Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2011
10/26/2011CN101122629B Method of generating test program of semiconductor testing apparatus
10/25/2011USRE42872 Method and apparatus for communicating with RFID devices coupled to a roll of flexible material
10/25/2011US8046655 Area efficient memory architecture with decoder self test and debug capability
10/25/2011US8046654 Image data test unit, image apparatus having the same, and method of testing image data using the same
10/25/2011US8046653 Low power decompression of test cubes
10/25/2011US8046652 Built-in self-test using embedded memory and processor in an application specific integrated circuit
10/25/2011US8046651 Compare circuit receiving scan register and inverted clock flip-flop data
10/25/2011US8046650 TAP with control circuitry connected to device address port
10/25/2011US8046649 Scan circuits formed peripheral of core circuits with control leads
10/25/2011US8046648 Method and apparatus for controlling operating modes of an electronic device
10/25/2011US8046647 TAP sampling at double rate
10/25/2011US8046644 DRAM testing method
10/25/2011US8046643 Transport subsystem for an MBIST chain architecture
10/25/2011US8046181 Apparatus and method for estimating state of health of battery based on battery voltage variation pattern
10/25/2011US8045561 Two stage traffic scheduling
10/25/2011US8045477 Smart protection escalation mechanism prevention
10/25/2011US8045474 Method and apparatus for tracking layer-2 (L2) resource of a switch
10/25/2011US8045460 Detection of routing loops based on time-to-live expiries
10/25/2011US8045458 Prioritizing network traffic
10/25/2011US8045452 Method for handling fault between an egress label switching router and a data device connected therewith
10/25/2011US8045005 System and method for video transmission line fault detection
10/25/2011US8044728 Circuit and method for measuring the performance parameters of transistors
10/25/2011US8044678 Device for simulating rectified constant impedance load and method thereof
10/25/2011US8044677 Electrical system, voltage reference generation circuit, and calibration method of the circuit
10/25/2011US8044676 IDDQ testing
10/25/2011US8044675 Testing apparatus with high efficiency and high accuracy
10/25/2011US8044674 Semiconductor device with thermal fault detection
10/25/2011US8044673 Method and apparatus for positioning and contacting singulated semiconductor dies
10/25/2011US8044667 Failure detection for series of electrical loads
10/25/2011US8044666 Method for determining location of phase-to earth fault
10/25/2011US8043995 Biodegradable; enhance nutrient uptake by the plants; complexed with ions and/or mixed with fertilizers or seeds
10/23/2011CA2737820A1 Battery state indicator on a battery powered device
10/22/2011CA2733087A1 Method of allocating batteries for use on specific industrial vehicles in a fleet
10/22/2011CA2733083A1 Method for detecting battery cable deterioraton in an industrial vehicle
10/22/2011CA2733079A1 Controlling operation of an industrial vehicle based on battery weight
10/20/2011WO2011130710A1 Monitoring system for proactive service of devices
10/20/2011WO2011130672A1 Monitoring system for proactive service of devices
10/20/2011WO2011130670A2 Consumption breakdown monitoring through power state sensing
10/20/2011WO2011130667A1 Systems and methods for modular testing of chargers
10/20/2011WO2011129668A2 Battery management system and method for transferring data within the battery management system
10/20/2011WO2011129662A2 Testing system and method for testing a battery cell
10/20/2011WO2011129469A1 Energy station
10/20/2011WO2011129339A1 Inspection device
10/20/2011WO2011129044A1 Apparatus for supplying voltage
10/20/2011WO2011128916A1 Circuit board meter for circuit breakers
10/20/2011WO2011128875A1 Device for monitoring information associated to solar panels operation, system comprising the device and operation method thereof
10/20/2011WO2011128756A1 Degradation determination device and degradation determination method for lithium ion secondary battery
10/20/2011WO2011128743A1 Nonaqueous electrolyte solution type lithium ion secondary battery system, method for determining lithium deposition in that system, and vehicle provided with that system
10/20/2011WO2011128135A1 Battery with cell balancing
10/20/2011WO2011128071A1 Method for locating defective locations in an rf signal transmission path by detecting an intermodulation product
10/20/2011WO2011128070A1 Method for locating faulty points in a high-frequency signal transmission path by detecting an intermodulation product
10/20/2011WO2011128046A1 High-voltage system for a motor vehicle and method for diagnosing a high-voltage system for a motor vehicle
