G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours

More topics under "G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours" (201,510)
G01B 1 - Measuring instruments characterised by the selection of material therefor (979)
G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
G01B 13 - Measuring arrangements characterised by the use of fluids (1,659)
G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
G01B 17 - Measuring arrangements characterised by the use of infrasonic, sonic, or ultrasonic vibrations (3,873)
G01B 21 - Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass (25,042)
G01B 3 - Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (13,319)
G01B 5 - Measuring arrangements characterised by the use of mechanical means (31,570)
G01B 7 - Measuring arrangements characterised by the use of electric or magnetic means (32,725)
G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)

Patents for G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours (453)
03/1995
03/22/1995	EP0484441B1 Coin validators
10/1994
10/19/1994	EP0619872A1 Piezoresistive cantilever for atomic force microscopy.
09/1994
09/13/1994	US5345815 Atomic force microscope having cantilever with piezoresistive deflection sensor
08/1994
08/16/1994	US5337877 Coin validators
07/1994
07/05/1994	EP0619872A4 Piezoresistive cantilever for atomic force microscopy.
05/1994
05/11/1994	WO1994009719A1 Depth gauge and method of treating a depth gauge
04/1994
04/26/1994	US5307294 Automated end tally system
03/1994
03/08/1994	US5293118 Device for measuring thickness of sheet article with magnet and probe carriers provided with rollers
08/1993
08/04/1993	EP0220264B1 A method relating to three dimensional measurement of objects
04/1993
04/27/1993	CA1316688C Sheet-contacting thickness gauges
07/1992
07/23/1992	WO1992012398A1 Piezoresistive cantilever for atomic force microscopy
05/1992
05/13/1992	EP0484441A1 Coin validators.
02/1992
02/05/1992	EP0469267A1 Method and device for continuous thickness measurement of a coating
12/1991
12/24/1991	US5074050 Sheet-contacting thickness gauges
12/21/1991	CA2043748A1 Process and sensor for continuously measuring the thickness of a coating
11/1991
11/12/1991	US5063682 Aerodynamic caliper gauge
10/1991
10/23/1991	EP0294467B1 Calipers
10/23/1991	EP0229175B1 Position sensor and system
07/1991
07/09/1991	US5029402 Sliding gauge
06/1991
06/26/1991	CN1052548A Swept frequency eddy current for measuring coating thickness
06/15/1991	CA2021600A1 Swept frequency eddy current system for measuring coating thickness
05/1991
05/21/1991	US5017869 Swept frequency eddy current system for measuring coating thickness
04/1991
04/16/1991	CA1283169C Contacting thickness gauge for moving sheet material
02/1991
02/21/1991	WO1991002334A1 Coin validators
01/1991
01/01/1991	US4980994 Clamping fixture for detachably particular a disc
10/1990
10/24/1990	EP0394109A2 Aerodynamic caliper gauge
08/1989
08/02/1989	EP0325741A1 Sheet-contacting thickness gauges
05/1989
05/02/1989	CA1253620A1 Method relating to three dimensional measurement of objects
01/1989
01/18/1989	EP0299716A1 Contacting thickness gauge for moving sheet material
12/1988
12/14/1988	EP0294467A1 Calipers.
12/13/1988	US4791367 Contacting thickness gauge for moving sheet material
09/1988
09/20/1988	US4773029 Method relating to three dimensional measurement of objects
07/1988
07/14/1988	WO1988005151A1 Calipers
07/07/1988	DE3644979A1 Slide gauge
03/1988
03/15/1988	US4731744 Position sensor and system
10/1987
10/20/1987	US4700486 Measuring the thickness for a continuous material web
05/1987
05/06/1987	EP0220264A1 A method relating to three dimensional measurement of objects.
01/1987
01/29/1987	WO1987000619A1 Position sensor and system
11/1986
11/06/1986	WO1986006473A1 A method relating to three dimensional measurement of objects
06/1986
06/03/1986	US4593244 Determination of the thickness of a coating on a highly elongated article
12/1981
12/16/1981	EP0041568A1 Vehicle frame, body and wheel alignment gauge
12/01/1981	US4302883 Vehicle frame, body and wheel alignment gauge
06/1981
06/25/1981	WO1981001740A1 Vehicle frame,body and wheel alignment gauge
04/1981
04/28/1981	CA1100210A1 Optoelectronic coin edge testing device
03/1981
03/03/1981	CA1096956A1 Method and apparatus for measuring the thickness of a body
09/1980
09/16/1980	CA1085607A1 Contour detecting and dimension measuring apparatus
04/1980
04/08/1980	CA1074991A1 Checking and measurement device for automobile chassis
04/01/1980	CA1074868A1 Apparatus for testing tube wall thickness
12/1979
12/18/1979	CA1068101A1 Apparatus for measuring the wall thickness of tubes
10/1979
10/23/1979	US4172222 Optoelectric coin edge testing device
08/1979
08/28/1979	US4165567 Checking and measurement device for automobile chassis
06/1979
06/05/1979	US4157503 Apparatus and method for testing the thickness of the wall of a moving tube leaving an extruder
09/1978
09/26/1978	US4117402 Apparatus for measuring the wall thickness of a moving tube wherein at least one measuring body inside the tube may be lifted off the tube by the motion of the tube

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