Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
06/2013
06/19/2013CN103163340A Electric wave darkroom
06/19/2013CN103163339A Anechoic chamber
06/19/2013CN103163338A Probe with shielding case
06/19/2013CN103163337A Power supply testing probe pneumatic compression joint system
06/19/2013CN103163336A Fixing device for switching characteristic tester
06/19/2013CN103163335A Triggering type aerial wiring clamp
06/19/2013CN103163334A Wafer inspection interface and wafer inspection apparatus
06/19/2013CN103163333A Electric property detection device and method for solar chip
06/19/2013CN103163332A Power aging chamber circulating system
06/19/2013CN103163331A Novel fixing device of potentiometer of burn-in screen table
06/19/2013CN103163330A Electrostatic treater
06/19/2013CN103162922A Switching-on system of rotary workpiece platform
06/19/2013CN103158089A Battery test fixture device
06/19/2013CN102353821B Clamp test mechanism for sorting thermistor
06/19/2013CN102323454B Fixture for fuel cell test and assembling method thereof
06/19/2013CN102323453B Fixture for conductivity test and assembling method thereof
06/19/2013CN102288791B Wire frame and gold finger structure for Kelvin testing and sorting
06/19/2013CN102175899B Automatic test safety control method of satellite interface
06/19/2013CN102156205B Probe card and printed circuit board used for same
06/19/2013CN102128956B Connecting plate for test socket
06/19/2013CN101995491B Adaptation board, modifying method of double-station testing machine and testing method thereof
06/19/2013CN101273275B Vertical probe card and air cooled probe head system
06/18/2013US8466704 Probe cards with minimized cross-talk
06/18/2013US8466703 Probe card analysis system and method
06/18/2013US8466671 Digital multimeter having a case and a separate panel structure
06/13/2013WO2013085254A1 Probe portion connection-type pogo pin and method for manufacturing same
06/13/2013WO2013084874A1 Membrane sheet with bumps for probe card, probe card and method for manufacturing membrane sheet with bumps for probe card
06/13/2013WO2013084730A1 Contact probe and socket for semiconductor element provided with same
06/13/2013WO2013083933A1 Device for checking electronic cards
06/13/2013WO2013046985A9 Method for manufacturing contact probe
06/13/2013WO2013038176A3 Apparatus and method for current measurement
06/13/2013US20130147507 Apparatus for probing die electricity and method for forming the same
06/13/2013US20130147506 Wafer inspection interface and wafer inspection apparatus
06/13/2013US20130147505 Test probing structure
06/13/2013US20130147504 Wafer inspection device
06/13/2013US20130147502 Vertical probe assembly with air channel
06/13/2013US20130147464 Clamp meter with multipoint measurement
06/12/2013EP2602798A2 Current-measurement resistor
06/12/2013EP2602797A2 Resistor, in particular current-measurement resistor
06/12/2013CN202995027U Ammeter detection system
06/12/2013CN202995008U Constant voltage electronic load
06/12/2013CN202995001U Protection upper cover used for lithium ion battery testing
06/12/2013CN202994972U PCB pushing two-stage test structure
06/12/2013CN202994967U Adjustable omnibearing solar battery outdoor test system
06/12/2013CN202994948U Locking structure of suspension insulator detection robot
06/12/2013CN202994947U Clasping structure for suspension insulator detection robot
06/12/2013CN202994944U A probe bed tool used for detecting circuit boards
06/12/2013CN202994935U Testing device for connector product
06/12/2013CN202994885U Telescopic tong-type ammeter
06/12/2013CN202994884U Passive DC voltage sensor
06/12/2013CN202994862U Impact current generator applied on lightning stroke surge test
06/12/2013CN202994861U Impact current generator applied on lightning stroke surge test
06/12/2013CN202994860U Dual-head probe apparatus
06/12/2013CN202994859U Probe device
06/12/2013CN202994858U A connected module apparatus for computer detection equipment
06/12/2013CN202994857U Probe card capable of testing high voltage chip by low voltage test channel
06/12/2013CN202994856U General test cable used for transformer test
06/12/2013CN202994855U Transformer voltage withstand test fixture
06/12/2013CN202994854U Noise parameter testing clamp for microwave low noise packaging device
06/12/2013CN202994853U Signal test junction box
06/12/2013CN202994852U Fixture for calibrating pulse current
06/12/2013CN202994851U PCBA test clamp
06/12/2013CN202994850U Pressing fixture for PCB
06/12/2013CN202994849U Compaction tool
06/12/2013CN202994848U Connecting conducting rod used for 126 KV total box combined electric appliance power frequency withstand voltage experiment
06/12/2013CN202994847U A 5W multimedia voice box PCB test fixture
06/12/2013CN202994846U A 3W single-loudspeaker voice box PCB test fixture
06/12/2013CN202994845U A support moving mechanism used for a motor performance testing device
06/12/2013CN202994844U A motor performance testing device containing a high-strength equivalent support
06/12/2013CN202994843U Joint for insulation test of gas-insulated switchboard
06/12/2013CN202994842U Chip resistor test clamp
06/12/2013CN202994841U All-aluminum cabinet for batch test of rack-type DTU core units
06/12/2013CN202994840U Switch clamping device
06/12/2013CN202994839U Capacitive touch screen general adapter plate
06/12/2013CN202994838U Product positioning tool
06/12/2013CN202994837U Product positioning tool
06/12/2013CN202994836U Connector slot module group
06/12/2013CN202994835U Image sensor chip test fixture with test light source
06/12/2013CN202994834U Dual-in-line ceramic base for reliability test of VDMOS device
06/12/2013CN202994833U Insulation support
06/12/2013CN202994832U General wire collecting box for transformer test
06/12/2013CN202994831U Brake pull rod withstand voltage test support
06/12/2013CN202994830U Plug used for test of charger USB interface
06/12/2013CN202994829U Novel conductive brush
06/12/2013CN202994828U Suction nozzle installer, suction device and solar cell testing device
06/12/2013CN202994827U Test tool for planting probes from the lower part
06/12/2013CN103149395A Temperature compensation method for multi-channel analog acquisition card
06/12/2013CN103149394A Shortening type deionized water terminal for cable partial discharge test
06/12/2013CN103149393A 110 kilovolt (KV) line parameter testing change-over switch, manufacturing method thereof and using method thereof
06/12/2013CN103149392A Test fixture of lightning dock-to-USB (Universal Serial Bus) converter
06/12/2013CN103149391A Test frame
06/12/2013CN103149390A Stable and reliable annular magnetic core test frame
06/12/2013CN103149389A Resistivity measuring clamp for silver alloy wires
06/12/2013CN103149388A Integrated circuit test connecting device and integrated circuit test connecting method
06/12/2013CN103149387A Test power source control cabinet
06/12/2013CN103149386A Electronic load module of power supply aging test and power supply aging test system
06/12/2013CN102338845B Insulation characteristic test device of insulating rod
06/12/2013CN102175897B Angle self-locking spark gap short-circuit fork for detecting porcelain bottle insulators
06/12/2013CN102095901B Substrate for use in measuring electric characteristics
06/11/2013US8461825 Current measurement apparatus with shunt resistor and heat sink
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