| Patents for G01B 21 - Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass (25,042) |
|---|
| 03/11/1997 | US5610528 Capacitive bend sensor |
| 03/11/1997 | US5610326 Non-destructive process for characterizing the surface condition of a part |
| 03/11/1997 | US5609058 Method of determining backlash |
| 03/06/1997 | WO1997008541A1 Method and apparatus for detecting optical thermal displacement image |
| 03/06/1997 | DE19632385A1 Method of determining thickness of tubular film without contact |
| 03/05/1997 | EP0760104A1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device |
| 03/05/1997 | EP0607225B1 Apparatus to determine the operational effectiveness of a machine tool |
| 03/04/1997 | US5608523 Circuit and method for controlling glitches in low intensity signals |
| 03/04/1997 | US5608172 Die bond touch down detector |
| 02/26/1997 | EP0759535A2 Position sensor |
| 02/26/1997 | EP0759152A1 Distance sensor for detecting the adjustment travel of an actuator |
| 02/26/1997 | EP0759148A1 Metrological stylus assembly |
| 02/26/1997 | CN1143743A Graphic measurer |
| 02/25/1997 | US5606509 Correction of a measuring signal obtained from a pair of scanning rollers and pertaining to the thickness of a textile fiber sliver |
| 02/20/1997 | WO1997006410A1 Method and apparatus for tracking position and orientation of a stylus and for digitizing a 3-d object |
| 02/19/1997 | EP0758742A2 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged |
| 02/19/1997 | EP0566719B1 Touch probe |
| 02/13/1997 | DE19632269A1 Vorrichtung und Verfahren zur Analyse der Topographie einer Papieroberfläche Apparatus and method for analysis of the topography of a surface of paper |
| 02/12/1997 | EP0757788A1 Process and device for detecting structural faults of moving flat textile materials |
| 02/12/1997 | EP0757781A1 Apparatus and method for attaching a sensor to an object |
| 02/12/1997 | EP0733197A4 Apparatus for and method of measuring geometric, positional and kinematic parameters of a rotating device |
| 02/12/1997 | CA2182555A1 Apparatus and method for analyzing paper surface topography |
| 02/11/1997 | US5602330 Non-contact force microscope having a coaxial cantilever-tip configuration |
| 02/11/1997 | US5602323 For calibration of region of recesses and projections |
| 02/11/1997 | US5600878 Mandrel stem length measurement system for use with blind rivet setting tool |
| 02/06/1997 | WO1997004475A1 Xy displacement device |
| 02/06/1997 | WO1997004451A1 Microelectromechanical structure and process of making same |
| 02/06/1997 | WO1997004287A1 Device for physically holding a measurement scale in place |
| 02/06/1997 | WO1997004286A1 Device for securing a length-measurement device in place |
| 02/06/1997 | WO1997004283A2 Microfabricated torsional cantilevers for sensitive force detection |
| 02/05/1997 | EP0757228A2 Automatic inspection system for contactlessly measuring an offset of a central feature of an object |
| 02/05/1997 | EP0757227A2 Alignment and lighting system and method for aligning and lighting an object for an inspection system that contactlessly measures an offset of a central feature of the object |
| 02/05/1997 | EP0757226A2 Automatic inspection method for contactlessly measuring an offset of a central feature of an object |
| 02/05/1997 | EP0757225A2 Eccentricity determination system and method for accurately computing an offset of a central feature of an object |
| 02/05/1997 | EP0756694A1 System for detecting linear dimensions and method for testing the system operability |
| 02/04/1997 | US5599464 Formation of atomic scale vertical features for topographic instrument calibration |
| 02/04/1997 | US5598639 Tool for high temperature roll nip measurements |
| 02/03/1997 | CA2179443A1 Eccentricity determination system and method for accurately computing an offset of a central feature of an object |
| 02/03/1997 | CA2179441A1 Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently imaged |
| 02/03/1997 | CA2179079A1 Automatic inspection system for contactlessly measuring an offset of a central feature of an object |
| 02/03/1997 | CA2179078A1 Alignment and lighting system and method for aligning and lighting an object for an inspection system that contactlessly measures an offset of a central feature of the object |
| 01/29/1997 | EP0755589A1 Decoding signals containing encoded information |
| 01/29/1997 | EP0755503A1 System for measuring linear or angular movement |
| 01/28/1997 | US5598358 Apparatus and method for calibrating vehicle wheel alignment instruments |
| 01/22/1997 | EP0754933A2 Position measuring device |
| 01/22/1997 | EP0754522A1 Process for evaluating various errors of a machine-tool |
