Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2011
09/28/2011CN101713811B System for automatically testing parameters of quartz crystal oscillator
09/28/2011CN101706552B Configurable on-chip testing module supporting encapsulation of different pins of chip
09/28/2011CN101685641B Optical disc drive and optical storage medium
09/28/2011CN101685208B Mounting state inspection method for electronic component, mounting state inspection device for electronic component, and manufacturing method of electronic device
09/28/2011CN101685139B Simulation test system of large directly driven permanent magnet wind generating set
09/28/2011CN101672886B Insulating rope voltage resistant test device
09/28/2011CN101666838B Chip system and mode control method thereof
09/28/2011CN101601128B Test device for semiconductor device
09/28/2011CN101587164B Circuit test device
09/28/2011CN101545941B Method and system for detecting failure of electric energy station loop
09/28/2011CN101477177B On-line intelligent inspection tour instrument for essential resistance of multipath accumulator
09/28/2011CN101413979B Ageing change diagnostic device of portable cable
09/28/2011CN101388525B Apparatus for detecting contact corona and arc-drawing of high voltage switch cabinet
09/28/2011CN101371153B IC testing methods and apparatus
09/28/2011CN101349717B Jitter measuring device and method
09/28/2011CN101329387B Power supply test system
09/28/2011CN101326446B Abnormality judgment device and abnormality judgment method of power supply unit
09/28/2011CN101158700B Detecting probe card
09/27/2011US8028324 Method for transmitting policy information between network equipment
09/27/2011US8028213 Data transformation method and related device for a testing system
09/27/2011US8028212 Parallel scan paths with header data circuitry and header return circuitry
09/27/2011US8028211 Look-ahead built-in self tests with temperature elevation of functional elements
09/27/2011US8028210 Semiconductor device
09/27/2011US8028209 Scalable scan system for system-on-chip design
09/27/2011US8028208 Wireless radio frequency technique design and method for testing of integrated circuits and wafers
09/27/2011US8028100 Automated processing system employing intelligent module automatic recognition
09/27/2011US8027825 Structure for testing an operation of integrated circuitry
09/27/2011US8027801 Multi drive test system for data storage device
09/27/2011US8027800 Apparatus and method for testing a panel of interferometric modulators
09/27/2011US8027287 Apparatus and method for gating transmission of a data rate control channel in an HDR mobile communication system
09/27/2011US8027270 Methods and apparatus for breaking and resynchronizing a data link
09/27/2011US8027269 Method and arrangement for determining transmission delay
09/27/2011US8027267 Network condition capture and reproduction
09/27/2011US8027260 Mixed integer programming model for minimizing leased access network costs
09/27/2011US8027256 Multi-port network device using lookup cost backpressure
09/27/2011US8027185 Techniques for electrically characterizing tunnel junction film stacks with little or no processing
09/27/2011US8026736 Water-level charged device model for electrostatic discharge test methods, and apparatus using same
09/27/2011US8026735 Test handler
09/27/2011US8026734 Dual tip test probe assembly
09/27/2011US8026733 Interface structure of wafer test equipment
09/27/2011US8026732 Probe with bi-directional electrostatic actuation
09/27/2011US8026730 Process for measuring heat spreader tilt
09/27/2011US8026727 Circuit arrangement and system for use in a motor vehicle
09/27/2011US8026726 Fault testing for interconnections
09/27/2011US8026725 Optical fiber coupled antenna current monitor
09/27/2011US8026724 Projection lamp test device
09/27/2011US8026113 Method of monitoring a semiconductor processing system using a wireless sensor network
09/27/2011CA2624426C An apparatus and methods for controlling operation of a single-phase voltage regulator in a three-phase power system
09/24/2011CA2699596A1 System and method of phase synchronization of signals produced by respective units of measure
09/22/2011WO2011116352A1 Data recirculation in configured scan paths
09/22/2011WO2011116145A1 Test scheduling and test access in test compression environment
09/22/2011WO2011116116A2 Logic built-in self-test programmable pattern bit mask
09/22/2011WO2011116058A1 Transponder pool sizing in highly dynamic translucent wdm optical networks
09/22/2011WO2011115978A1 Side gripping mechanism and device handlers having same
09/22/2011WO2011115836A2 Configurable electronic device reprogrammable to modify the device frequency response
09/22/2011WO2011115522A1 Resistive (ballast) load testing module
