Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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04/16/1985 | US4510866 Apparatus for measuring the area of image portion of image-bearing member |
04/16/1985 | US4510798 Shallow junction depth measurement method |
04/16/1985 | CA1185423A1 Method for adjusting the toe of the steerable wheels on a vehicle relative to the average rolling direction of the vehicle nonsteerable wheels |
04/09/1985 | US4510390 Electronic method and apparatus for distance measurement through the use of equidistant thermal fiducial markings |
04/09/1985 | US4510389 Infrared film thickness gage |
04/09/1985 | US4509265 Turbine blade measurement |
04/09/1985 | US4509263 Laser sensing means for dimensional control purposes |
04/09/1985 | CA1185147A1 Log scanning in veneer lathe to determine optimum yield axis |
04/09/1985 | CA1185084A1 Transducer alignment method for weight and balance system |
04/03/1985 | EP0135673A2 Process and device to determine a coordinate on the surface of a solid object |
04/03/1985 | EP0135597A1 Process and device for mutually aligning objects |
04/03/1985 | EP0058673A4 Laser measuring system and method for turning machine. |
04/02/1985 | US4509075 Automatic optical inspection apparatus |
04/02/1985 | US4508452 Arrangement for sensing the characteristics of a surface and determining the position of points thereon |
04/02/1985 | US4508448 Apparatus for measuring the distance to a point on the inner wall of a hot furnace |
03/27/1985 | EP0135494A2 Combination photodetector array/mask positioning system |
03/27/1985 | EP0135302A1 A method and apparatus for inspecting printed wiring boards |
03/27/1985 | EP0135000A2 Device for measuring length according to the double-gap laser interferometer principle |
03/27/1985 | EP0134996A1 An apparatus for detecting the flatness of a paper sheet |
03/26/1985 | US4507647 Encoder |
03/26/1985 | US4506980 Method and apparatus for determining physical characteristics of objects and object surfaces |
03/26/1985 | US4506947 Method and apparatus for core alignment of optical fibers |
03/26/1985 | CA1184650A1 Reference marker/correlation scheme for optical measurements |
03/20/1985 | EP0134772A1 Method for the registration of the topographic card of the charged mass in a shaft furnace |
03/20/1985 | EP0134597A1 Measuring system based on the triangulation principle for the dimensional inspection of an object |
03/20/1985 | EP0134573A2 Precision probe positioner |
03/20/1985 | EP0134224A1 A method and a device for determination of desired middle line of a cylindrical object such as a log |
03/14/1985 | WO1985001117A1 Light modulation sensor |
03/12/1985 | US4504939 Storage medium track pitch detector |
03/12/1985 | US4504148 System for detecting a signal for aligning two bodies and signal _processing method |
03/12/1985 | US4504147 Angular alignment sensor |
03/12/1985 | CA1183939A1 Video image compensator for inspection apparatus |
03/05/1985 | US4503506 Apparatus for mapping and identifying an element within a field of elements |
03/05/1985 | US4502785 Surface profiling technique |
03/05/1985 | US4502783 Alignment stabilization prism |
03/05/1985 | US4502253 Surface treating and testing apparatus |
02/28/1985 | WO1985000885A1 Method and apparatus for calibrating a surface scanner |
02/26/1985 | US4501961 Vision illumination system for range finder |
02/26/1985 | US4501950 Adaptive welding system |
02/26/1985 | US4501492 Method for testing specimens |
02/19/1985 | US4500792 Apparatus for controlling the titer of synthetic fiber tows |
02/19/1985 | US4500206 Optical system for measuring shadowgraph data |
02/19/1985 | US4500203 Method and apparatus for inspecting articles |
02/19/1985 | US4500202 Printed circuit board defect detection of detecting maximum line width violations |
02/19/1985 | US4500201 Individual toe measuring system |
02/19/1985 | US4500200 Electro-optic sensor for measuring angular orientation |
02/19/1985 | CA1182901A1 Device for inspecting a casting |
02/14/1985 | WO1985000696A1 Method for automatically counting etched pits |
02/14/1985 | WO1985000657A1 Method and arrangement for the contact-free quality identification and structural description of, for instance, workpieces such as lengths of timber |
