Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2014
11/06/2014US20140327452 Scratch resistant touch sensor
11/04/2014US8878560 High frequency probing structure
11/04/2014US8878559 IC current measuring apparatus and IC current measuring adapter
11/04/2014US8878545 Test apparatus with physical separation feature
10/2014
10/30/2014US20140320159 Probe member for pogo pin
10/30/2014US20140320158 Electrical Probe for Testing Electronic Device
10/30/2014US20140320157 Oscilloscope probe having output clamping circuit
10/30/2014US20140320156 Apparatus for detecting misalignment of test pad
10/30/2014US20140320111 Current sensor based on a rogowski coil
10/30/2014US20140318838 Method of repairing probe board and probe board using the same
10/28/2014US8872535 Connector attaching/detaching apparatus and test head
10/28/2014US8872534 Method and apparatus for testing devices using serially controlled intelligent switches
10/28/2014US8872533 Wafer testing system and associated methods of use and manufacture
10/28/2014US8872532 Wafer test cassette system
10/28/2014US8872519 System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material
10/28/2014US8872516 Electronic battery tester mounted in a vehicle
10/28/2014US8872506 Mounting systems for use with meters and method of assembling same
10/28/2014US8872178 IC with comparator receiving expected and mask data from pads
10/28/2014US8872176 Elastic encapsulated carbon nanotube based electrical contacts
10/23/2014US20140312925 Vibrating device for positioning a miniaturized piece in a testing accommodation, and positioning method
10/23/2014US20140312924 Handler and inspection apparatus
10/21/2014US8867233 Smart meter protection system and methods
10/21/2014US8866506 Contact structure for inspection
10/21/2014US8866494 Attenuator circuit of a capacitance-sensing circuit
10/16/2014US20140306730 Alignment adjusting mechanism for probe card, position adjusting module using the same and modularized probing device
10/16/2014US20140306729 Position adjustable probing device and probe card assembly using the same
10/16/2014US20140306728 Electronic assembly test system
10/16/2014US20140306677 Current detection circuit and switching regulator thereof
10/14/2014US8861227 Smart meter protection system and methods
10/14/2014US8860454 Connector and semiconductor testing device including the connector
10/14/2014US8860453 Test adapter configuration for testing a communication device
10/14/2014US8860451 Jig for semiconductor test
10/14/2014US8860450 Apparatus and method for terminating probe apparatus of semiconductor wafer
10/14/2014US8860449 Dual probing tip system
10/14/2014US8860448 Test schemes and apparatus for passive interposers
10/09/2014WO2014161624A1 Measuring resistor and corresponding measuring method
10/09/2014WO2014161270A1 Probe apparatus for hardware testing
10/09/2014WO2014161068A1 System for creating universal mating cables and related testing program
10/09/2014US20140303916 Four-line electrical impedance probe
10/09/2014US20140301024 Electric Base, Electric Gateway, and Electric Gateway Body
10/09/2014US20140300383 Probe assembly and probe base plate
10/09/2014US20140300381 Contactless measuring system
10/09/2014US20140300380 Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit
10/09/2014US20140300347 Device for measuring a battery current
10/09/2014US20140300345 Intelligent magnetic latching miniature circuit breaker
10/09/2014DE102013005939A1 Messwiderstand und entsprechendes Messverfahren Measuring resistance and corresponding measuring method
10/09/2014DE102005032142B4 Verfahren zum Kontaktieren von Halbleiterbauteilen mit einem Testkontakt A method for bonding semiconductor components with a test contact
10/08/2014EP2787584A1 Electrical switchgear with a built-in connection system for connecting measuring equipment and injecting and sensing low-frequency and high-frequency signals
10/08/2014EP2786158A1 System for measuring a load current and for diagnosing an absence of load or an overload
10/07/2014US8854072 High temperature-low leakage probe apparatus and method of manufacturing same