| 01/22/1997 | EP0754290A1 Automated end tally system |
| 01/22/1997 | EP0754289A1 Cantilever deflection sensor and use thereof |
| 01/22/1997 | EP0541773B1 Method and apparatus for determining path orientation of a passageway |
| 01/21/1997 | US5596203 System and method for detecting the relative position and motions between a rail vehicle and track |
| 01/21/1997 | US5595942 Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector |
| 01/14/1997 | US5594668 Method for correcting coordinate measurement on workpieces based on bending characteristics |
| 01/14/1997 | US5594330 Movement actuator/sensor systems |
| 01/14/1997 | US5594166 Cantilever for use with atomic force microscope and process for the production thereof |
| 01/09/1997 | WO1997001077A1 Measurement device |
| 01/08/1997 | EP0752574A2 Device for measuring a figure |
| 01/07/1997 | US5591921 Device for measuring the bending of a cylinder |
| 01/07/1997 | US5591903 Reconstructing the shape of an atomic force microscope probe |
| 01/02/1997 | EP0751372A2 Device for fabric edge position detection |
| 01/02/1997 | EP0751369A2 Method for filtering measured values of curves |
| 01/02/1997 | EP0750743A1 Methods and devices for automatic assessment of corn |
| 01/02/1997 | DE19523917A1 Detection, measurement and display of tyre tread depth during travel on wet roads |
| 01/02/1997 | DE19522503A1 Meßvorrichtung Measuring device |
| 12/31/1996 | US5589686 Method of an apparatus for real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
| 12/27/1996 | EP0750171A2 Touch probe |
| 12/25/1996 | CN1138695A Method and apparatus for obtaining data on strain-stress relation of test pieces of green sand molds |
| 12/24/1996 | US5587537 Method and apparatus for weld testing |
| 12/24/1996 | US5587523 Atomic force microscope employing beam tracking |
| 12/19/1996 | WO1996041133A1 Movement-detecting arrangement |
| 12/19/1996 | WO1996041126A1 Method and apparatus for measuring outside dimensions and the center of gravity of a package |
| 12/19/1996 | WO1996039924A1 Apparatus and method for measuring tympanic displacement |
| 12/18/1996 | EP0748669A1 Probe arm for machine tool |
| 12/18/1996 | EP0548328B1 Touch probe |
| 12/17/1996 | US5584199 Device for measuring an angle in a workpiece |
| 12/12/1996 | WO1996039610A1 A system for monitoring an earth and/or rock body |
| 12/12/1996 | DE19526518C1 Shape locking attachment for measurement scale, e.g. long length measurement device for machine tool |
| 12/12/1996 | DE19526517C1 Length measurement device attachment device, e.g. for combined positioning-measurement of machine tool |
| 12/12/1996 | DE19520683A1 Anordnung zur Erfassung einer Bewegung Arrangement for detecting a movement |
| 12/12/1996 | CA2221492A1 A system for monitoring an earth and/or rock body |
| 12/11/1996 | EP0747787A1 Tool for high temperature roll nip measurements |
| 12/11/1996 | EP0746857A1 Scanning probe microscope |
| 12/11/1996 | EP0746744A1 Virtual two gauge profile system |
| 12/11/1996 | EP0746520A1 Package measuring system and accumulator |
| 12/11/1996 | EP0673498A4 Profilometer stylus assembly insensitive to vibration. |
| 12/11/1996 | CN2242440Y Arrangement for measuring length of tube |
| 12/10/1996 | US5583286 Integrated sensor for scanning probe microscope |
| 12/05/1996 | WO1996038705A1 Probes for sensing and manipulating microscopic environments and structures |
| 12/05/1996 | DE19621781A1 Selector control for vehicle automatic transmission |
| 12/04/1996 | EP0745987A2 Probe for memory device having movable media |
| 12/03/1996 | US5581483 Measurement of shot peening coverage by correlation analysis of surface line data |
| 11/28/1996 | DE19519317A1 Inclinometer for levelling printing equipment |
| 11/27/1996 | EP0744678A2 Roundness measuring apparatus |
| 11/27/1996 | CN1136842A Apparatus for and method of measuring geometric positional and kinematic parameters of rotating device |
| 11/26/1996 | US5579246 Method and device for the correction of measurement errors due to vibrations in coordinate measuring devices |
| 11/26/1996 | US5578505 Multilayer semiconductors with silicon wafers from vacuum deposition hexamethyldisilizane, treatment with oxygen to form carbon dioxide and water |
| 11/26/1996 | CA2070946C Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same |
| 11/26/1996 | CA2029663C Control device for operating a coating device |
| 11/20/1996 | EP0586454B1 Positional measurement |
| 11/19/1996 | US5576727 Electromechanical human-computer interface with force feedback |
| 11/19/1996 | US5576483 Capacitive transducer with electrostatic actuation |