Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
07/2003
07/02/2003CN1427451A Semiconductor device and mfg. method thereof
07/02/2003CN1427429A 叠层电容器 Stacked capacitor
07/02/2003CN1427419A Nonvolatile semiconductor storage and operating method
07/02/2003CN1427416A Magnetic storage device with soft reference layer
07/02/2003CN1427415A Film magnet stroage device for parallel writing of multi-bit data
07/02/2003CN1427414A Magnetic storage device with magnetic shielding layer and mfg. method thereof
07/02/2003CN1427396A Magnetic recorder and mfg. method thereof
07/02/2003CN1427390A 显示装置以及电子仪器 Display device and electronic equipment
07/02/2003CN1427388A 图像显示装置 The image display apparatus
07/02/2003CN1427386A Display device and electronic apparatus
07/02/2003CN1427289A Substrate for electro-optics apparatus, electro-optics apparatus and electronic apparatus
07/02/2003CN1427285A Method of making silicon crystal liquid crystal display back plate
07/02/2003CN1426894A Display device, electronic apparatus and method for mfg. display device
07/02/2003CN1113467C Programmable switch, adjustable capacitance and resonant circuit effected by means of such switch
07/02/2003CN1113417C Field-effect transistor and solid-state antenna switch using same
07/02/2003CN1113416C Semiconductor device with longitudinal and transversal double-pole transistor
07/02/2003CN1113415C Semiconductor memory device and method of fabricating same
07/02/2003CN1113414C Semiconductor integrated circuit device
07/02/2003CN1113409C Method of mfg. semiconductor device having different orientations of crystal channel
07/02/2003CN1113403C Semiconductor device and method for producing same
07/02/2003CN1113402C Method for providing dual work function doping
07/02/2003CN1113401C Capacitor in integrated circuit and mfg. method thereof
07/02/2003CN1113395C Washing composition for making semiconductor device and method for making said device by using same
07/02/2003CN1113392C Radiation detector and imaging devices, mfg. method and use thereof
07/02/2003CN1113363C Semiconductor memory device with reduced power consumption and stable operation in data holding state
07/01/2003US6587976 Semiconductor device tester for measuring skew between output pins of a semiconductor device
07/01/2003US6587394 Programmable address logic for solid state diode-based memory
07/01/2003US6587384 Multi-function serial I/O circuit
07/01/2003US6587371 Memory device having wide margin of data reading operation, for storing data by change in electric resistance value
07/01/2003US6587365 Array architecture for depletion mode ferroelectric memory devices
07/01/2003US6587322 Swapped drain structures for electrostatic discharge protection
07/01/2003US6587320 Apparatus for current ballasting ESD sensitive devices
07/01/2003US6587276 Optical reproduction system
07/01/2003US6587147 Microlens array
07/01/2003US6587146 Three transistor active pixel sensor architecture with correlated double sampling
07/01/2003US6587145 Image sensors generating digital signals from light integration processes
07/01/2003US6586985 Methods and apparatus for trimming packaged electrical devices
07/01/2003US6586982 Semiconductor circuit having a combination circuit being switched between an active and inactive state
07/01/2003US6586981 Dynamic flip flop
07/01/2003US6586975 Semiconductor device
07/01/2003US6586962 Semiconductor device
07/01/2003US6586958 Voltage converter having switching element with variable substrate potential
07/01/2003US6586833 Packaged power devices having vertical power mosfets therein that are flip-chip mounted to slotted gate electrode strip lines
07/01/2003US6586824 Reduced thickness packaged electronic device
07/01/2003US6586818 Self-aligned silicon germanium heterojunction bipolar transistor device with electrostatic discharge crevice cover for salicide displacement
07/01/2003US6586817 Device including a resistive path to introduce an equivalent RC circuit
07/01/2003US6586816 Semiconductor structures formed using redeposition of an etchable layer
07/01/2003US6586815 In a fuse window
07/01/2003US6586812 Isolation of alpha silicon diode sensors through ion implantation
07/01/2003US6586811 Microlens, solid state imaging device, and production process thereof
07/01/2003US6586807 Semiconductor integrated circuit device
07/01/2003US6586805 Non-volatile semiconductor memory device
07/01/2003US6586804 Shallow trench isolation type semiconductor device and method of manufacturing the same
07/01/2003US6586803 Semiconductor device using an SOI substrate