10/20/2011WO2011127973A1 Apparatus and method for testing a plurality of devices under test
10/20/2011WO2011127967A1 Fault wave arrival determination
10/20/2011WO2011127962A1 Method and device for contacting a row of contact surfaces with probe tips
10/20/2011WO2011085052A3 Apparatus and methods for determining potential energy stored in an electrochemical cell
10/20/2011US20110258506 Reduced signaling interface method & apparatus
10/20/2011US20110258505 Method and apparatus for ac scan testing with distributed capture and shift logic
10/20/2011US20110258503 Fully X-tolerant, Very High Scan Compression Scan Test Systems And Techniques
10/20/2011US20110258502 Wafer scale testing using a 2 signal jtag interface
10/20/2011US20110258501 Method and apparatus for low-pin-count scan compression
10/20/2011US20110258500 Adapting scan architectures for low power operation
10/20/2011US20110258499 System for performing the test of digital circuits
10/20/2011US20110258498 Test Architecture Including Cyclical Cache Chains, Selective Bypass Scan Chain Segments, And Blocking Circuitry
10/20/2011US20110257934 System, wellness circuit and method of determining wellness of a rotating electrical apparatus
10/20/2011US20110257916 System, method, and article of manufacture for determining an estimated battery cell module state
10/20/2011US20110257913 Electronic battery tester with battery age input
10/20/2011US20110256838 Methods for determining optimum power supply voltages for radio-frequency power amplifier circuitry
10/20/2011US20110256434 Apparatus and method for estimating resistance characteristics of battery based on open circuit voltage estimated by battery voltage variation pattern
10/20/2011US20110254945 Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method
10/20/2011US20110254582 Systems and methods for modular testing of chargers
10/20/2011US20110254581 Short circuit detection device
10/20/2011US20110254580 Method for an improved checking of repeatability and reproducibility of a measuring chain for semiconductor device testing
10/20/2011US20110254579 Semiconductor test method and semiconductor test system
10/20/2011US20110254578 Space transformer comprising an isolation resistor for a probe card, and method for manufacturing same
10/20/2011US20110254577 Non-Reflow Probe Card Structure
10/20/2011US20110254576 Method and appratus for de-embedding
10/20/2011US20110254575 Probe connector
10/20/2011US20110254574 Prober, testing apparatus, and method of inspecting semiconductor chip
10/20/2011US20110254564 System and Method for Detecting Voltage Dependence in Insulation Systems Based on Harmonic Analysis
10/20/2011US20110254563 Connector monitoring assembly and a detector assembly including the same
10/20/2011US20110254562 Method and device for detecting short-circuits in the stator core of electric machines
10/20/2011US20110254557 Electromechanical relays including embedded sensors
10/20/2011US20110254556 Switch testing circuit
10/20/2011US20110254555 Electro-optical device
10/20/2011US20110254554 Led-based illumination module on-board diagnostics
10/20/2011US20110254535 Method and system for monitoring external excitation on a surface using nanocomposite paint
10/20/2011US20110254534 Non-contact arc detection apparatus and method
10/20/2011US20110254001 High performance sub-system design and assembly
10/20/2011US20110253999 Semiconductor wafer having scribe line test modules including matching portions from subcircuits on active die
10/20/2011US20110252630 Method and apparatus for manufacturing backlight source
10/20/2011DE102010015312A1 Hochvoltsystem für ein Kraftfahrzeug und Verfahren zur Diagnose eines Hochvoltsystems für ein Kraftfahrzeug High-voltage system for a motor vehicle and method for diagnosing a high-voltage system for a motor vehicle
10/20/2011DE102010015103A1 Verfahren zum Orten von fehlerhaften Stellen in einem HF-Signalübertragungspfad A method for locating flaws in a HF signal transmission path
10/20/2011DE102010015102A1 Verfahren zum Orten von fehlerhaften Stellen in einem HF-Signalübertragungspfad A method for locating flaws in a HF signal transmission path
10/19/2011EP2378605A1 System and method for displaying battery string data in polar coordinate graphical form
10/19/2011EP2378425A1 A testing system for integrated circuits
10/19/2011EP2378304A2 Apparatus for and method of calculating state of charge, and electric system
10/19/2011EP2378303A1 Cell abnormality detection circuit and power supply device
10/19/2011EP2378302A1 Test assembly for surge voltage testing of high voltage electrical components
10/19/2011EP2378301A2 Faultsimulator for cable-isolation tester