Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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10/21/2010 | US20100268499 Interferometer system and method for its operation |
10/21/2010 | US20100265515 Measurement method, measurement apparatus, exposure apparatus, and device fabrication method |
10/21/2010 | US20100265514 All-optical fiber interferometer |
10/21/2010 | US20100265511 System for fourier domain optical coherence tomography |
10/21/2010 | DE102009017144A1 Vorrichtung und Verfahren zur Vermessung eines Linsensystems, insbesondere eines Auges Apparatus and method for measuring a lens system, in particular of an eye |
10/20/2010 | CN101868688A Interferometer arrangement and method for the operation thereof |
10/19/2010 | US7817285 Downhole uses of pressure-tuned semiconductor light sources |
10/19/2010 | US7817283 Determining electric field characteristics of laser pulses |
10/19/2010 | US7817282 Use of crossed-beam spectral interferometry to characterize optical pulses |
10/19/2010 | US7817281 Tuning optical cavities |
10/19/2010 | US7817280 Method and system for device identification |
10/19/2010 | US7817279 Sensing a disturbance |
10/19/2010 | US7817276 Distinguishing objects |
10/14/2010 | WO2010117999A1 Medical device and technique for using the same |
10/14/2010 | WO2010082066A3 Surface characteristic determining apparatus |
10/14/2010 | WO2010080708A3 Methods and systems for interferometric analysis |
10/14/2010 | US20100261288 Tip tray assembly for optical sensors |
10/14/2010 | US20100259759 Polarimeter employing a fizeau interferometer |
10/14/2010 | US20100259758 Semiconductor light emitting element, light source using the semiconductor light emitting element, and optical tomography imaging apparatus |
10/14/2010 | DE19807649B4 Vorrichtung und Verfahren zur dreidimensionalen Messung und Beobachtung dünner Schichten Apparatus and method for three-dimensional measurement and observation of thin layers |
10/14/2010 | DE112008003129T5 Interferenz-Messvorrichtung Interference measuring apparatus |
10/13/2010 | EP2238430A2 Scan error correction in low coherence scanning interferometry |
10/13/2010 | EP1913332B1 Apparatus and method for performing polarization-based quadrature demodulation in optical coherence tomography |
10/13/2010 | CN101858727A Parallel confocal measuring system and measuring method based on digital micromirror light source |
10/12/2010 | US7813899 Method and circuit for statistical estimation |
10/12/2010 | US7812968 Fringe projection system and method for a probe using a coherent fiber bundle |
10/12/2010 | US7812966 Method of determining the depth profile of a surface structure and system for determining the depth profile of a surface structure |
10/12/2010 | US7812964 Distance measuring interferometer and encoder metrology systems for use in lithography tools |
10/12/2010 | US7812963 Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
10/12/2010 | US7812962 Polarization mode dispersion measurement using an improved fixed analyzer method |
10/12/2010 | US7812961 Method, apparatus, and program for processing tomographic images |
10/12/2010 | US7812960 Optical ultrasound device |
10/12/2010 | US7812959 Total internal reflection holographic microscope |
10/07/2010 | WO2010113985A1 Interferometer |
10/07/2010 | WO2010111795A1 Light source, and optical coherence tomography module |
10/07/2010 | WO2010074321A4 Optical tomographic imaging apparatus |
10/07/2010 | US20100253950 Carrier-Envelope Phase Shift Using Linear Media |
10/07/2010 | US20100253949 Miniature Optical Elements for Fiber-Optic Beam Shaping |
10/06/2010 | EP2236978A1 Optical measuring device and method to determine the shape of an object and a machine to shape the object. |
10/06/2010 | EP2235722A1 Stiffness compensation in opto-mechanical mechanisms |
10/06/2010 | EP2235578A2 System, device, and method for laser capture microdissection |
10/06/2010 | CN101476853B Panoramic multi-freedom positioning cutting-tool angle measuring microscope |
10/05/2010 | US7809226 Imaging system and related techniques |
10/05/2010 | US7809225 Imaging system and related techniques |
10/05/2010 | US7809219 High-sensitivity fiber-compatible optical acoustic sensor |
10/05/2010 | US7808715 Michelson-interferometer-based delay-line interferometers |
10/05/2010 | US7808652 Interferometric measurement of DLC layer on magnetic head |
10/05/2010 | US7808648 Method and device for optical determination of physical properties of features, not much larger than the optical wavelength used, on a test sample |
10/05/2010 | US7808647 Shape measuring method |
10/05/2010 | US7808646 Interferometer for optically measuring an object |
09/30/2010 | US20100248352 Sensor for biological detection |
