G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours

More topics under "G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours" (201,510)
G01B 1 - Measuring instruments characterised by the selection of material therefor (979)
G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
G01B 13 - Measuring arrangements characterised by the use of fluids (1,659)
G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
G01B 17 - Measuring arrangements characterised by the use of infrasonic, sonic, or ultrasonic vibrations (3,873)
G01B 21 - Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass (25,042)
G01B 3 - Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (13,319)
G01B 5 - Measuring arrangements characterised by the use of mechanical means (31,570)
G01B 7 - Measuring arrangements characterised by the use of electric or magnetic means (32,725)
G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)

Patents for G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours (453)
11/2004
11/09/2004	US6815947 Method and system for thickness measurements of thin conductive layers
11/04/2004	WO2004094937A2 Measuring tape
11/04/2004	CA2519363A1 Measuring tape
11/03/2004	CN1174217C Instrument for measuring thickness of nonmagnetic layer on ferromagnetic base
10/2004
10/14/2004	WO2004088241A2 Method and apparatus for imaging internal structures of transparent and translucent materials
10/07/2004	WO2004085956A2 Laser digitizer system for dental applications
09/2004
09/30/2004	WO2004083773A2 System and method for capturing facial and body motion
09/16/2004	WO2004079291A2 Method of measuring the shelf-space of an object
09/16/2004	US20040179008 System and method for capturing facial and body motion
09/10/2004	WO2004076964A2 Marking tape measure
09/02/2004	US20040168335 Marking tape measure
08/2004
08/19/2004	US20040161165 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
07/2004
07/22/2004	US20040141187 Calibration for 3D measurement system
07/15/2004	US20040138838 Method and system for thickness measurements of thin conductive layers
07/13/2004	US6763149 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
07/01/2004	WO2004010074B1 Biosensor arrays and methods
06/2004
06/17/2004	WO2004051178A2 An apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
06/03/2004	US20040105001 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
05/2004
05/13/2004	WO2004040231A2 Calibration for 3d measurement system
05/13/2004	US20040088870 Transparent measuring device with enhanced visibility lines
05/06/2004	WO2004010074A3 Biosensor arrays and methods
04/2004
04/29/2004	WO2004008064A3 Transparent measuring device with enhanced visibility lines
03/2004
03/16/2004	US6707308 Measurements using tunnelling current between elongate conductors
03/02/2004	US6699719 Preparation of solid support for use in the detection of particle in lipid layers; provide substrate, immerse in suspension, transfer to solid support, establish bulk aqueous phase above solid support, detect particle in solution
02/2004
02/25/2004	EP1389956A2 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
02/11/2004	CN1138126C Method and device for measuring thickness of non-ferro magnetic conductive layer on ferromagnetic conductive substrate
01/2004
01/29/2004	WO2004010074A2 Biosensor arrays and methods
01/29/2004	CA2492899A1 Biosensor arrays and methods
01/22/2004	WO2004008064A2 Transparent measuring device with enhanced visibility lines
01/22/2004	WO2003071222A9 Systems and methods for inspection of ophthalmic lenses
01/15/2004	US20040008877 Systems and methods for inspection of ophthalmic lenses
12/2003
12/04/2003	WO2003071222A3 Systems and methods for inspection of ophthalmic lenses
10/2003
10/08/2003	CN1447902A Method for measuring wall thickness of electrically conductive object
08/2003
08/28/2003	WO2003071222A2 Systems and methods for inspection of ophthalmic lenses
07/2003
07/23/2003	EP1329695A1 Magnetoresistance sensor for measuring dimensions
07/15/2003	US6593737 Method for measuring the wall thickness of an electrically conductive object
05/2003
05/22/2003	US20030096418 Preparation of solid support for use in the detection of particle in lipid layers; provide substrate, immerse in suspension, transfer to solid support, establish bulk aqueous phase above solid support, detect particle in solution
05/21/2003	EP1311800A1 Measuring the wall thickness of an electrically conductive object
05/21/2003	CN1419647A System for simultaneous projections of multiple phase-shifted patterns for the multiple phase-shifted patterns for the three-dimensional inspection of an object
03/2003
03/25/2003	US6538434 Magnetically responsive device for measuring the thickness of magnetic films
02/2003
02/20/2003	WO2002086416A3 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
02/12/2003	CN1101542C Magnetoresistive sensor for measuring dimension
01/2003
01/23/2003	US20030016882 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
12/2002
12/18/2002	EP1266187A1 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
10/2002
10/31/2002	WO2002086416A2 Method and apparatus for correcting crosstalk and spatial resolution for multichannel imaging
10/17/2002	US20020149359 Method for measuring the wall thickness of an electrically conductive object
