Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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12/20/1985 | CN85200041U Installation for determining fan profile by optical fiber |
12/20/1985 | CN85104898A Apparatus with optical-fiber for measuring the outer cylindrial surfaces griand on line |
12/19/1985 | WO1985005697A1 Optic sensors |
12/19/1985 | WO1985005675A1 Vehicle for evaluating properties of road surfaces |
12/19/1985 | WO1985005674A1 Shape evaluating apparatus |
12/19/1985 | WO1985005673A1 Technique for measuring very small spacings |
12/17/1985 | US4559448 Method and device for measuring backlash in a drive mechanism comprising a screw and a nut |
12/17/1985 | US4559019 Automatic gun mount alignment apparatus |
12/17/1985 | US4558949 Horizontal position detecting device |
12/17/1985 | US4558591 Engine position transducer means |
12/11/1985 | EP0164181A2 Frequency modulated laser radar |
12/11/1985 | EP0164029A2 Apparatus for detecting a proportional change in a profile following its extrusion |
12/11/1985 | EP0163824A2 Photoelectric measuring device |
12/11/1985 | EP0163645A1 Optical probe to measure the depth of a cavity |
12/10/1985 | US4558215 Object detecting apparatus |
12/10/1985 | US4557607 Method and device for structural, superficial and deep analysis of a body |
12/10/1985 | US4557602 Edge detector in optical measuring instrument |
12/05/1985 | WO1985005443A1 Device for determining modifications of the mutual position of separately mounted machines |
12/04/1985 | EP0163466A2 Method and apparatus for evaluating both thickness and compositional variables in a layered or thin film sample |
12/04/1985 | EP0163362A1 Displacement measuring apparatus and method |
12/04/1985 | EP0163347A1 Measuring system for contactless measuring the distance between a predetermined point of an object surface and a reference level |
12/04/1985 | EP0163176A2 Ellipsometric method and arrangement for monitoring the physical properties of samples or superficial layers of samples |
12/04/1985 | EP0162973A1 Distance measuring device |
12/03/1985 | US4556902 System and method for measuring the area and dimensions of apertures in an opaque medium |
12/03/1985 | US4556322 Arrangement for checking dimensional accuracy |
12/03/1985 | US4555942 Method for continually controlling the quality of cathode copper |
11/27/1985 | EP0162713A2 Optical position and orientation measurement techniques |
11/27/1985 | EP0162683A2 A method for observing an object in a small gap and an apparatus for the same |
11/27/1985 | EP0162188A1 Testing device for rotatable shafts |
11/27/1985 | EP0162120A1 Method and device for the inspection of surfaces |
11/26/1985 | US4555767 Method and apparatus for measuring thickness of epitaxial layer by infrared reflectance |
11/26/1985 | US4555636 Pattern detector |
11/26/1985 | US4555633 Photoelectric dimension measuring system |
11/26/1985 | US4555180 Printed area measuring apparatus |
11/26/1985 | US4555178 Method for the measurement of the difference in the optical properties dependent on the light direction of two samples |
11/26/1985 | US4555175 Measuring compression of cabled optical fibers |
11/26/1985 | US4554714 Moving web expanding and guiding apparatus |
11/21/1985 | WO1985005182A1 Assessing powder coatings |
11/19/1985 | US4554580 Image information output apparatus |
11/19/1985 | US4554450 Device for angle of rotation determination |
11/19/1985 | US4553844 Configuration detecting method and system |
11/19/1985 | US4553842 Two dimensional optical position indicating apparatus |
11/19/1985 | US4553841 Method of and apparatus for measuring thickness and refractive index of transparent bodies |
11/13/1985 | EP0161158A1 Instrument for determining from a distance the winning point in the French version of bowls by perspective and incorporated midline |
11/13/1985 | EP0160999A2 Position measuring device |
11/13/1985 | EP0160895A2 Method and apparatus for measuring continuously and without making contact the shrinkage of textiles |
11/13/1985 | EP0160811A2 Photoelectric measuring device |
11/13/1985 | EP0160793A1 Optical tool for aligning transducer head assemblies |
