Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
11/2010
11/17/2010CN201637700U Portable mining cobalt testing instrument
11/17/2010CN201637699U Low-dimension nano material microstructure and electric property testing device
11/17/2010CN201637698U Carrying and moving device of workpieces
11/17/2010CN201637443U Measuring device for multi-phase flow with extremely-high water content
11/17/2010CN101889074A Sequencing nucleic acid polymers with electron microscopy
11/17/2010CN101887059A Eosinophil analogue, preparation method thereof and whole blood quality control substance
11/17/2010CN101887038A Device and method for measuring coating by using X-ray fluorescence spectrometer
11/17/2010CN101887037A Wheel-type X-ray flaw detection robot device
11/17/2010CN101887036A X-ray high-pressure tube fitting detecting platform
11/17/2010CN101887035A X-ray protection lead room with built-in protective lead plate
11/17/2010CN101887034A X-ray radiographic inspection detecting rack vehicle
11/17/2010CN101884548A Optical data transmission system adopting slip ring
11/17/2010CN101884547A High-speed optical data transmission system for slip ring
11/17/2010CN101382505B X ray imaging arrangement and method
11/17/2010CN101349543B Analysis characterization method of orientation nanometer micropore morphological feature in fiber material
11/17/2010CN101303317B Explosive substance testing system apparatus and testing method thereof
11/17/2010CN101074938B Method for measuring double-ended water content
11/16/2010US7835564 Non-destructive, below-surface defect rendering using image intensity analysis
11/16/2010US7835559 Method and apparatus for quantitative and comparative analysis of image intensities in radiographs
11/16/2010US7835495 System and method for X-ray diffraction imaging
11/16/2010US7835486 Acquisition and reconstruction of projection data using a stationary CT geometry
11/16/2010US7834317 Scanning electron microscope and system for inspecting semiconductor device
11/16/2010US7834315 Method for STEM sample inspection in a charged particle beam instrument
11/16/2010US7834314 Ion detection using a pillar chip
11/16/2010US7833802 detecting explosive related compound, narcotics; chemical warfare; Directing radiation from a source onto a surface; collecting an airborne sample at and/or near the surface; detecting whether or not the high boiling point and/or low vapor pressure material is present in the collected sample
11/16/2010US7833745 rapid and efficient method for novel biological substance screening by surface analysis using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS);
11/16/2010CA2651131C Method and apparatus for providing threat image projection (tip) in a luggage screening system, and luggage screening system implementing same
11/11/2010WO2010129772A1 Filtering of a source of pulsed radiation
11/11/2010WO2010128992A1 X.ray apparatus for bone density assessment and monitoring
11/11/2010WO2010127920A1 Radiometric measuring device for measuring a filling level or a density of a filling material
11/11/2010US20100286928 Method and device for determining images from x-ray projections
11/11/2010US20100284601 C-arm computerized tomography system
11/11/2010US20100284516 Two dimensional small angle x-ray scattering camera
11/11/2010US20100284514 Method and device for inspection of liquid articles
11/11/2010US20100284512 Process to determine light elements content of steel and alloys
11/11/2010US20100284509 Dual energy imaging system
11/11/2010US20100282983 Systems and methods for positioning patients during tracking of targets in radiation therapy and other medical applications
11/11/2010US20100282956 Xy-coordinate compensation apparatus and method in sample pattern inspection apparatus
11/11/2010DE102009036077A1 Method for generating three dimensional-volume data of human body, involves generating two dimensional-end images from raw images through filtering, and reconstructing three dimensional-volume data of body from end images
11/11/2010DE102009020026A1 Method for post-processing of X-ray image i.e. fluoroscopy image, in X-ray device, involves extrapolating X-ray image on parameter to determine representation image, and adjusting spatial frequency characteristic of representation image
11/11/2010DE102009019841A1 Jitterfreie Ortstriggerung eines Detektors eines CT-Systems Jitter Ortstriggerung a detector of a CT system
11/11/2010DE102009019514A1 CT-System und Verfahren zur Phasenkontrast- und Absorptionsbildgebung CT-system and method for phase contrast and absorption imaging
11/11/2010DE102009019215A1 Computertomographische Werkstückmessvorrichtung Computed tomographic workpiece measuring device
11/11/2010DE102009019204A1 Test object i.e. patient, scanning method, involves enabling relative motion between test object and radiation source detector arrangement along rotation axis of radiation source detector arrangement during measuring data detection