07/01/2003US6586802 Semiconductor device
07/01/2003US6586796 Capacitor with high dielectric constant materials
07/01/2003US6586795 DRAM cell configuration whose memory cells can have transistors and capacitors with improved electrical properties
07/01/2003US6586794 Semiconductor device and its manufacture
07/01/2003US6586793 Ferroelectric memory and manufacturing method thereof
07/01/2003US6586792 Structures, methods, and systems for ferroelectric memory transistors
07/01/2003US6586790 Semiconductor device and method for manufacturing the same
07/01/2003US6586789 Pixel image sensor
07/01/2003US6586784 Accumulation mode clocking of a charge-coupled device
07/01/2003US6586782 Transistor layout having a heat dissipative emitter
07/01/2003US6586780 Semiconductor device for supplying output voltage according to high power supply voltage
07/01/2003US6586769 Display array with mutually connected lines that are disconnected at the time of mounting array drivers
07/01/2003US6586766 Semiconductor device with semiconductor circuit comprising semiconductor units, and method of fabricating it
07/01/2003US6586761 Phase change material memory device
07/01/2003US6586742 Method and arrangement relating to x-ray imaging
07/01/2003US6586338 Methods for creating elements of predetermined shape and apparatus using these elements
07/01/2003US6586329 Semiconductor device and a method of manufacturing thereof
07/01/2003US6586327 Fabrication of semiconductor devices
07/01/2003US6586317 Method of forming a zener diode in a npn and pnp bipolar process flow that requires no additional steps to set the breakdown voltage
07/01/2003US6586312 Method for fabricating a DRAM capacitor and device made
07/01/2003US6586311 Salicide block for silicon-on-insulator (SOI) applications
07/01/2003US6586310 High resistivity film for 4T SRAM
07/01/2003US6586308 Method for producing circuit structures on a semiconductor substrate and semiconductor configuration with functional circuit structures and dummy circuit structures
07/01/2003US6586304 Semiconductor-on-insulator transistor, memory circuitry employing semiconductor-on-insulator transistors, method of forming a semiconductor-on-insulator transistor, and method of forming memory circuitry employing semiconductor-on-insulator transistors
07/01/2003US6586303 Method for fabricating a mask ROM
07/01/2003US6586301 Method of fabricating EEPROM having tunnel window area
07/01/2003US6586300 Spacer assisted trench top isolation for vertical DRAM's
07/01/2003US6586299 Mixed mode process
07/01/2003US6586295 Semiconductor device manufacturing method and semiconductor device
07/01/2003US6586293 Semiconductor device and method of manufacturing the same
07/01/2003US6586290 Structure for ESD protection in semiconductor chips
07/01/2003US6586288 Method of forming dual-metal gates in semiconductor device
07/01/2003US6586286 Method for fabricating thin film transistor array substrate for liquid crystal display
07/01/2003US6586284 Silicon-on-insulator (SOI) substrate, method for fabricating SOI substrate and SOI MOSFET using the SOI substrate
07/01/2003US6586283 Apparatus and method for protecting integrated circuit charge storage elements from photo-induced currents
07/01/2003US6586282 Method of manufacturing a semiconductor device
07/01/2003US6586264 Method of calculating characteristics of semiconductor device having gate electrode and program thereof
07/01/2003US6586260 Integrated circuits
07/01/2003US6586161 For prevention of contamination of wafers, made of transition metal (platinum, ruthenium, copper, and perovskite) thin film wherein the edges are removed via orthoperiodic acid and nitric acid, then lithography
07/01/2003US6586153 Multilayer devices formed by multilayer thermal transfer
07/01/2003US6585914 N-type thiophene semiconductors
07/01/2003US6585821 Measuring absorption to determine reaction completion and terminating heating of lead acetate and diethylene glycol ethyl ether solution; lead di(ethylene glycol)ethyl ether precursor for lead germanium oxide (PGO) production
06/2003
06/30/2003CA2415324A1 Multilayer structure, used in particular as a material with high relative permittivity
06/30/2003CA2415312A1 Multilayer structure, used in particular as a material with high relative permittivity
06/30/2003CA2415309A1 Multilayer structure, used in particular as a material with high relative permittivity
06/30/2003CA2414400A1 Electronic component incorporating an integrated circuit and a planar microcondenser