09/30/2010 | US20100245842 Transmitted wavefront measuring method, refractive-index distribution measuring method, method of manufacturing optical element, and transmitted wavefront measuring apparatus |
09/30/2010 | US20100245841 Cylindrical grating rotation sensor |
09/30/2010 | US20100245840 Self-calibrated interrogation system for optical sensors |
09/30/2010 | US20100245838 Method of motion correction in optical coherence tomography imaging |
09/30/2010 | US20100245837 Polarization interferometer, optical module, and optical receiver |
09/30/2010 | US20100245836 Low-cost, compact, & automated diabetic retinopathy diagnostics & management device |
09/30/2010 | US20100245835 Ultrafast chirped optical waveform recorder using referenced heterodyning and a time microscope |
09/30/2010 | US20100245832 Spectrometer and interferometric method |
09/30/2010 | US20100245804 Method of measuring amount of eccentricity |
09/30/2010 | US20100243917 Method of improving probability of Knowing through which slit in a double slit system a particle or photon passes while still forming an interference pattern |
09/30/2010 | US20100243448 Direct optical interrogation of agents in micro-fluidic channels utilizing whispering gallery resonator approach |
09/30/2010 | DE102006006302B4 Druckmesseinrichtung und Verfahren zur Druckmessung Pressure measuring device and method for measuring pressure |
09/29/2010 | EP2232232A1 System and method for chirped pulse interferometry |
09/29/2010 | CN1985235B 相对运动传感器 Relative movement sensor |
09/29/2010 | CN1947652B Optical image measuring device, fundus observation device |
09/29/2010 | CN101846492A Interferometer combined by double F-P chambers and Mach-Zehnder |
09/29/2010 | CN101846491A Interferometer combined by double F-P chambers and Michelson |
09/29/2010 | CN101451889B Systematic error correction method of interferometer |
09/29/2010 | CN101040776B A fundus observation device |
09/28/2010 | US7805021 Electronic image registration based on chrominance channel |
09/28/2010 | US7804601 Methods for making holographic reticles for characterizing optical systems |
09/23/2010 | WO2010107652A2 Error compensation in phase shifting interferometry |
09/23/2010 | WO2010106758A1 Shape measurement device and method |
09/23/2010 | WO2010106533A2 A method and apparatus for accurate determination of parameters of a stack of thin films |
09/23/2010 | US20100238457 Inhaler adaptor for a laser diffraction apparatus and method for measuring particle size distribution |
09/23/2010 | US20100238454 Optical MEMS Chemical Sensor Array |
09/23/2010 | US20100238453 Fiber-Optic Assay Apparatus Based On Phase-Shift Interferometry |
09/23/2010 | US20100238452 Dual Fiber Stretchers for Dispersion Compensation |
09/22/2010 | EP2229584A1 Probe and device for optically testing measured objects |
09/22/2010 | CN101839688A Biochip pointing process real-time detection system based on machine vision and analytical method thereof |
09/21/2010 | US7800763 High precision measurement of the free spectral range of an etalon |
09/21/2010 | US7800758 Laser-based coordinate measuring device and laser-based method for measuring coordinates |
09/16/2010 | US20100233636 Measurement apparatus, exposure apparatus, and method of manufacturing device |
09/16/2010 | US20100231924 Integrated monolithic interference detection device |
09/16/2010 | US20100231921 Methods and systems for measuring target movement with an interferometer |
09/16/2010 | US20100231920 Light-emitting intra-cavity interferometric sensors |
09/16/2010 | US20100231918 Three wavelength quantitative imaging systems |
09/16/2010 | US20100231896 Quantitative phase-contrast and excitation-emission systems |
09/16/2010 | DE10321895B4 Sensor zur Erfassung der Topografie mit einem Zweistrahl-Interferometer Sensor for detecting the topography of a two-beam interferometer |
09/16/2010 | DE102009009062A1 Verfahren zum Anordnen eines optischen Moduls in einer Messvorrichtung sowie Messvorrichtung A method of arranging an optical module in a measuring device and measurement device |
09/15/2010 | EP2228621A2 Optical interference measuring apparatus |
09/15/2010 | CN1932432B Light wave interferometer |
09/15/2010 | CN1758140B Lithographic apparatus and position measuring method |
09/15/2010 | CN101836072A Interferometer |
09/15/2010 | CN101216286B Heterodyne interferometer measuring system for measuring displacement and its measurement method |
09/14/2010 | US7797119 Apparatus and method for rangings and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands |
09/14/2010 | US7796275 Phase-shifting interferometry in the presence of vibration using phase bias |
09/14/2010 | US7796273 Phase-shifting interferometry in the presence of vibration |
09/14/2010 | US7796272 Position-measuring device for measuring a position of an object relative to a tool having a tool centerpoint |