Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
12/2010
12/29/2010EP2265951A1 A method for sensing a chemical
12/29/2010EP2265938A1 Method and apparatus for detection of a particular material in an object by means of electromagnetic radiation
12/29/2010EP2265937A1 Method of and system for three-dimensional workstation for security and medical applications
12/29/2010EP2265936A2 Spectral detector calibration
12/29/2010CN201689860U Multi-unit cylindrical sample platform bracket
12/29/2010CN1979141B Scintillation proximity assay for measuring polymerase activity
12/29/2010CN1947003B Fluorescent X-ray analysis method and fluorescent X-ray analysis device
12/29/2010CN1828281B X-ray inspection device and x-ray inspection method
12/29/2010CN1743835B X-ray computed tomography photography system and method for correcting data of the system
12/29/2010CN101930905A Detection structure and on-line wafer monitoring method
12/29/2010CN101929966A Method for evaluating adhesion performance of coating of cold rolled automobile sheet
12/29/2010CN101929965A Charged particle detection device
12/29/2010CN101929964A Method of differentiating martensite in cast ferrite stainless steel and calculating two-phase proportion thereof
12/29/2010CN101929963A Dangerous goods detector for buses
12/29/2010CN101584587B Automatic calibration method for CT projection center
12/29/2010CN101292904B 图像诊断支持系统 Image diagnosis support system
12/29/2010CN101251499B Method for testing oxide and slag inclusion in magnesium alloy
12/29/2010CN101093199B Method for non-destructive testing grouting cavernes in prestressed concrete structure
12/29/2010CN101086484B Tongs device
12/29/2010CN101074936B X-ray CT device
12/29/2010CN101013094B Double-array detector modular structure for radiation imaging
12/28/2010US7861315 Method for microfabricating a probe with integrated handle, cantilever, tip and circuit
12/28/2010US7860285 Radiological imaging of patient functional units
12/28/2010US7860217 X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
12/28/2010US7860214 Correction of x-ray images
12/28/2010US7860213 Multiple pass cargo inspection system
12/28/2010US7860209 Method for imaging an organ, control device for a computed tomography system, computed tomography system and a computer program product
12/28/2010US7858936 Slice and view with decoration
12/28/2010US7858935 Method and system for conducting event-streamed spectrum imaging
12/28/2010US7858374 Method and device for reducing positron emitting isotope labeled carbon dioxide to positron emitter isotope labeled carbon monoxide via metal oxide
12/28/2010US7858271 Method of measuring dimension of pattern and method of forming pattern
12/28/2010US7857513 Table apparatus identifying method and medical imaging apparatus
12/23/2010WO2010147570A1 Method for image reconstruction of moving radionuclide source distribution
12/23/2010WO2010147125A1 X-ray imaging apparatus and x-ray imaging method
12/23/2010WO2010146927A1 Pattern inspection device and pattern inspection method
12/23/2010WO2010146503A1 Correction method for differential phase contrast imaging
12/23/2010WO2010146044A1 Low-interference sensor head for a radiation detector, as well as a radiation detector which contains this low-interference sensor head
12/23/2010WO2010145016A1 Method and apparatus for assessing the threat status of luggage
12/23/2010US20100322382 Pin base sensor for high-throughput macromolecular crystallography
12/23/2010US20100322380 X-ray detector for phase contrast imaging
12/23/2010US20100322372 Reference structures and reference structure enhanced tomography
12/23/2010US20100320384 Method of enhancing detection of defects on a surface
12/23/2010US20100320383 Method for exciting a mobile element of a microstructure
12/23/2010US20100320382 High throughput sem tool
12/23/2010US20100320381 Method for characterizing identified defects during charged particle beam inspection and application thereof
12/23/2010US20100319454 Method and system for determining young's modulus and poisson's ratio for a crystalline material
12/22/2010EP2263075A1 Method for the tomographic measurement of mechanical workpieces
12/22/2010CN201681059U Program-controlled X-ray diffractometer
12/22/2010CN201681058U Foreign matter detection device with X-ray machine
12/22/2010CN201681057U Battery detecting apparatus
12/22/2010CN201681056U Industrial high-resolution observation device for X-ray negative films
