Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/2014
12/10/2014CN204008713U 一种穿墙套管末屏下引装置 Cited device under a wall bushing end screen
12/10/2014CN204008712U 容性设备套管末屏带电检测装置 Capacitive screen device Bushing charged detection device
12/10/2014CN204008711U 一种高压试验用导线支架 A high-pressure test with a wire stand
12/10/2014CN204008710U 一种变压器用导线支架 A transformer with a wire stand
12/10/2014CN204008709U 一种线路板测试架 A circuit board test
12/10/2014CN204008708U 10kV环网柜高压试验遮蔽罩 RMU 10kV high voltage test hood
12/10/2014CN204008707U 一种精密自动滑轨测试工装 A sophisticated automatic slide test tooling
12/10/2014CN204008706U 基于磁钢转动的高压断路器测试用连接器 Based on the high voltage circuit breaker testing magnet rotating connector
12/10/2014CN204008705U 局部放电在线监测罐体盖 Partial discharge monitoring tank lid
12/10/2014CN204008704U 一种高空万向引接线绝缘操作杆 One kind of high-altitude universal lead wire insulated lever
12/10/2014CN204008703U 一种方便携带的多功能装置箱 A convenient portable multifunction device box
12/10/2014CN204008702U 带有防呆档杆装置的pcb板测试机 Pcb board testing machine with a lever device foolproof
12/10/2014CN204008701U 旋转装置 Rotating device
12/10/2014CN203993619U 试验用铁珠电磁采集器 Experiment with iron beads electromagnetic Collector
12/10/2014CN104205508A 电触头和电气部件用插座 Electrical contacts and electrical component socket
12/10/2014CN104204818A 用于半导体测试的横向驱动探针 Lateral drive for semiconductor test probe
12/10/2014CN104204817A 含钩状接脚触点边缘的测试用插座 Test containing the contact edge of the hook pin socket
12/10/2014CN104198960A Led灯具老化检验装置 Led lamp aging testing device
12/10/2014CN104198940A 一种磁电机测试台 A magnetic motor test stand
12/10/2014CN104198916A 四工位无光无干扰源混合测试装置 Four-source mixing matte non-interference testing device
12/10/2014CN104198892A 架空线路故障指示器带电安装工具 Overhead line fault indicator Charged Installation Tools
12/10/2014CN104198880A 保险丝管测试机 Fuse Tester
12/10/2014CN104198838A 一种移动终端车旅充电器检修测试装置 A terminal car trip inspection test device mobile charger
12/10/2014CN104198783A 具有温度补偿特性的电源检测电路及受电设备 Power detection circuit with temperature compensation feature and powered devices
12/10/2014CN104198782A 一种电源输出测试台 A power output test bench
12/10/2014CN104198781A 一种控制交流信号输出的方法及装置 Method and apparatus for controlling the output of the AC signal
12/10/2014CN104198780A 高电压大电流冲击电流发生装置 High voltage and high current surge current generator
12/10/2014CN104198779A 探针短接式信号检测设备及该设备的信号发生方法 Signal probe shorting signal detection device and the equipment occurs
12/10/2014CN104198778A 自动化多点探针操作 Automated multi-point probe operation
12/10/2014CN104198777A 一种拔插式电线夹 One kind of plug-type wire clip
12/10/2014CN104198776A 一种齿轮摇杆式测试夹具 A GEAR rocker test fixture
12/10/2014CN104198775A 一种小电路板磁场环境测试夹具 Magnetic environment, a small circuit board test fixture
12/10/2014CN104198774A 一种齿轮摇杆式测试夹具的使用方法 Use a gear rocker test fixture
12/10/2014CN104198773A 三轴联动式大型电路板测试夹具的第二转轴组 Three-axis type of large circuit board test fixture of the second shaft group
12/10/2014CN104198772A 嵌入式芯片测试插座及其加工方法 Embedded chip test socket and processing methods
12/10/2014CN104198771A 一种高压接头结构及其应用 A high voltage joint structure and its application
12/10/2014CN104198770A 一种用于配线架检测的连接装置 A connection device for detecting distribution frame
12/10/2014CN104198769A 简易式电路板感光元件测试架 Simple style board sensor test stand
12/10/2014CN104198768A 一种套管的电性能测试工装 One kind of casing electrical performance test fixture
12/10/2014CN103238076B 具有静电放电（esd）保护的测试针阵列 Test needle array with electrostatic discharge (esd) protection
12/10/2014CN103018501B 晶圆测试探针卡 Wafer test probe card
12/10/2014CN102636345B 一种夹紧并锁紧点动开关的装置 A clamp and locking devices jog switch
12/10/2014CN102621463B 用于半导体测试装置具有气密式导通孔的载板及制造方法 Carrier board and method of manufacturing a semiconductor device having a gas-tight test vias for
12/10/2014CN102522725B 用于集成电路测试系统的智能过流保护电路 Smart overcurrent protection circuit for an integrated circuit test system
12/10/2014CN102095900B 检测系统 Detection system
12/10/2014CN102053177B 一种有源差分电压探头 An active differential voltage probe
