensional nano material identification method based on SEM image
09/01/2011US20110212510 Polarization-enhanced detector with gold nanorods for detecting nanoscale rotational motion and method therefor
08/2011
08/25/2011US20110204258 Spectral imaging of photoluminescent materials
08/16/2011US7999028 Method for fast dispersing carbon nanotube in aqueous solution
08/03/2011EP2349638A1 A positioning system and method
07/2011
07/13/2011EP2342532A1 Modular atomic force microscope
06/2011
06/28/2011US7966881 Arrangement for detecting resonance frequency shifts
06/09/2011US20110135061 Device and method for analyzing nanoparticles by combination of field-flow fractionation and x-ray small angle scattering
05/2011
05/25/2011EP2325657A1 Scanning type probe microscope
05/05/2011US20110107473 Diamond-like carbon coated nanoprobes
03/2011
03/16/2011EP2296027A1 Optical microscope
02/2011
02/09/2011EP2282218A1 Microprobe with spring hanger array
02/09/2011CN1957250B Electrochemical electrode using nickel-containing nanostructured material having dendrite structure as active layer, and method for producing the same
01/2011
01/19/2011EP2275798A1 Dynamic mode afm apparatus
12/2010
12/29/2010EP2267428A1 Scanning probe microscope and method of observing sample using the same
12/08/2010EP2259043A1 Carbon nanotube support and process for producing the carbon nanotube support
10/2010
10/06/2010EP2235723A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby
09/2010
09/29/2010EP2232544A1 Defect classification utilizing data from a non-vibrating contact potential difference sensor
09/08/2010EP2225557A1 A method of preserving a sensor in a container and a container containing a sensor and a storage solution
08/2010
08/31/2010US7785472 light irradiation in presence of a metal to cause carbon nanotubes to selectively induce a photocatalytic reaction, so metal ions are reduced resulting in metal deposition; selecting desired physical property by applying magnetic field or chromatography to precipitate; different redox potential
08/11/2010EP2215637A1 Iterative feedback tuning in a scanning probe microscope
06/2010
06/16/2010EP2195635A2 Method and apparatus of automatic scanning probe imaging
05/2010
05/19/2010EP2187197A1 Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program
05/12/2010EP2183569A2 Fast-scanning spm and method of operating same
05/12/2010CN1922106B Carbon nanotube structure-selective separation and surface fixation
01/2010
01/21/2010US20100013456 Arrangement for Detecting Resonance Frequency Shifts
12/2009
12/09/2009EP2131180A1 Atomic force microscope
11/2009
11/18/2009EP2120036A1 Measuring probe having one or more support elements for a measuring instrument
11/18/2009EP2118637A2 Carbon nanotube device and process for manufacturing same
11/11/2009EP2115423A1 Apparatus and method for the detection of forces in the sub-micronewton range
10/2009
10/01/2009US20090243637 Measuring apparatus having nanotube probe
09/2009
09/16/2009EP2101165A1 Method for creating and/or detecting a pyroelectric response, detector comprising a pyroelectric material and apparatus for investigating a sample comprising a pyroelectric material
08/2009
08/19/2009EP2090880A1 Pump probe measuring device, and scanning probe microscope apparatus using the device
06/2009
06/30/2009US7553513 Electrochemical electrode using nickel-containing nanostructured material having dendritic structure as active layer, and method for producing the same
06/03/2009EP2065696A1 Simulator, simulation method and simulation program
04/2009
04/22/2009CN100481531C Luminous body, and electronic beam detector, scanning type electron microscope, quality analysis device comprising the same
04/15/2009EP2048487A1 Scanning probe microscope
03/2009
03/25/2009EP2038087A2 Multiple frequency atomic force microscope
01/2009
01/28/2009EP2018527A1 An arrangement for detecting resonance frequency shifts
01/21/2009EP2017610A1 Ionizing method and device by electrospray
10/2008
10/29/2008EP1985991A1 Measuring probe, sample surface measuring apparatus and sample surface measuring method
10/08/2008EP1978348A1 Scanning probe microscope
09/2008
09/24/2008EP1972920A1 Scan type probe microscope
08/2008
08/13/2008EP1956607A1 AFM probe with variable stiffness
04/2008
04/16/2008EP1912055A1 Method of using an atomic force microscope and microscope
03/2008
03/19/2008EP1899107A2 Integrated displacement sensors for probe microscopy and force spectroscopy
03/12/2008EP1307726B1 Method for detecting the wavelength-dependent behavior of an illuminated specimen
02/2008
02/27/2008EP1892499A2 Atomic force microscope for generating a small incident beam spot
11/2007
11/28/2007EP1860396A1 Homodyne laser interferometer probe and displacement measurement system using the same
11/08/2007US20070258880 light irradiation in presence of a metal to cause carbon nanotubes to selectively induce a photocatalytic reaction, so metal ions are reduced resulting in metal deposition; selecting desired physical property by applying magnetic field or chromatography to precipitate; different redox potential
11/01/2007WO2007123473A1 An arrangement for detecting resonance frequency shifts
10/2007
10/09/2007US7278299 Method of processing vertical cross-section using atomic force microscope
07/2007
07/18/2007EP1807684A2 Method and apparatus for enhanced nano-spectroscopic scanning
05/2007
05/02/2007EP1780529A1 Molecule measuring device and molecule measuring method
05/02/2007CN1957250A Electrochemical electrode using nickel-containing nanostructured material having dendrite structure as active layer, and method for producing the same
02/2007
02/28/2007EP1756835A1 Method and apparatus for obtaining quantitative measurements using a probe based instrument
02/28/2007CN1922106A Carbon nanotube structure-selective separation and surface fixation
02/15/2007US20070037055 Electrochemical electrode using nickel-containing nanostructured material having dendritic structure as active layer, and method for producing the same
12/2006
12/13/2006EP1731894A1 Atom probe equipment and preliminary processing method for sample by it
12/07/2006WO2006129413A1 Electrochemical electrode utilizing nickeliferous nanostructure of dendritic structure in active layer thereof and process for producing the same
11/2006
11/16/2006US20060254348 Scanning probe device and processing method of scanning probe
11/16/2006US20060254347 Scanning probe device and processing method by scanning probe
11/15/2006EP1722374A1 Method for determining the state of activation of a protein
11/02/2006EP1717200A1 Carbon nanotube structure-selective separation and surface fixation
09/2006
09/27/2006EP1705475A2 Optical waveguide probe and its manufacturing method
09/19/2006US7107826 Scanning probe device and processing method by scanning probe
04/2006
04/18/2006US7030388 Illuminant, and, electron beam detector, scanning electron microscope and mass spectroscope each including the same
01/2006
01/04/2006EP1611607A1 Method of fabricating semiconductor probe with resistive tip
12/2005
12/01/2005US20050262685 Method of processing vertical cross-section using atomic force microscope
10/2005
10/19/2005EP1587113A2 Stylus system for modifying small structures
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