12/22/2010CN201681055U Detecting equipment for method being capable of enhancing image resolution
12/22/2010CN201681054U Desktop explosive drug detector
12/22/2010CN1993614B Fluorescent x-ray analysis method and fluorescent x-ray analysis apparatus
12/22/2010CN1898674B Methods for calibrating mass spectrometry (ms) and other instrument systems and for processing ms and other data
12/22/2010CN1880949B Method for calculating absorber-specific weighting coefficients and method for improving a contrast-to-noise ratio
12/22/2010CN101923062A Mobile type digital positron life spectrometer
12/22/2010CN101923061A X-ray inspection device and X-ray inspection method
12/22/2010CN101368918B Detection method and detection system for packed armament material amount
12/22/2010CN101105463B TEM sample least effective thickness detection method
12/22/2010CN101011252B Focus/detector system of an X-ray apparatus for generating phase contrast recordings
12/21/2010US7856083 System and method to account for cross-talk among coherent scatter detectors
12/21/2010US7856081 Methods and systems for rapid detection of concealed objects using fluorescence
12/21/2010US7856077 CT scanner and method for helical scanning of an examination object which has at least one portion undergoing periodic motion
12/21/2010US7855364 Projection electronic microscope for reducing geometric aberration and space charge effect
12/21/2010US7855363 Inspection method and apparatus using an electron beam
12/21/2010US7854804 Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same
12/19/2010CA2669865A1 Method and system for determining young's modulus and poisson's ratio for a crystalline material
12/16/2010WO2010143953A1 Method for determining weights of eggs, and apparatus
12/16/2010WO2010143263A1 Fourier transform x-ray spectroscope
12/16/2010WO2010142731A1 Method and device for testing a weld joint for a shaft by means of a detection device introduced through a passage of the shaft; corresponding rotor shaft
12/16/2010US20100318302 X-ray imaging apparatus, x-ray imaging method and method of controlling x-ray imaging apparatus
12/16/2010US20100318217 Method and Gripping Device For Automatically Transferring a Sample Container from a Storing Location to an Analysis Location, And Use o Said Device
12/16/2010US20100317117 Selective membrane extraction of radioactive analytes
12/16/2010US20100316190 Phase-sensitive x-ray imager
12/16/2010US20100316189 Object scanning system
12/16/2010US20100316188 Methods and apparatus for e-beam scanning
12/16/2010US20100316187 X-Ray inspection device and X-Ray inspection method
12/16/2010US20100316183 X-ray computer tomograph and method for investigating an object by means of x-ray computer tomography
12/16/2010US20100314553 Article sanitizer
12/16/2010US20100314541 Microstructured pattern inspection method
12/16/2010US20100314540 Electron microscope with an emitter operating in medium vacuum
12/16/2010US20100314539 Method and apparatus for identifying plug-to-plug short from a charged particle microscopic image
12/16/2010DE102009023892A1 Method for processing X-ray of examination object i.e. human, involves providing mask values lying within mask area and within surrounding of respective locations smaller in comparison to area, where values are different from each other
12/15/2010EP2261854A1 Method and apparatus to facilitate using fused images to identify materials
12/15/2010EP2261645A1 X-ray inspection device
12/15/2010EP2260501A1 Xrf system having multiple excitation energy bands in highly aligned package
12/15/2010EP2260334A1 Method and apparatus for borehole logging
12/15/2010EP2260296A1 Screening method and apparatus
12/15/2010EP2260295A1 Radiation imaging method with individual signal resolution
12/15/2010EP2260294A2 Sample module with sample stream spaced from window, for x-ray analysis system
12/15/2010CN201673131U Field fast-detecting instrument of iridium
12/15/2010CN201673130U Wheel-type X-ray flaw detection robot device
12/15/2010CN201673129U X-ray high voltage tube detection platform
12/15/2010CN1979139B Method for quantitatively analysing coke microcrystal unit from coke high-resolution-ration transmission electric-lens image
12/15/2010CN1955725B X射线ct系统 Ct X-ray system
12/15/2010CN1822305B Scanning electron microscope
12/15/2010CN1761872B A method and an apparatus for detecting water on a ship's deck
12/15/2010CN101918821A Pre-filmed precision sample cell for x-ray analyzer
12/15/2010CN101918820A Improved security system for screening people