Patents for G01Q 80 - Applications, other than spm, of scanning-probe techniques (1,833)
03/2008
03/27/2008US20080073522 Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been used
03/27/2008US20080073520 Tip structure for scanning devices, method of its preparation and devices thereon
03/20/2008US20080067498 Method for forming quantum dot, and quantum semiconductor device and method for fabricating the same
03/18/2008US7344756 Method for scanning probe contact printing
03/12/2008CN100375295C Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication
03/06/2008US20080055343 Metal layer having aperture, method of forming the same, light delivery module including metal layer having aperture, and heat assisted magnetic recording head including the same
03/05/2008CN101136207A Metal layer having aperture, method of forming the same, light delivery module comprising metal layer having aperture and heat assisted magnetic recording head comprising the same
03/04/2008US7338831 Method of fabricating semiconductor probe with resistive tip
02/2008
02/27/2008EP1850972A4 Thermal control of deposition in dip pen nanolithography
02/26/2008US7335873 Light condensing method and light condenser as well as near-field optical microscope and storage device formed by applying the same
02/26/2008US7334460 Method and apparatus of manipulating a sample
02/20/2008EP1292361B1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
02/07/2008WO2008015865A1 Manufacturing method and manufacturing device of near-field light utilization head
02/06/2008EP1883932A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation
02/05/2008US7327665 Optical fiber probe using an electrical potential difference and an optical recorder using the same
01/2008
01/29/2008US7325206 Electronic design for integrated circuits based process related variations
01/24/2008US20080017609 Probe Head Manufacturing Method
01/17/2008WO2008006229A1 Scanning probe microscope and method for operating the same
01/17/2008US20080014660 High Quantum Yield Acridinium Compounds and Their Uses in Improving Assay Sensitivity
01/17/2008US20080013437 Probe for scanning over a substrate and a data storage device
01/15/2008US7319224 Semiconductor probe with resistive tip and method of fabricating the same
01/15/2008US7319041 Applications of acridinium compounds and derivatives in homogeneous assays
01/10/2008WO2003098208A8 Molecular topological frationation of macromolecules
12/2007
12/27/2007US20070295920 Optically Controllable Device
12/21/2007WO2007144313A1 Optical component operating in near field transmission
12/20/2007US20070289369 Multifunctional probe array system
12/19/2007CN101089545A Design method for radio frequency single electronic transistor displacement transducer
12/19/2007CN100356542C Method of fabricating semiconductor probe with resistive tip
12/18/2007US7309615 High quantum yield acridinium compounds and their uses in improving assay sensitivity
12/11/2007US7307030 Method for forming quantum dot, and quantum semiconductor device and method for fabricating the same
12/06/2007WO2007121208A3 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
12/06/2007US20070279043 Probe, Manufacturing Method of the Probe, Recording Apparatus, and Reproducing Apparatus
12/06/2007US20070278177 Processing method using atomic force microscope microfabrication device
12/04/2007US7304916 Optical head, information storage apparatus, optical head design apparatus, and optical head design program storage medium
11/2007
11/29/2007US20070272040 Device and Method for Measuring Molecule Using Gel Substrate Material
11/28/2007CN100351300C Rubber composition and process for production thereof
11/27/2007US7301888 Recording apparatus
11/22/2007US20070267385 Semiconductor probe with high resolution resistive tip and method of fabricating the same
11/21/2007EP1330823B1 Afm-based data storage and microscopy
11/21/2007CN100350249C Interaction detecting method and bioassay device, and bioassay-use substrate
11/20/2007US7297946 Automated nanoassembly
11/20/2007US7297933 Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe
11/20/2007US7297486 Production of molecular arrays
11/15/2007WO2007129587A1 Molecule orientation device and molecule orientation method
11/07/2007EP1850972A2 Thermal control of deposition in dip pen nanolithography
11/01/2007WO2007123155A1 Information recording/reproducing device
10/2007
10/31/2007EP1850335A2 Near field optical head and information recording/reading apparatus
10/30/2007US7287421 Semiconductor probe with high resolution resistive tip and method of fabricating the same
