Patents for G01Q 80 - Applications, other than spm, of scanning-probe techniques (1,833)
06/2009
06/30/2009US7553776 Patterned functionalized silicon surfaces
06/24/2009CN101467021A Optical component operating in near-field transmission
06/23/2009US7550747 Parallel electron beam lithography stamp (PEBLS)
06/18/2009US20090155917 Method for analyzing nucleobases on a single molecular basis
06/02/2009US7541062 can turn deposition on or off while the tip maintains contact with the surface; control the ink deposition rate and limit the amount of excess ink diffusion; thermosensitive patterning compound is octadecylphosphonic acid, or 10-undecenyl tricholorosilane; ink deposition depend on heating or cooling
05/2009
05/28/2009US20090138994 Optical measuring head positioned to correspond to the cantilever array for measuring movement of the cantilever, whereby measuring variations in vibration frequency and/or amplitude of the cantilevers according to the rotation the disk-like base plate:biological sampling; medical diagnosis; MERSA
05/21/2009US20090133169 Independently-addressable, self-correcting inking for cantilever arrays
05/12/2009US7531726 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (SPM) reading
05/07/2009US20090116366 Preload Modulation to Reduce Head Motion Hysteresis
05/05/2009US7529158 Optical near-field generator and recording apparatus using the optical near-field generator
04/2009
04/28/2009US7525880 Near-field information reproducing apparatus and near-field information reproducing method
04/28/2009US7525088 Optically controllable device
04/28/2009US7524534 coating microscope tips with patterning compounds and using the coated tip to apply the compounds to substrate so as to produce a desired patterns; nanolithography
04/28/2009US7523650 Multifunctional probe array system
04/23/2009WO2007027757A3 Direct write nanolithography using heated tip
04/21/2009US7523027 Visual inspection and verification system
04/16/2009US20090100553 Scanning probe-based lithography method
04/16/2009US20090097385 Information recording/reproducing apparatus
04/01/2009EP2041546A1 Scanning probe microscope and method for operating the same
03/2009
03/24/2009US7507957 Probe microscope system suitable for observing sample of long body
03/17/2009US7503206 Fluid delivery for scanning probe microscopy
03/11/2009CN101382479A Mini sensor for sensing chemical substance
03/11/2009CN100467595C A method of immobilizing and stretching a nucleic acid on a substrate
03/04/2009CN100465612C Defect detection method
02/2009
02/25/2009EP2027450A1 Optical component operating in near field transmission
02/25/2009EP1841883A4 A method for analyzing nucleobases on a single molecular basis
02/17/2009US7491425 Scanning probe-based lithography method
02/12/2009WO2009020658A1 Independently-addressable, self-correcting inking for cantilever arrays
02/12/2009US20090038383 Photomask defect correction device and photomask defect correction method
02/12/2009CA2690723A1 Independently-addressable, self-correcting inking for cantilever arrays
02/05/2009DE102007038280A1 Actuator, for the deposition of nano sized materials, has a nano tube with a reservoir and electrodes at the tube and/or reservoir
02/03/2009US7485856 Scanning probe microscopy inspection and modification system
01/2009
01/29/2009US20090029349 Chemiluminescence; quantitative analysis of macromolecules; complexing sample to acridinium compound, labels for improving sensitivity of immunoassays, 2',6'-dimethyl-4'-N-succinimidyloxycaproyl-amidocarbonylphenyl-N10-2,7-tris[O-methoxyhexa(ethylene) glycol-sulfonamidylpropyl]-acridinium-9-carboxylate
01/29/2009US20090028007 Near-Field Optical Head and Information Recording Apparatus
01/27/2009US7482826 Probe for scanning over a substrate and a data storage device
01/13/2009US7476786 Using nanoparticles to identify and/or sequence biomolecules; forensic analysis; medical diagnostics
01/06/2009US7474410 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
01/01/2009US20090003189 Probe for scanning over a substrate and a data storage device
01/01/2009US20090000365 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope
01/01/2009US20090000362 Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer
12/2008
12/25/2008US20080315092 Scanning probe microscopy inspection and modification system
12/25/2008US20080314131 Sample manipulating apparatus
12/17/2008EP1953763A4 Scanning nanojet microscope and the operation method thereof
12/16/2008US7464584 Semiconductor probe and method of writing and reading information using the same
12/11/2008US20080305557 Novel Applications of Acridinium Compounds and Derivatives in Homogeneous Assays
12/04/2008US20080295585 Tweezer-Equipped Scanning Probe Microscope and Transfer Method
11/2008
11/27/2008US20080291789 Apparatus For Focusing Plasmon Waves
11/26/2008CN100437791C Conducting current method between scanning contact and storage medium
