Patents
Patents for G01M 11 - Testing of optical apparatus; Testing structures by optical methods not otherwise provided for (14,356)
03/2004
03/30/2004US6714017 Method and system for infrared detection of electrical short defects
03/25/2004WO2004025878A1 Coded polarization-dependent analyzing
03/25/2004WO2004025242A1 Multi-signal determination of polarization dependent characteristic
03/25/2004US20040057039 Method and apparatus for inspecting optical modules
03/25/2004US20040056648 Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device
03/24/2004EP1399392A1 Methods and apparatus for automated manufacture of optical fiber
03/24/2004CN2607565Y Direct accumulator for time relative optical signal
03/24/2004CN1484758A Method for measuring the absolute light throughput of reflective-mode desplays in an optical system
03/24/2004CN1483688A Light scattering monitor in optical fibre drawing system
03/24/2004CN1143281C Jitter measuring method utilizing A/D conversion and device
03/23/2004US6710939 Objective lens for optical pick-up device and optical pick-up device
03/23/2004US6710864 Concentricity measuring instrument for a fiberoptic cable end
03/23/2004US6710863 Apparatus and method for measuring characteristics of optical fibers
03/23/2004US6710862 Method of determining the location of splices and of calculating power loss at splices in optic fibers in a cable
03/23/2004US6710328 Fiber optic composite damage sensor
03/18/2004WO2004005973A3 Polarization diversity detection without a polarizing beam splitter
03/18/2004US20040052488 Ray tracing in highly multimodal channel waveguides
03/18/2004US20040052426 Non-iterative method and system for phase retrieval
03/18/2004US20040052299 Temperature correction calibration system and method for optical controllers
03/17/2004EP1398612A1 Apparatus for monitoring the functionality of an optical element
03/17/2004EP1397651A1 Birefringence measurement at deep-ultraviolet wavelengths
03/17/2004EP1397640A1 Scanning interferometer for aspheric surfaces and wavefronts
03/17/2004EP1397638A2 Apparatus and method for measuring aspherical optical surfaces and wavefronts
03/11/2004WO2004020987A1 Optical waveguide interferometer comprising a laminate structure with a first planar waveguide monolayer and a second sandwich layer
03/11/2004US20040047635 System and method for protecting eye safety during operation of a fiber optic transceiver
03/11/2004US20040046964 Instrument measuring chromatic dispersion in optical fibers
03/11/2004US20040046955 Polarized lightwave reflectometry method (POTDR)
03/11/2004DE10238862A1 Messtechnische Anordnung zur Prüfung von Werkstücken sowie Verfahren zur messtechnischen Instrumentierung von Werkstücken Measuring arrangement for testing workpieces and processes for metrological instrumentation of workpieces
03/10/2004EP1396712A2 Method and system for polarisation optical time domain reflectometry (POTDR)
03/10/2004EP1395799A2 Method and apparatus for measuring wavefront aberrations
03/09/2004US6704100 Systems and methods for accurately measuring low values of polarization mode dispersion in an optical fiber using localized external perturbation induced low mode coupling
03/04/2004WO2004018988A1 Method for evaluating performance of optical system and method for designing it
03/04/2004WO2002063350A3 Optical waveguide monitoring
03/04/2004US20040042750 Clay nanocomposite optical fiber coating
03/04/2004US20040042747 Method for monitoring spin imparted on optical fiber and method for making optical fiber by using the same
03/04/2004US20040042003 Method and system for inspecting optical devices
03/04/2004US20040042000 Method and apparatus for measuring temporal response characteristics of digital mirror devices
03/04/2004US20040041978 Method and system for sensing and analyzing a wavefront of an optically transmissive system
03/04/2004DE19704545B4 Vorrichtung und Verfahren zur Auswertung eines optischen Verstärkers Apparatus and method for evaluating an optical amplifier
03/03/2004EP1394525A2 System for time domain reflectometry testing an optical network (OTDR)
03/03/2004EP1394524A2 systems and methods for accurately measuring low values of polarization mode dispersion in an optical fiber using localized external perturbation induced low mode coupling
03/03/2004EP1393113A2 Device for determining a location-dependent intensity profile and color profile and/or sharpness profile of optical lens systems
03/03/2004EP1393036A1 Device for automatically determining characteristics of an ophthalmic lens with device for automatically positioning a centring and driving pin
03/03/2004EP1393029A2 System for measuring chromaticity coordinates
03/03/2004EP1222758A4 Method and apparatus for measuring pmd of a dispersion compensation grating
03/03/2004CN1479940A Observation device and its manufacturing method, exposure device and method for manufacturing micro-device
03/03/2004CN1478743A System and method for obtaining rotation and mechanical twisted data in fibre-optical drawing process
03/03/2004CN1140830C Method for monitoring laser focusing
03/02/2004US6700655 Optical fiber characteristic measuring device
