G01R 1 - Details of instruments or arrangements of the types covered by groups or

Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269)
05/2013
05/15/2013	CN101373204B A contact insert for a microcircuit test socket
05/14/2013	US8441272 MEMS probe for probe cards for integrated circuits
05/14/2013	US8441250 Method and apparatus for monitoring electrical properties of polymerization reactor wall film
05/10/2013	WO2013006770A3 Test apparatus having a probe card and connector mechanism
05/09/2013	US20130113512 Probe block, probe card and probe apparatus both having the probe block
05/09/2013	US20130113511 Dc-ac probe card topology
05/09/2013	US20130113504 Vehicle door handle apparatus
05/08/2013	EP2589970A2 DC-AC probe card topology
05/08/2013	EP2588869A1 Current sensor
05/08/2013	EP2493022B1 Electric contact module
05/08/2013	CN202929191U Portable DC high-current debugging apparatus
05/08/2013	CN202929164U Testing arrangement and probe structure thereof
05/08/2013	CN202929110U Metal clamp and equipment for measuring insulation resistance of dielectric
05/08/2013	CN202929087U Direct current component detection device
05/08/2013	CN202929062U Test protecting structure for lithium ion battery
05/08/2013	CN202929061U Test signal generating device used in intelligent substation testing system
05/08/2013	CN202929060U Linear load for uninterrupted power source test for electric power
05/08/2013	CN202929059U Novel probe strip structure for solar cell
05/08/2013	CN202929058U Rapid wiring apparatus for transformer test
05/08/2013	CN202929057U Testing pedestal and testing device
05/08/2013	CN202929056U Electric connector
05/08/2013	CN202929055U Simple testing-cable gathering and ordering apparatus
05/08/2013	CN202929054U Solar module test guide rail
05/08/2013	CN202929053U Testing rod structure for touch control panel
05/08/2013	CN202929052U Wireless handle used for cell tester and cell tester assembly including wireless handle
05/08/2013	CN202928881U Conducting clamp for plug leading wire bending test
05/08/2013	CN103091617A Semiconductor test method
05/08/2013	CN103091588A Transformer iron core test winding wire device
05/08/2013	CN103091584A Recording method of action times of transferring selector by transformer
05/08/2013	CN103091579A Insulator chain intelligent detection robotic system
05/08/2013	CN103091540A Reclosure device power supply voltage detection circuit
05/08/2013	CN103091524A Cable oscillatory wave partial discharge detection system shielding device
05/08/2013	CN103091523A Changing-over type anechoic chamber
05/08/2013	CN103091522A Compatible probe card capable of being used in high temperature test and low temperature test
05/08/2013	CN103091521A Method of probe and lead foot automatic aiming and probe station testing system thereof
05/08/2013	CN103091520A Probe block, probe card and probe apparatus both having the probe block
05/08/2013	CN103091519A Handcart switch return circuit resistance test rivet type cable clamp
05/08/2013	CN103091518A Adjustment type mobile phone main board detection fixture
05/08/2013	CN103091517A Transformer pressure-proof testing fixture and testing method
05/08/2013	CN103091516A Jig for substrate inspection, base units of jig and substrate inspection apparatus
05/08/2013	CN103091515A Jig For Use In Semiconductor Test And Method Of Measuring Breakdown Voltage By Using The Jig
05/08/2013	CN103091514A Manual operated probe station structure
05/08/2013	CN102279292B Test fixture
05/08/2013	CN101900748B Inspection fixture
05/08/2013	CN101545942B Circuit for testing connection gaskets
05/08/2013	CN101477141B Digital multimeter having case panel structure
05/02/2013	WO2013061665A1 Test signal mediation substrate
05/02/2013	WO2013061500A1 Flexible wiring board and method for manufacturing same
05/02/2013	WO2013061486A1 Contact probe and inspection socket provided with same
05/02/2013	US20130106457 Test probe for test and fabrication method thereof
