Patents
Patents for G01B 21 - Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass (25,042)
09/1994
09/14/1994EP0607225A4 Apparatus to determine the operational effectiveness of a machine tool and method therefor.
09/14/1994EP0573421B1 Installation for the study or transformation of sample surfaces in a vacuum or controlled atmosphere
09/13/1994US5346379 Extruding device for extruding plastic tubing with a measuring device for measuring the wall thickness of the plastic tubing
09/13/1994US5345816 Integrated tip strain sensor for use in combination with a single axis atomic force microscope
09/13/1994US5345815 Atomic force microscope having cantilever with piezoresistive deflection sensor
09/13/1994US5345689 Measuring probe
09/07/1994EP0614068A1 Method of measuring orientation flat width of single crystal ingot
09/07/1994EP0433456B1 Rear wheel steering angle detection device for a vehicle
09/07/1994CN1025887C Metrology
09/06/1994US5345309 Precision three dimensional profiling and measurement system for cylindrical containers
09/01/1994WO1994019663A1 Method for the measurement of lengths and angles and an equipment therefor
09/01/1994WO1994019662A1 A device for measuring an angle in a piece
09/01/1994DE4306026A1 Towing vehicle for aircraft
09/01/1994DE4305842A1 Method for the three-dimensional detection of a surface
08/1994
08/31/1994EP0612398A1 Apparatus and method for checking features of a camshaft.
08/31/1994EP0497813B1 Calibration of measuring apparatus
08/31/1994EP0431181B1 Steering wheel operation state detector of vehicle
08/30/1994US5343393 Steering angle detecting apparatus for motor vehicles based on the phase difference between a steering angle detection signal and steering angle estimated signal
08/30/1994US5343042 Selective modification of individual nanometer and subnamometer structures in the surface of a solid
08/30/1994US5341678 Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods
08/30/1994US5341574 Coordinate measuring machine test standard apparatus and method
08/24/1994EP0611945A1 Force microscope and method for measuring atomic forces in several directions
08/17/1994EP0476077B1 Apparatus for a multiple checking of internal dimensions
08/16/1994US5339260 Apparatus for checking size of a work
08/16/1994US5339030 Multi-displacement detecting apparatus
08/09/1994US5336369 Forming film on surface of substrate, forming resist thin film, and isotropically etching
08/04/1994DE4402809A1 Roughness testing appts. for surface of printing-quality paper
08/03/1994EP0609172A1 Method for measuring the lengths of wound material arriving on a reel
08/03/1994EP0608655A1 Integrated tip strain sensor for use in combination with a single axis atomic force microscope
08/02/1994US5335183 Method and apparatus for determining profile of cylindrical object
08/02/1994US5333386 Method of measuring the effective instantaneous position of a slide-mounted probe element or tool
07/1994
07/30/1994CA2112792A1 Paper surface roughness analyzer
07/27/1994EP0607938A1 Method and apparatus comprising two magnetic sensors and one laser meter for measuring the thickness of a film
07/27/1994EP0607240A1 Measuring the accuracy of multi-axis machines
07/27/1994EP0607225A1 Apparatus to determine the operational effectiveness of a machine tool and method therefor.
07/27/1994EP0607177A1 Device for detecting the angular position of a rotating component.
07/26/1994CA2032400C Device for measuring flexural displacement of an antenna support rod staff, and use thereof for pointing control of a motor driven orientable antenna
07/21/1994DE4316236C1 Workpiece contact point coordinates measuring method
07/20/1994EP0606278A1 Method and system for fluid transfer and non-contact sensor for use therein
07/20/1994CN1089718A Method and arrangement for measuring by making use optical and electric means with submicron resolution factor
07/19/1994US5331680 For use in a bi-directional printer
07/19/1994US5329808 Atomic force microscope
07/14/1994DE4300197A1 Movement arrangement for table of coordinate measurement machine
07/13/1994EP0504336B1 Method of measuring lengths
07/13/1994CN2171845Y Intelligence compound temp. displacement sensor
07/12/1994US5327657 Touch probe
07/06/1994EP0605140A1 Touch probe and signal processing circuit therefor
07/05/1994US5327351 Non-contact digitizing method
07/05/1994US5327081 Method for determining the thickness of a material by means of a radiant energy probe
07/05/1994US5326982 Analogue displacement sensor
07/05/1994EP0619872A4 Piezoresistive cantilever for atomic force microscopy.