10/25/2007WO2007121208A2 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
10/24/2007CN101061059A Nano tweezers and scanning probe microscope having the same
10/23/2007US7285794 Quantum semiconductor device and method for fabricating the same
10/23/2007US7285792 Scratch repairing processing method and scanning probe microscope (SPM) used therefor
10/18/2007US20070242921 Optical Near-Field Generator and Near-Field Optical Recording and Reproduction Apparatus
10/18/2007US20070240516 Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
10/16/2007US7283453 Recording/reproducing head
10/16/2007US7281419 Multifunctional probe array system
10/11/2007US20070234786 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
10/10/2007EP1841883A1 A method for analyzing nucleobases on a single molecular basis
10/09/2007US7278299 Method of processing vertical cross-section using atomic force microscope
10/04/2007US20070228296 Parallel Electron Beam Lithography stamp (PEBLS)
10/02/2007US7276173 Dielectric recording medium, and method of and apparatus for producing the same
09/2007
09/27/2007WO2005027199A3 Nanodisk sensor and sensor array
09/27/2007US20070225851 Optical metrology model optimization for process control
09/19/2007CN101039870A Programmable molecular manipulating processes
09/18/2007US7271882 Shape measuring apparatus, shape measuring method, and aligning method
09/13/2007US20070211542 Multi-probe for writing and reading data and method of operating the same
09/05/2007EP1502306A4 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication
08/2007
08/28/2007US7261352 Electrostatically driven carbon nanotube gripping device
08/21/2007US7259372 Processing method using probe of scanning probe microscope
08/16/2007DE112005002187T5 Vorrichtung und Verfahren zur Molekülmessung unter Verwendung eines Gelsubstratmaterials Apparatus and method for measurement using a molecule Gelsubstratmaterials
08/08/2007EP1816642A1 Near-field optical head and method for manufacturing same
08/08/2007EP1816100A1 Nano tweezers and scanning probe microscope having the same
08/02/2007US20070176616 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same
08/02/2007US20070176100 Automated nanoassembly
07/2007
07/26/2007US20070170358 Scanning electron microscope
07/25/2007CN101003355A Direct write nano etching method
07/24/2007US7247895 Electrostatic nanolithography probe actuation device and method
07/11/2007EP1806572A1 Measuring device with daisy type cantilever wheel
07/11/2007EP1805103A1 Programmable molecular manipulating processes
07/11/2007EP0978829B1 Near field optical memory head
07/10/2007US7243316 Test masks for lithographic and etch processes
07/10/2007US7241992 Method of amplitude modulated electrostatic polymer nanolithography
07/05/2007WO2007074650A1 Head using near-field light and information recorder
06/2007
06/26/2007US7236889 Method of examining foreign matter derived from living body
06/06/2007EP1330651A4 Evaluating binding affinities by force stratification and force planning
06/05/2007US7227830 Dielectric recording apparatus, dielectric reproducing apparatus, and dielectric recording / reproducing apparatus
05/2007
05/31/2007US20070119240 Semiconductor probe and method of writing and reading information using the same
05/30/2007EP1789853A1 A method of aligning a first article relative to a second article and an apparatus for aligning a first article relative to a second article.
05/30/2007CN1971757A Multi-probe for writing and reading data and method of operating the same
05/24/2007WO2007058804A1 Dielectrophoretic tweezers apparatus and methods
05/24/2007US20070114402 Object inspection and/or modification system and method
05/24/2007US20070114401 Direct write nanolithography using heated tip
05/24/2007US20070114400 Probe
05/22/2007US7221989 Optical metrology model optimization for process control
05/22/2007US7221639 Pickup device
05/17/2007US20070111250 Probe carrier, method of producing the probe carrier, method of evaluating the probe carrier and method of detecting a target nucleic acid using the same
05/16/2007CN1963953A Semiconductor probe and method of writing and reading information using the same
05/16/2007CN1315623C Nanotweezers and nanomanipulator
05/15/2007US7218600 Dielectric constant measuring apparatus, dielectric constant measuring method, and information recording/reproducing apparatus
05/10/2007WO2007051275A1 Scanning nanojet microscope and the operation method thereof
1 2 3 4 5 6 7 8 9 10 11 12 13 14 ... 19