11/06/2008DE10026911B4 Verfahren zur Herstellung eines Halbleiter-Superatoms und eines Aggregats davon A process for producing a semiconductor superatom and an aggregate thereof
11/04/2008US7446324 Methods utilizing scanning probe microscope tips and products thereof or produced thereby
10/2008
10/28/2008US7444054 Apparatus for focusing plasmon waves
10/28/2008US7442925 Working method using scanning probe
10/22/2008EP1410436B1 Parallel, individually addressable probes for nanolithography
10/21/2008US7439501 Direct write nanolithography using heated tip
10/21/2008US7437915 Probe for scanning over a substrate and a data storage device
10/16/2008US20080253020 Read/Write Tip, Head and Device, and Use Thereof, and Method for Manufacturing Same
10/14/2008US7436753 Contact probe storage FET sensor
10/02/2008US20080239931 Recording and reproducing apparatus provided with probe memory
10/01/2008EP1611607A4 Method of fabricating semiconductor probe with resistive tip
10/01/2008CN100422687C Phase solution package method base on template in micro-nano structure 3-D contour measuring
09/2008
09/25/2008US20080230696 Surface treatment and surface scanning
09/17/2008EP1970903A1 Head using near-field light and information recorder
09/10/2008EP1548438B1 Hybridisation detecting method and bioassay device, and bioassay-use substrate
09/10/2008EP1084454A4 Free-form nanofabrication using multi-photon excitation
09/10/2008CN100418083C Optical metrology of structures formed on semiconductor wafers using machine learning systems
09/09/2008US7423954 Contact probe storage sensor pod
09/04/2008US20080216027 Electronic Design for Integrated Circuits Based on Process Related Variations
09/04/2008US20080210864 Local Injector of Spin-Polarized Electrons with Semiconductor Tip Under Light
08/2008
08/26/2008US7416698 Using flow through separation mixture to characterize a population of linear macromolecules and long chain branched macromolecules of interest; size exclusion chromatography
08/21/2008WO2008054476A3 Electrostatic nanolithography probe actuation device and method
08/20/2008EP1958207A1 Dielectrophoretic tweezers apparatus and methods
08/12/2008US7411210 Semiconductor probe with resistive tip having metal shield thereon
08/06/2008EP1953763A1 Scanning nanojet microscope and the operation method thereof
07/2008
07/23/2008EP1946108A2 High quantum yield acridinium compounds and their uses in improving assay sensitivity
07/23/2008CN101226120A Micro drafting device for testing test piece material nano metric mechanical properties
07/22/2008US7402849 Parallel, individually addressable probes for nanolithography
07/09/2008EP1942501A1 Distance control in optical near-field recording/reproducing apparatus
07/02/2008EP1939871A1 Recording apparatus
07/02/2008EP1938335A1 Reading/writing tip, head and device, and use thereof, and method for making same
07/02/2008EP1938081A1 Multifunctional probe array system
07/01/2008US7395132 Optical metrology model optimization for process control
06/2008
06/26/2008US20080148824 Probe for scanning over a substrate and a data storage device
06/19/2008US20080141764 Method of observing and method of working diamond stylus for working of atomic force microscope
06/05/2008US20080132151 Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method
05/2008
05/29/2008US20080121028 Scanning Probe Microscopy Inspection and Modification System
05/20/2008US7375324 Stylus system for modifying small structures
05/15/2008US20080113099 controlling deposition from scanning probe microscope tips to substrates, using electrical, magnetic, chemical or analogous forces
05/15/2008DE102007049322A1 Probenbetriebseinrichtung Samples facility
05/15/2008DE102007049321A1 Probenbetriebseinrichtung Samples facility
05/08/2008WO2008054476A2 Electrostatic nanolithography probe actuation device and method
05/08/2008US20080105044 Sample operation apparatus
05/08/2008US20080105043 Sample Operation Apparatus
04/2008
04/30/2008EP1122722B1 Near field optical head and method for manufacturing the same
04/29/2008US7367008 Adjustment of masks for integrated circuit fabrication
04/29/2008US7366060 Method for forming optical aperture, near-field optical head, method for fabricating near-field optical head, and information recording/reading apparatus
04/22/2008US7363099 Integrated circuit metrology
04/22/2008US7361821 Using oligonucleotide probes for detection, identification and/or sequencing of nucleic acids and/or biomolecules; for use in medical diagnostics, forensics, toxicology, pathology, biological warfare
04/15/2008US7359599 Optical near-field generator and near-field optical recording and reproduction apparatus
04/08/2008US7355951 High density data recording/reproduction method utilizing electron emission and phase change media, and data recording system adopting the same, and media for the system
04/01/2008US7353475 Electronic design for integrated circuits based on process related variations
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