02/13/1985 | EP0133120A2 Device for measuring the edge to edge dimension of an object by optical means |
02/13/1985 | EP0132978A2 Displacement measuring apparatus and method |
02/12/1985 | US4499540 Device for the testing of bodies comprising periodic structures |
02/12/1985 | US4499492 Method and apparatus for three frame range imaging |
02/12/1985 | US4499383 Edge detection apparatus |
02/12/1985 | US4498917 Machining of buffer material |
02/12/1985 | US4498779 Automatic stripe width reader |
02/12/1985 | US4498778 High speed scanning method and apparatus |
02/12/1985 | US4498777 Apparatus for determining the position of a point on an object or the shape of a portion thereof |
02/12/1985 | US4498776 Electro-optical method and apparatus for measuring the fit of adjacent surfaces |
02/12/1985 | US4498775 Method for detecting distance deviations to a photoresist surface in an optical printer |
02/12/1985 | US4498773 Pencil beam interferometer |
02/12/1985 | US4498771 Method and means for interferometric surface topography |
02/12/1985 | US4498770 Apparatus and method for determining the configuration of a reflective surface |
02/12/1985 | US4498768 Angle of arrival meter |
02/12/1985 | US4498762 Projection type exposure apparatus |
02/12/1985 | US4498244 Target including sliding scale |
02/05/1985 | CA1181945A1 Apparatus for measuring the alignment of the front and rear wheel systems of automotive vehicles as well as the setback angles between the wheels of the front system and the side-slip angle |
02/05/1985 | CA1181944A1 Non-contact sensor, system and method with particular utility for measurement of road profile |
01/30/1985 | EP0132260A1 Device for determining a modification of the relative distance between two measurement points and utilization thereof. |
01/29/1985 | US4496983 Trimming area control system in photo-printing |
01/29/1985 | US4496971 Detecting anomalies in a reproduction of a pattern on a workpiece |
01/29/1985 | US4496425 Technique for determining the end point of an etching process |
01/23/1985 | EP0132200A1 Electro-optical gap and flushness sensor |
01/23/1985 | EP0132122A2 Apparatus for inspecting mask for use in manufacturing large scale integrated circuits |
01/23/1985 | EP0131819A1 Position indicator employing light guides |
01/23/1985 | EP0131710A1 Method of determining surface roughness using a visible and infrared laser source |
01/22/1985 | US4494874 Detection of three-dimensional information using a projected point or line of light |
01/22/1985 | US4494656 Down and stuck ware inspection method and apparatus |
01/17/1985 | WO1985000222A1 Position measurement by laser beam |
01/15/1985 | US4493994 Detecting the condition of a sheet |
01/15/1985 | US4493554 For detecting defects in a bore surface |
01/15/1985 | CA1180995A1 Immediate ignition smokeless burning of waste gases |
01/15/1985 | CA1180890A1 Method for measuring the position of a frame-saw blade |
01/09/1985 | EP0130345A2 Integrated lighting and camera system |
01/08/1985 | US4492861 Arrangement for detecting the position of an index mark relative to a graduation |
01/08/1985 | US4492473 For measuring the position/dimensions of an object |
01/08/1985 | US4492472 Method and system for determining shape in plane to be determined in atmosphere of scattering materials |
01/08/1985 | US4492471 Arrangement for checking dimensional accuracy |
01/08/1985 | US4492470 For measuring the distance between line elements of optical images |
01/08/1985 | US4492467 Measurement of the size of particles |
01/08/1985 | US4492465 Retro-reflective electro-optical angle measuring system |
01/08/1985 | US4492464 Apparatus and method for distance measurement by laser interferometry |
01/08/1985 | US4492034 Displacement measuring device |
01/08/1985 | US4492033 Linear scale type displacement measuring instrument |
01/08/1985 | US4492031 Vernier device of the digital display type for a universal parallel ruler |
01/02/1985 | EP0059741B1 Leading mark |
01/01/1985 | US4491868 Video image compensator for inspection apparatus |
01/01/1985 | US4491787 Flatness measuring device |
12/27/1984 | EP0129388A2 Measurement of contact lenses |
12/27/1984 | EP0129261A1 System and device for detecting the deposition of particles |