06/1994
06/30/1994DE4244231A1 Object positioning arrangement in microsystems
06/29/1994EP0438489B1 Gear position sensor
06/28/1994US5324935 Scanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric element
06/28/1994US5324156 Apparatus for storing and discharging rod-shaped workpieces
06/28/1994US5323660 Apparatus for classifying textile tubes according to the amount of yarn thereon
06/28/1994CA1330452C Oscillating quartz atomic force microscope
06/23/1994DE4343110A1 Rotation-angle-monitored tightening or loosening of screw connections by power driven hand-held screwdriver
06/22/1994EP0602679A1 Process and device for aquaplaning recognition by vehicles tyres
06/22/1994EP0602145A1 Measurement method and apparatus
06/21/1994US5321977 Integrated tip strain sensor for use in combination with a single axis atomic force microscope
06/21/1994US5321895 Contact sensing probe
06/15/1994EP0601320A1 Icon relocation system and method thereof
06/15/1994CN1087989A Method for measuring the thickness of a layer and apparatus for carrying out the method
06/15/1994CN1025072C Portable type measuring instrument with solar batteries
06/14/1994US5321634 Automatic thin-film measuring apparatus
06/14/1994US5319961 Cantilever chip for use in scanning probe microscope
06/14/1994US5319960 For examining surface contours of a specimen
06/09/1994DE4240625A1 Dental angle indicator for dental tool or instrument - has electromagnetic, inductive, capacitive or potentiometric source between relatively rotatable arms
06/08/1994EP0600452A1 Scanning probe instrument using stored topographical data
06/07/1994US5319570 Control of large scale topography on silicon wafers
06/07/1994US5318077 Abrasion detector for a rapier band
06/01/1994EP0599513A1 A method of measuring workpieces using a surface contacting measuring probe
06/01/1994CN2167365Y Surface and subsurface state detecting device
06/01/1994CN2167354Y Moving type magnetic measuring diameter
06/01/1994CN1024838C Miniature projective measuring instrument
05/1994
05/31/1994CA2000494C Way bearing arrangement for a horizontal arm coordinate measuring machine
05/26/1994WO1994011698A1 Enhanced resolution wafer thickness measurement system
05/25/1994EP0598709A1 Touch probe
05/24/1994US5315374 Three-dimensional measuring apparatus
05/24/1994US5315373 Method of measuring a minute displacement
05/24/1994US5314036 For a vehicle
05/24/1994US5313714 Instrument for measuring dimensions of a can seam portion
05/24/1994US5313710 Toe angle detecting apparatus
05/18/1994EP0597622A1 Sample carriage for scanning probe microscope
05/18/1994EP0597299A2 coordinate measuring machine
05/18/1994EP0593476A4 Apparatus and method for determining a center and measuring with reference thereto
05/17/1994US5313410 Artifact and method for verifying accuracy of a positioning apparatus
05/17/1994US5311784 Dimensional quality control method for cast parts
05/17/1994US5311771 Method for determining the rotational position of a crankshaft of an internal combustion engine
05/11/1994WO1994010530A1 Method of measuring the thickness of a layer, and a device for carrying out the method
05/11/1994EP0596494A2 Scanning probe microscope and method of control error correction
05/10/1994US5311432 Method and system for estimating the neutral point of a steering wheel
05/10/1994US5310968 For detecting individual points of a continuous line
05/10/1994US5309758 Steering angle sensor for automobile
05/10/1994US5309755 Profilometer stylus assembly insensitive to vibration
05/05/1994DE4314301C1 Surface scanning sensor - has a sensor point of a photo-structurable glass
05/04/1994EP0595486A1 Automated diameter gauging system
05/04/1994CN2164020Y Eccentric measuring board
05/04/1994CN1086309A Measuring device for absolute measurement of positions