Patents
Sitemap › G01 - Measuring; Testing › G01M - Testing static or dynamic balance of machines or structures; Testing of structures or apparatus, not otherwise provided for › G01M 11 - Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Patents for G01M 11 - Testing of optical apparatus; Testing structures by optical methods not otherwise provided for (14,356)
12/2003
12/11/2003WO2003102519A1 Methhod and system for sensing and analyzing a wavefront of an optically transmissive system
12/11/2003US20030228066 Image data processing unit for use in a visual inspection device
12/11/2003US20030227777 Automatic headlamp control
12/11/2003US20030227633 Method of assisting sample inclination error adjustment
12/11/2003US20030226951 System and method for lithography process monitoring and control
12/11/2003DE29624434U1 Sighting appts. for aligning Z-axis of movable vehicle headlamp test system to longitudinal axis of vehicle - is displaceable transverse to optical axis in horizontal plane
12/10/2003EP1369743A2 Characterisation of lithography apparatus
12/10/2003EP1369663A1 Method of calibration of a stereo microscope and a calibratable stereo microscope
12/10/2003EP1369662A2 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
12/10/2003EP1368678A4 Apparatus and method for measuring polarization dependent loss using repeated high speed polarization scrambling
12/10/2003EP1368678A1 Apparatus and method for measuring polarization dependent loss using repeated high speed polarization scrambling
12/10/2003EP1367935A2 Tomographic wavefront analysis system and method of mapping an optical system
12/10/2003EP1097532B1 Device for detecting polarization mode dispersions
12/10/2003CN1460967A Image quality analysis method and system for display device
12/10/2003CN1460963A Method and system for analysing image quality to display device using irregular dimension
12/09/2003US6661522 Interference system and semiconductor exposure apparatus having the same
12/09/2003US6661503 Method for manufacturing optic transmission modules and system for inspecting bit error rate characters
12/09/2003US6661502 Method and apparatus for measuring the diameter and/or eccentricity of a coating layer of a coated optical fiber
12/04/2003WO2003100525A2 Method for determining wavefront aberrations
12/04/2003WO2003071222A3 Systems and methods for inspection of ophthalmic lenses
12/04/2003WO2003022140A3 Ophthalmic wavefront measuring devices
12/04/2003WO2002086439A3 Method and system for measuring optical scattering characteristics
12/04/2003US20030223242 Leveling apparatus for vehicle headlamp
12/04/2003US20030223073 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter
12/04/2003US20030223065 Method and a device for determining the radiation-damage resistance of an optical material
12/03/2003EP1367376A1 Method and apparatus for measuring chromatic dispersion
12/03/2003EP0822440B1 Layout judgement apparatus and layout judgement system
12/03/2003CN1459625A Scanning wavelength apparatus
12/02/2003US6657798 Method for optimizing the number of good assemblies manufacturable from a number of parts
12/02/2003US6657712 Luminance measuring device for liquid crystal display
12/02/2003US6657710 Lens meter
12/02/2003US6657709 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling
12/02/2003US6655778 Calibrating system for a compact optical sensor
11/2003
11/27/2003WO2003098181A1 Method and device for evaluating spectacle lens or mold for molding spectacle lens, and method and system for manufacturing spectacle lens
11/27/2003US20030219191 Actuator and sensor system for composite structures
11/27/2003US20030218753 Method and apparatus for dynamic DMD testing
11/27/2003US20030217476 Method of active fiber alignment with movable v-groove precision control microstructures
11/26/2003EP1365525A2 Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
11/26/2003EP1365224A1 Determining mode spectra for principal states of polarization
11/26/2003EP1365218A2 Wavelength meter for swept lasers
11/26/2003CN2588343Y Shack-HJartmann wavefront sensor using commercial used digital camera as measuring component
11/26/2003CN1459037A Apparatus and method for measuring polarization - dependent loss using repeated high speed polarization scrambling
11/26/2003CN1129109C Pedal mechanism built up into unit and key musical instrument provided with same
11/25/2003US6654107 Stepper lens aberration measurement pattern and stepper lens aberration characteristics evaluating method
11/25/2003US6654104 Apparatus and method for measuring optical characteristics and recording medium
11/25/2003US6652151 Optical connector coupling end face state confirmation scope and confirmation method thereof
11/20/2003WO2003076980A3 Method for calibrating photonic crossconnect device
11/20/2003WO2003030378A3 Real-time polarization mode dispersion characterization