12/10/2014CN102053175B 一种用于显示电变量装置的探头 A probe apparatus for displaying electrical variable
12/10/2014CN101852834B 低效率太阳能电池的短路排查装置 Low efficiency of the solar cell short circuit troubleshooting device
12/09/2014US8907693 Electromagnetic shield for testing integrated circuits
12/09/2014US8907689 Probe retention arrangement
12/09/2014US8907659 Retractable test probe
12/04/2014US20140354439 Electrical sensor with configurable settings and a display
12/04/2014US20140354322 Probe card partition scheme
12/04/2014US20140354321 Automated test management system for electronic control module
12/04/2014US20140354318 Interconnects including liquid metal
12/04/2014US20140354315 Probe guide plate and semiconductor inspection apparatus
12/04/2014US20140354313 Method for Temporary Electrical Contacting of a Component Arrangement and Apparatus Therefor
12/04/2014US20140354287 Apparatus for testing an electromechanical relay
12/04/2014US20140354263 Optically based voltage sensing device and method
12/02/2014US8901950 Probe head for a microelectronic contactor assembly, and methods of making same
12/02/2014US8901949 Probe card for testing a semiconductor chip
12/02/2014US8901948 Wafer probe card
12/02/2014US8901920 Connector, probe, and method of manufacturing probe
12/02/2014US8901918 Load connection state detection circuit
11/2014
11/27/2014US20140347085 Test probe card
11/27/2014US20140347084 Low overdrive probes with high overdrive substrate
11/27/2014US20140347082 Semiconductor device test socket
11/27/2014US20140347038 Method of Reconstructing Electrical Probes
11/25/2014US8896305 Permanent or variable alternating magnetic field circulation sensor, and current sensor implementing such a sensor
11/25/2014US8896291 Power line takeoff clamp assembly
11/20/2014US20140343883 User Interface for Signal Integrity Network Analyzer
11/20/2014US20140340109 Test probe card structure
11/20/2014US20140340108 Test assembly
11/20/2014US20140340107 Bga test socket
11/20/2014US20140340106 Probe member for pogo pin
11/20/2014US20140340105 Test assembly
11/20/2014US20140340104 Assembly and Method for Testing an Electronic Circuit Test Fixture
11/20/2014US20140340103 Automated Attaching And Detaching Of An Interchangeable Probe Head
11/20/2014US20140340076 Sensor unit
11/20/2014US20140340074 Monitoring arrangement and method for monitoring an electrical line
11/20/2014US20140340072 Sensor devices and methods for use in sensing current through a conductor
11/18/2014US8892377 Digital programmable load measurement device
11/18/2014US8890559 Connector and interface apparatus comprising connector
11/18/2014US8889526 Apparatus for thinning, testing and singulating a semiconductor wafer
11/18/2014US8888503 Socket for electric parts
11/13/2014US20140333339 Board, integrated circuit testing arrangement, and method for operating an integrated circuit
11/13/2014US20140333338 Device for checking electronic cards
11/13/2014US20140333337 Current applying device
11/13/2014US20140333336 Testing of electronic devices through capacitive interface
11/13/2014US20140333335 Probe
11/13/2014US20140333334 Parallelism adjusting device and parallelism adjusting method
11/11/2014US8884733 Current-sense resistor
11/11/2014US8884640 Integrated high-speed probe system
11/11/2014US8884607 Current measuring apparatus
11/11/2014US8882095 Hook portion of clamp meter
11/06/2014US20140330539 Semiconductor integrated circuit and semiconductor physical quantity sensor device
11/06/2014US20140329687 Systems, devices, and methods for analog processing
11/06/2014US20140327463 Membrane Sheet with Bumps for Probe Card, Probe Card and Method for Manufacturing Membrane Sheet with Bumps for Probe Card
11/06/2014US20140327462 Test socket providing mechanical stabilization for pogo pin connections
11/06/2014US20140327461 Probe Card Assembly For Testing Electronic Devices
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