05/02/2013	US20130106456 Micromachined on-wafer probes and related method
05/02/2013	US20130106403 Garment incorporating a non destructive control system
05/02/2013	DE102012218492A1 Aufspannvorrichtung zur Verwendung im Halbleitertest und Verfahren für das Messen einer Durchschlagspannung unter Verwendung der Aufspannvorrichtung Jig for use in semiconductor test and method for measuring a breakdown voltage using the jig
05/01/2013	EP2587267A1 Contact probe and probe unit
05/01/2013	EP2537039B1 Testing pin for making contact with an electrically conductive region of a contact partner
05/01/2013	EP2348505B1 Probe head and method of fabricating the same
05/01/2013	CN202917144U FPC (Flexible Printed Circuit) replaceable probe
05/01/2013	CN202916427U Two dimension rotation LED street lamp test device
05/01/2013	CN202916404U Chip handheld test device
05/01/2013	CN202916403U Function detection fixture
05/01/2013	CN202916401U Led老化测试系统 Led aging test system
05/01/2013	CN202916398U System capable of preventing power frequency voltage from fleeing into impulse voltage generator
05/01/2013	CN202916363U Photovoltaic conjunction box test equipment matching testboard
05/01/2013	CN202916309U Probe card pin layer structure and probe card using the structure
05/01/2013	CN202916308U Programming test needle apparatus and system capable of rapid replacement
05/01/2013	CN202916307U Signal switching device for debugging and detection of electrical equipment
05/01/2013	CN202916306U Broadband current test caliper device
05/01/2013	CN202916305U Miniature sample test clamp
05/01/2013	CN202916304U Battery performance test fixture
05/01/2013	CN202916303U Precision positioning electronic clamp
05/01/2013	CN202916302U A circuit board detecting and positioning mechanism
05/01/2013	CN202916301U On-line power supply test transmission device
05/01/2013	CN202916300U Light fixture rotary mechanism for LED street lamp testing device
05/01/2013	CN103076555A Testing needle frame for chip
05/01/2013	CN103076472A Implementation method for small-scale full-wave direct lightning generator
05/01/2013	CN103076471A Large current source for running test of direct-current transmission converter valve and compensation method thereof
05/01/2013	CN103076470A Shielding method and shielding structure of radio frequency test circuit
05/01/2013	CN103076469A Double-ended probe device
05/01/2013	CN103076468A Probe device
05/01/2013	CN103076467A Test socket
05/01/2013	CN103076466A Test bed with fixed-point lit mobile illuminating lamp
05/01/2013	CN102411108B Multi-station synchronous test system for testing quartz crystal oscillator by continuously raising temperature
05/01/2013	CN102331536B Fault electric arc controllable simulative generation device
05/01/2013	CN102305916B Ageing rack for daylight lamp
05/01/2013	CN102279296B SOCs test package scanning signal input unit and SOCs test package scanning result output unit
05/01/2013	CN102135580B Capacitor detector
04/2013
04/25/2013	WO2013058796A1 Instrumentation circuit for shunt-based metrology measurement
04/25/2013	WO2013058465A1 Method for manufacturing a contact for testing a semiconductor device
04/25/2013	WO2013032218A3 Coaxial probe
04/25/2013	US20130099815 Probe card handling carriage
04/25/2013	US20130099814 Contact probe and probe unit
04/25/2013	US20130099813 Contact terminal for a probe card, and the probe card
04/25/2013	US20130099812 Probe Cards for Probing Integrated Circuits
04/25/2013	US20130099811 Probe
04/25/2013	US20130099810 Electrically Conductive Kelvin Contacts For Microcircuit Tester
04/25/2013	US20130099788 System and method for gradient amplifier control
04/24/2013	EP2584596A2 Testing device for testing wafers for electronic circuits and related method
04/24/2013	CN202905992U Rope-controlling test splicing fitting
04/24/2013	CN202905956U Multifunctional battery charging and discharging clamp
04/24/2013	CN202904406U Temperature control device used for chip testing

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