10/07/2014US8854071 Test prod for high-frequency measurement
10/07/2014US8854033 Current sensor, inverter circuit, and semiconductor device having the same
10/07/2014US8851358 Method for aligning plate-like members and method for manufacturing electrical connecting apparatus
10/07/2014US8851200 Battery pack for use with a power tool and a non-motorized sensing tool
10/07/2014US8850907 Test carrier
10/02/2014WO2014158035A1 A resonator with an integrated temperature sensor
10/02/2014WO2014156531A1 Electric contact and electric component socket
10/02/2014US20140292365 Electrical circuit testing
10/02/2014US20140292364 Semiconductor chip probe and the conducted eme measurement apparatus with the semiconductor chip probe
10/02/2014US20140292307 DC Decoupled Current Measurement
10/01/2014EP2784519A1 Method for manufacturing a contact for testing a semiconductor device
10/01/2014EP2783223A1 Instrumentation circuit for shunt-based metrology measurement
09/2014
09/30/2014US8847616 E-field probe integrated with package lid
09/30/2014US8847578 Ambient noise cancellation in pulsed input system
09/30/2014US8847577 Method and system of measuring current in an electric meter
09/25/2014WO2014147436A1 Apparatus and method for monitoring electrical current
09/25/2014US20140285228 Testing apparatus for providing per pin level setting
09/23/2014US8841931 Probe card wiring structure
09/23/2014US8841921 Adjustable signal sampling sensor and method
09/23/2014US8841918 Switching apparatus and test apparatus
09/23/2014US8841801 Limitation of the loading of a power source
09/23/2014US8839512 Oblique parts or surfaces
09/18/2014WO2014140029A1 Crossmember unit for a test apparatus for printed circuit boards, and test apparatus having said crossmember unit
09/18/2014WO2014139333A1 Current waveform generation device
09/18/2014US20140282241 Handheld Measurement System With Selectable Options
09/18/2014US20140278257 Probe communications module and a computing device
09/18/2014US20140273569 Active probe adaptor
09/18/2014US20140273307 Method and Apparatus for Semiconductor Testing at Low Temperature
09/18/2014US20140266285 Integrated circuit testing architecture
09/18/2014US20140266284 Isolation testing of semiconductor devices
09/18/2014US20140266281 Testing holders for chip unit and die package
09/18/2014US20140266280 Probe card, probe structure and method for manufacturing the same
09/18/2014US20140266279 Electrically Conductive Pins For Microcircuit Tester
09/18/2014US20140266278 Probe needle
09/18/2014US20140266277 Semiconductor testing probe needle
09/18/2014US20140266275 Guide plate for probe card
09/18/2014US20140266274 Probe guide plate and method for manufacturing the same
09/18/2014US20140266273 Test-yield improvement devices for high-density probing techniques and method of implementing the same
09/18/2014US20140266241 Apparatus to verify an electrically safe work condition
09/18/2014US20140266176 Magnetic Field Sensor and Associated Method That Can Store a Measured Threshold Value in a Memory Device During a Time When The Magnetic Field Sensor is Powered Off
09/18/2014DE102014103343A1 Eine mehrfach-stromsensorvorrichtung, eine mehrfach-stromnebenschlussvorrichtung und ein verfahren zum bereitstellen eines sensorsignals A multiple-flow sensor device, a multi-flow shunt device and provide a method for a sensor signal
09/16/2014US8836525 Isolated resistive current sensor
09/16/2014US8836364 Voltage test devices used in LCD panels and a system thereof
09/16/2014US8836362 Switch probe and device and system for substrate inspection
09/16/2014US8836361 Wiring board and probe card using the same
09/16/2014US8836358 Automated multi-point probe manipulation
09/16/2014US8836319 Method for measuring the current level of an alternating current
09/16/2014US8834184 Space and cost efficient incorporation of specialized input-output pins on integrated circuit substrates
09/16/2014US8832933 Method of fabricating a semiconductor test probe head
09/12/2014WO2014136884A1 Contact pin
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