08/2002
08/20/2002	US6435014 Method for determination of surface texture
06/2002
06/19/2002	EP1135665A4 Measurements using tunnelling current between elongate conductors
06/05/2002	CN1352741A Method for determination of surface texture
03/2002
03/13/2002	EP1135691A4 Electrostatic force detector with cantilever and shield
02/2002
02/28/2002	WO2002016863A1 Measuring the wall thickness of an electrically conductive object
02/28/2002	CA2420309A1 Measuring the wall thickness of an electrically conductive object
02/14/2002	US20020018118 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
01/2002
01/30/2002	CN1333875A Electrostatic fource detector with cantilever and shield
01/08/2002	US6337478 Electrostatic force detector with cantilever and shield for an electrostatic force microscope
11/2001
11/14/2001	EP0754290B1 Automated end tally system and method
10/2001
10/10/2001	CN1317083A Method for measuring tunnelling current between elongate conductors
09/2001
09/27/2001	WO2001071279A1 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
09/26/2001	EP1135691A1 Electrostatic force detector with cantilever and shield
09/26/2001	EP1135665A1 Measurements using tunnelling current between elongate conductors
09/24/2001	CA2301822A1 Simultaneous projection of several patterns with simultaneous acquisition for inspection of objects in three-dimensions
07/2001
07/24/2001	US6264793 Measuring caliper of paper continuously during papermaking with sensor being arranged adjacent surface of paper; maintaining sensor at position removed from paper surface to measure caliper without contacting surface; conctacting sensor
05/2001
05/16/2001	CN1295233A Instrument for measuring thickness of nonmagnetic layer on ferromagnetic base
02/2001
02/20/2001	US6191578 Magnetoresistive sensor for high precision measurements of lengths and angles
02/08/2001	DE19953061C1 Thickness measuring device for non-magnetic coating layer applied to ferromagnetic surface uses measurement of magnetic coil current for compensating magnetic adhesion force between coating layer and permanent magnet
12/2000
12/13/2000	EP1058815A1 Method and apparatus for measuring caliper of paper
12/07/2000	WO2000073733A1 Method for determination of surface texture
11/2000
11/14/2000	CA2210452C Automated end tally system
09/2000
09/26/2000	US6123546 Depth gauge and method of treating a depth gauge
07/2000
07/18/2000	CA2063738C Coin validators
05/2000
05/18/2000	WO2000028338A1 Electrostatic force detector with cantilever and shield
03/2000
03/16/2000	WO2000014476A1 Measurements using tunnelling current between elongate conductors
03/07/2000	US6033218 Depth gauge and method of treating a depth gauge
02/2000
02/03/2000	WO2000005486A1 Automatic depth sensing detection for portable soil moisture probes
01/2000
01/20/2000	DE19832090A1 Angle-of-rotation sensor for use in the field of motor vehicles for measurement of the position of the throttle control or the position of the accelerator pedal
12/1999
12/28/1999	US6008890 Positioning system for the arm of ore car turning equipment
11/1999
11/24/1999	EP0959324A1 Method and arrangement for measuring material thickness
10/1999
10/05/1999	US5963031 Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
09/1999
09/02/1999	WO1999044015A1 Method and apparatus for measuring caliper of paper
09/02/1999	CA2322172A1 Method and apparatus for measuring caliper of paper
08/1999
08/11/1999	EP0759147B1 Device for on-line measuring of the thickness of a continuously produced sheet
06/1999
06/09/1999	EP0835422B1 Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
02/1999
02/24/1999	EP0666727B1 Depth gauge and method of manufacturing
11/1998
11/25/1998	EP0879583A1 Depth gauge and method of treating a depth gauge
11/25/1998	CN1199856A Magnetoresistive sensor for measuring dimension
11/11/1998	EP0877228A1 Magnetoresistance sensor for measuring dimensions
06/1998
06/23/1998	US5770949 Device for on-line measuring of the thickness of a continuously produced sheet
04/1998
04/29/1998	CN1180406A Method and apparatus for measuring thickness of non-ferromagnetic conductive layer on ferromagnetic conductive substrate
04/15/1998	EP0835422A1 Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
11/1997
11/11/1997	US5685713 Depth gauge and method of treating a depth gauge
05/1997
05/02/1997	EP0619872B1 Piezoresistive cantilever for atomic force microscopy
02/1997
02/26/1997	EP0759147A1 Device for on-line measuring of the thickness of a continuously produced sheet
01/1997
01/22/1997	EP0754290A1 Automated end tally system
01/21/1997	US5595942 Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector
01/16/1997	WO1997001739A1 Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
01/1996
01/16/1996	US5483822 For use in an atomic force microscope
11/1995
11/16/1995	WO1995030877A1 Device for on-line measuring of the thickness of a continuously produced sheet
11/16/1995	CA2189344A1 Device for on-line measuring of the thickness of a continuously produced sheet
10/1995
10/19/1995	WO1995027883A1 Automated end tally system
08/1995
08/16/1995	EP0666727A1 Depth gauge and method of treating a depth gauge

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