11/11/2010DE102009002816A1 Radiometrisches Messgerät Radiometric measurement device
11/11/2010DE102008050851B4 Röntgenanalyseinstrument mit verfahrbarem Aperturfenster X-ray analysis instrument with movable aperture window
11/10/2010EP2247946A1 X-ray computer tomograph and method for analyzing an object by means of x-ray computer tomography
11/10/2010EP2247945A2 Suitcase compartmentalized for security inspection and system
11/10/2010EP1527461B1 An optical device for focusing x-rays having a plurality of curved optical crystals
11/10/2010CN201629742U High-speed data transmission device between rotating body and fixed body
11/10/2010CN201628692U Chip mounter used for detecting welding seam radiograph of pressure vessel
11/10/2010CN101883980A Small spot and high energy resolution XRF system for valence state determination
11/10/2010CN101879070A Method and device for determining images from x-ray projections
11/10/2010CN101366095B Ion sources, systems and methods
11/10/2010CN101216440B Oriented Silicon Steel [001] crystal orientation deviation angle alpha, beta determination method
11/10/2010CN101201330B Nondestructive detecting method for strain silicon heterojunction in insulator
11/09/2010US7831019 System and methods for characterizing a substance
11/09/2010US7831013 Real-time motion tracking using tomosynthesis
11/09/2010US7831012 Radiation scanning systems and methods
11/09/2010US7830434 Semiconductor color image sensor responsive at shorter wavelengths
11/09/2010US7829871 Sheet beam-type testing apparatus
11/09/2010US7829853 Sample surface observation method
11/09/2010US7829852 Device having etched feature with shrinkage carryover
11/04/2010WO2010127269A1 Localization of an element of interest by xrf analysis of different inspection volumes
11/04/2010WO2010125913A1 X-ray scattering measurement device and x-ray scattering measurement method
11/04/2010WO2010125911A1 Defect inspection device and defect inspection method
11/04/2010WO2010125877A1 Method of selecting and processing observation defects, method of observing defects, device for selecting and processing observation defects, and device for observing defects
11/04/2010WO2010125347A2 Inelastic scanning confocal electron microscopy
11/04/2010WO2010124868A2 Computer tomographic workpiece measuring device
11/04/2010US20100278749 Nanoparticle contrast agents for diagnostic imaging
11/04/2010US20100278416 Method for Inspecting Overlay Shift Defect during Semiconductor Manufacturing and Apparatus Thereof
11/04/2010US20100278304 X-ray imaging apparatus, x-ray imaging method and method of controlling x-ray imaging apparatus
11/04/2010US20100278303 Localization of an Element of Interest by XRF Analysis of Different Inspection Volumes
11/04/2010US20100278302 Apparatus for Detecting Specific Element
11/04/2010US20100277312 In-line high-throughput contraband detection system
11/04/2010DE102009000119A9 Bestrahlungsvorrichtung für die Inspektion menschlicher Körper Irradiation apparatus for inspecting human body
11/03/2010EP2246820A1 Nondestructive inspection method and system
11/03/2010EP2246713A1 Nuclear material detection device, nuclear material inspection system, and clearance device
11/03/2010EP2244635A1 Multiple-source imaging system with flat-panel detector
11/03/2010EP2069755B1 Apparatus and method for environmental monitoring
11/03/2010EP1579170B1 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum
11/03/2010CN201622254U Portable X-ray analysis device
11/03/2010CN201622253U Wheel disc type light-filtering collimating device of X-ray fluorescence spectrometer
11/03/2010CN201622252U Micro-focus X-ray phase contrast imaging experimental platform
11/03/2010CN201622251U X-ray security inspection device
11/03/2010CN201622250U Article carrying platform
11/03/2010CN201622249U Separable high-low energy X-ray detector
11/03/2010CN201622092U Three-phase flow quantity measuring system
11/03/2010CN1922476B Device and method for mapping the distribution of an x-ray fluorescence marker
11/03/2010CN1828282B Neutron diffraction measure method for CaO-Al2O3-SiO2 system microcrystalline glass residue stress
11/03/2010CN1758047B Sample processing and analyzing device
11/03/2010CN1620602B Diffractometer and method for diffraction analysis
11/03/2010CN101876605A Precision ion polishing system and sample clamp thereof
11/03/2010CN101349658B Fast analysis method of coal ash separating line
11/03/2010CN101261206B Material nanometer dynamic performance test two freedom degree loading unit
11/02/2010US7826888 Dynamic radiographic image obtaining method and apparatus
11/02/2010US7826884 Live fluoroscopic roadmapping including targeted automatic pixel shift for misregistration correction
11/02/2010US7826591 X-ray imaging apparatus and X-ray imaging method
11/02/2010US7826590 Apparatus and method for X-ray photographing a tire
11/02/2010US7826589 Security system for screening people