11/20/2003WO2003025896A3 Visual display testing, optimization and harmonization method and system
11/20/2003WO2002031576A9 Light adjustable aberration conjugator
11/20/2003US20030215131 Image quality analysis method and system for a display device using fractal dimension
11/20/2003US20030215053 Interferometer system and method of manufacturing projection optical system using same
11/20/2003US20030214646 Method and apparatus for measuring eccentricity of optical lens, and method and apparatus for centering and edging optical lens
11/20/2003US20030214645 Method of evaluating free-space optical propagation characteristics
11/20/2003US20030214586 Image quality analysis method and system for a display device
11/19/2003EP1363415A2 Method of evaluating free-space optical propagation characteristics
11/18/2003US6650798 Identification and location of fiber optic cables
11/18/2003US6650421 Method and apparatus for inspecting optical device
11/18/2003US6650406 Polarization dependent loss measurement in photonic devices
11/18/2003US6650399 Lithographic projection apparatus, a grating module, a sensor module, a method of measuring wave front aberrations
11/18/2003US6650398 Wavefront aberration measurement method and projection exposure apparatus
11/13/2003WO2002066940A3 System and method for measurement of the state of polarization of an optical signal in a fibre
11/13/2003US20030210388 Projection exposure apparatus using wavefront detection
11/12/2003EP1360782A1 Integrated memory controller circuit for fiber optics transceiver
11/12/2003EP1012583A4 Methods and apparatus for detecting surface defects of an optical fiber
11/11/2003US6647161 Structural monitoring sensor system
11/11/2003US6646730 Apparatus for inspecting collimator
11/11/2003US6646729 Method of measuring aberration in an optical imaging system
11/11/2003US6646726 Optical measuring device with imaging unit
11/06/2003WO2003092194A1 Chromatic dispersion measurement and compensation
11/06/2003WO2003091685A1 Optical testing method and apparatus
11/06/2003WO2003008926A3 Device for monitoring a structure and related method
11/06/2003WO2002089367A3 Multi-function optical performance monitor
11/06/2003WO2002048746A3 System and method for grating profile classification
11/06/2003US20030207643 Method for on-line testing of a light emitting panel
11/06/2003US20030206289 Imaging optical system evaluation method, imaging optical system adjustment method, exposure apparatus and exposure method
11/06/2003CA2483350A1 Optical testing method and apparatus
11/05/2003EP1359608A1 Projection optical system and production method therefor, exposure system and production method therefor, and production method for microdevice
11/05/2003EP1359451A1 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
11/05/2003EP1359445A2 Inverse fourier transform method, phase characterisation method of optical components from transmission and group delay measurements as well as a system for performing the method
11/05/2003EP1090268B1 High accuracy interferometer with light conductors
11/04/2003US6643603 Chromatic dispersion distribution measurement apparatus and method for the same
11/04/2003US6643011 SNR calculation method and optical spectrum measurement apparatus
10/2003
10/30/2003WO2003073061A3 Method and system for inspecting optical devices
10/30/2003WO2003038373A3 Characterization of optical preforms
10/30/2003WO2003019129A3 Conic constant measurement methods for refractive microlenses
10/30/2003US20030202177 System and apparatus for testing a micromachined optical device
10/30/2003US20030202171 Method, apparatus and system for testing one or more waveguides of an optical device
10/29/2003EP1357375A2 Actuator- and sensorsystem for composite structures
10/29/2003EP1356250A2 Optical amplification in coherent optical frequency modulated continuous wave reflectometry
10/29/2003EP1212596B1 Optical bank
10/28/2003US6639658 Method for detecting defect of optical fiber
10/28/2003US6639651 Fabrication method for correcting member, fabrication method for projection optical system, and exposure apparatus
10/23/2003US20030198425 Apparatus and method for monitoring a structure using a counter-propagating signal method for locating events
10/22/2003EP1355141A2 Device for measuring and dynamically compensating power loss variations within an optical transmission line with supervision channel and associated method
10/22/2003EP1355125A2 Method for determining core positions of optical element array and an apparatus for determining core positions thereof
10/22/2003EP1354182A2 Method for measuring the absolute light throughput of reflective-mode displays in an optical system
10/21/2003US6636843 System and method for grating profile classification
10/21/2003US6636625 Optical member inspecting apparatus and method of inspection thereof
10/21/2003US6636367 Projection exposure device
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