03/02/2004US6700646 Lithographic apparatus, method of manufacturing a device, and device manufactured thereby
02/2004
02/26/2004WO2004017474A2 Photonic devices and pics including sacrificial testing structures and method of making the same
02/26/2004WO2003100525A3 Method for determining wavefront aberrations
02/26/2004WO2003042649A3 Range extending system and spatial filter
02/26/2004WO2003022140A8 Ophthalmic wavefront measuring devices
02/26/2004US20040036890 Methods and devices for measuring a surface profile of an optical element
02/26/2004US20040036889 Polarization effect averaging
02/26/2004US20040036886 De-embedment of optical component characteristics and calibration of optical receivers using rayleigh backscatter
02/26/2004US20040036883 Projection exposure apparatus
02/26/2004US20040036858 Lens checking apparatus
02/25/2004EP1392011A2 De-embedment of optical component characteristics and calibration of optical receivers using rayleigh backscatter
02/25/2004EP1390722A1 Interferometric determination of three-dimensional refractive index distribution
02/25/2004EP1390707A1 Optical fibre backscatter polarimetry
02/25/2004CN1477940A Method and apparatus for measuring wavefront aberrations
02/25/2004CN1139794C reflective detector for optical lens combination
02/24/2004US6697515 Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same
02/24/2004US6697513 Optical member inspecting apparatus and method of inspection thereof
02/24/2004US6697161 Optical characterization of retarding devices
02/24/2004US6697150 Process and apparatus for measuring polarization dispersion in optical fibers
02/24/2004US6696974 Cable device for detecting and monitoring rock and soil displacement
02/19/2004WO2004015661A2 Method for on-line testing of a light-emitting panel
02/19/2004WO2004015481A1 Apparatus and method of correcting higher-order aberrations of the human eye
02/19/2004WO2002066940A9 System and method for measurement of the state of polarization of an optical signal in a fibre
02/19/2004US20040033633 Photonic devices and pics including sacrificial testing structures and method of making the same
02/19/2004US20040032884 Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source
02/19/2004US20040032579 Method for determining wavefront aberrations
02/19/2004US20040032280 Integrated visual imaging and electronic sensing inspection systems
02/19/2004DE10235658A1 Testing arrangement for a sealing body or lid, comprises an illumination unit for generating a light line over the lid and seal such that both the seal and a height reference providing surface are illuminated
02/18/2004CN1475785A System and method for measuringlow PMD in optical fiber using turbulent motion aroused low mode coupling
02/18/2004CN1475784A Optical fiber attenuation uniformity testing method
02/18/2004CN1475769A Method for analyzing low-coherence fringe
02/17/2004US6693704 Wave surface aberration measurement device, wave surface aberration measurement method, and projection lens fabricated by the device and the method
02/12/2004WO2004013598A1 Method for the optical characterisation of large mirrors consisting in recording the light reflected from a star
02/12/2004WO2002045277A3 A method and system for infrared detection of electrical short defects
02/12/2004US20040028372 Method of measuring characteristics of optical fiber and method of rewinding optical fiber
02/12/2004US20040027566 Optical system deviation estimating apparatus, optical system deviation adjusting apparatus, optical system deviation estimating method and optical system deviation adjusting method
02/12/2004US20040027560 Method and system for measuring optical scattering characteristics
02/12/2004US20040027559 Systems and methods for accurately measuring low values of polarization mode dispersion in an optical fiber using localized external perturbation induced low mode coupling
02/12/2004US20040027549 Observation apparatus and method of manufacturing the same, exposure apparatus, and method of manufacturing microdevice
02/12/2004US20040026637 Quantity-of-light unevenness inspection apparatus, and quantity-of-light unevenness inspection method
02/10/2004US6690454 Method, apparatus and system for testing one or more waveguides of an optical device
02/05/2004WO2004011897A1 Auto-characterization of optical devices
02/05/2004US20040024563 Method for generating a control output for a position control loop
02/05/2004US20040021864 Single sweep phase shift method and apparatus for measuring chromatic and polarization dependent dispersion
02/05/2004US20040021851 Focal length measuring device
02/05/2004US20040021803 Method of determining local structures in optical crystals
02/04/2004EP1387159A2 Light scattering monitor in optical fiber drawing system
02/04/2004EP1387158A2 Single sweep phase shift method and apparatus for measuring chromatic and polarization dependent dispersion
02/04/2004EP0756714B1 Fibre reflector
02/03/2004US6687396 Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium
02/03/2004US6686993 Probe card for testing optical micro electromechanical system devices at wafer level