09/22/2011WO2011115074A1 Contact probe and probe unit
09/22/2011WO2011115038A1 Semiconductor device, detection method, and program
09/22/2011WO2011114838A1 Solar cell evaluation device and method
09/22/2011WO2011114835A1 Solar simulator light-intensity evaluation device, solar simulator light-intensity evaluation method, solar cell evaluation device, and solar cell evaluation method
09/22/2011WO2011114449A1 Tft array inspection method and tft array inspection device
09/22/2011WO2011114428A1 Semiconductor device, and test method for same
09/22/2011WO2011113636A1 Method and device for detecting blocking or sluggishness of a dc motor
09/22/2011US20110231723 Flip-flop circuit and scan flip-flop circuit
09/22/2011US20110231722 On-chip comparison and response collection tools and techniques
09/22/2011US20110231719 Logic Built-In Self-Test Programmable Pattern Bit Mask
09/22/2011US20110231124 Battery model identification method
09/22/2011US20110231123 Battery Analysis Interface and Measurement System
09/22/2011US20110231122 Method and system for determining the kind of a battery
09/22/2011US20110231054 Battery state-of-health monitoring system and method
09/22/2011US20110227602 Probe station for on-wafer-measurement under emi-shielding
09/22/2011US20110227601 Test method of semiconductor integrated circuit and test system, and semiconductor integrated circuit
09/22/2011US20110227600 Method of testing semiconductor device
09/22/2011US20110227599 Semiconductor device test method and semiconductor device
09/22/2011US20110227598 Apparatus and method for inspecting homogeneity of solar cell quantum efficiency using imaging device
09/22/2011US20110227597 Test Adapter Configuration
09/22/2011US20110227595 Interface member, test section unit and electronic device handling apparatus
09/22/2011US20110227594 Electronic component contactor, apparatus for testing electronic component, and method for testing electronic component
09/22/2011US20110227593 Semiconductor device and test apparatus including the same
09/22/2011US20110227592 Method And Arrangement For Through-Line Mismatch RF Testing
09/22/2011US20110227583 Test system
09/22/2011US20110227582 Methods for detecting a hidden peak in wire fault location applications - improving the distance range resolution
09/22/2011US20110227581 Traveling wave based relay protection
09/22/2011US20110227559 Electric field measuring device
09/22/2011DE102010062412A1 Verfahren und System zum Bestimmen der Batterieart A method and system for determining the battery type
09/22/2011DE102010012154A1 Verfahren zum Überprüfen eines Zustands eines Stromkreises eines Kraftfahrzeugs A method for verifying a state of a circuit of a motor vehicle
09/22/2011DE102010012135A1 Method for detecting reverse polarity of electric component in motor car, involves preventing switch-on of electric component after reversing of polarity of component is carried out and documented by reverse polarity detection device
09/22/2011DE102010011854A1 Measuring head for contact of e.g. high-frequency components, has base body with central portion on top surface and edge area enclosing central portion, where contact region is arranged at distance over top surface
09/22/2011DE102010011476A1 Isolationstestverfahren für Photovoltaikgroßanlagen Insulation test method for large scale photovoltaic plants
09/22/2011DE102010003095A1 Planar, light sensitive semiconductor component i.e. solar cell, examining method, involves supplying characteristic of component as input value, and utilizing values of characteristic for recognizing damages or defects of component
09/22/2011DE102010002899A1 Verfahren zur Erkennung eines Kurzschlusses nach Batterie-Plus und Schaltungseinrichtung zur Durchführung des Verfahrens Method for detecting a short circuit to battery-Plus and circuit means for performing the method
09/22/2011DE102008025688B4 Leadbacker für Gravity-Handler Lead backers for Gravity Handler
09/21/2011EP2367018A1 AC impedance measuring device
09/21/2011EP2367017A2 Method for detecting capacity leakage of capacitor in power conditioner, power conditioner performing the same, and photovoltaic power system provided with the same
09/21/2011EP2366112A1 Method and apparatus for off-line testing of multi-phase alternating current machines
09/21/2011EP2366111A1 Testable integrated circuit and test method therefor
09/21/2011EP2366110A2 Method to digitize analog signals in a system utilizing dynamic analog test multiplexer for diagnostics
09/21/2011EP2366109A1 Method of monitoring the voltage of an electrical energy generating element of a battery
09/21/2011CN201985231U 滤波器整型自动测试一体机 Filter Integer automatic testing machine
09/21/2011CN201985212U Circuit of automatic battery voltage and internal resistance detecting and code-spraying device