11/13/1985 | EP0160781A1 Measuring and detecting printed circuit wiring defects |
11/12/1985 | US4553217 Glassware gauging system |
11/12/1985 | US4553164 Spatial correction device for an image analyzer |
11/12/1985 | CA1196494A1 Borehole survey instrument |
11/10/1985 | CN85200323U Figure area integrator with printed board |
11/06/1985 | EP0160346A2 Apparatus for detecting containers having a deviating property |
11/06/1985 | EP0160334A1 Collimator for the harmonisation of two optical devices |
11/06/1985 | EP0160160A1 Video measuring system for defining location orthogonally |
11/05/1985 | US4551030 Procedure and means for examining the surface quality of materials in solid state |
11/05/1985 | US4550506 Measuring machine |
11/05/1985 | US4550505 Instrument for measuring lengths |
11/05/1985 | US4550504 Method and apparatus for the measurement of the length of a straight line or an arc |
10/30/1985 | EP0159800A2 Micro-dimensional measurement apparatus |
10/29/1985 | US4550433 Apparatus for discriminating a paper-like material |
10/29/1985 | US4550418 Method of making coordinate measurements |
10/29/1985 | US4550376 Inspection system for mechanical structures |
10/29/1985 | US4549808 Movable aperture photoelectric measuring instrument |
10/29/1985 | US4549360 Device for alignment of process equipment and method of use thereof |
10/29/1985 | CA1195858A1 Method of and apparatus for measuring the thickness and the refractive index of transparent materials |
10/29/1985 | CA1195839A1 Process and device for simultaneously measuring the geometrical characteristics of an optical fibre |
10/23/1985 | EP0159210A1 Optical device for surface proximity detection and its application to the retrieval of a surface profile |
10/23/1985 | EP0159187A2 A surface topography measuring system |
10/22/1985 | US4549272 Apparatus for filling containers with prescribed quantity of product by weight |
10/22/1985 | US4549207 Gap measuring apparatus |
10/22/1985 | US4549079 Apparatus for measuring thickness of paint coating |
10/22/1985 | US4548506 Nondestructive analysis of multilayer roughness correlation |
10/22/1985 | US4548504 Device for determining the real or the virtual distance of a source of light from a measuring plane |
10/16/1985 | EP0158172A2 Testing of arbitrary optical surfaces |
10/16/1985 | EP0158139A1 Error-corrected corpuscular beam lithography |
10/16/1985 | EP0158041A1 Device for measuring the position of a light source situated within a lighthouse |
10/15/1985 | US4547895 Pattern inspection system |
10/15/1985 | US4547800 Position detecting method and apparatus |
10/15/1985 | US4547674 Optical triangulation gear inspection |
10/15/1985 | CA1195426A1 Photoelectric apparatus for monitoring a dimension |
10/15/1985 | CA1195408A1 Non-contact visual proximity sensing apparatus |
10/15/1985 | CA1195407A1 Flaw detector |
10/09/1985 | EP0157431A1 Procedure to measure the dimensions of a body in movement in a three-dimensional field, and an optoelectronic device to carry out such procedure |
10/09/1985 | EP0157299A1 Image processing apparatus |
10/09/1985 | EP0157230A2 Method and apparatus for optically testing cylindrical surfaces |
10/09/1985 | EP0157227A2 Interferometer |
10/09/1985 | EP0157148A1 Process for the contactless measurement of the length of a moving article, and measuring apparatus for carrying out the process |
10/09/1985 | EP0157141A1 Device for fast profile plotting |
10/09/1985 | EP0156991A1 Optical measuring device for contactless distance measurement |
10/08/1985 | US4545128 Apparatus for checking alignment of tandem flangeless monorail wheels |
10/02/1985 | EP0156342A2 Three-dimensional vision system |
10/01/1985 | US4544889 Robot precision probe positioner with guidance optics |
10/01/1985 | US4544268 Method and apparatus for detecting flaw on threads of male screw |
10/01/1985 | CA1194349A1 Adaptive welding system |
09/26/1985 | WO1985004266A1 Dissimilar superimposed grating precision alignment and gap measurement systems |
09/26/1985 | WO1985004257A1 Method and apparatus for the contact-free measurement of a motion |
09/26/1985 | WO1985004250A1 Method and apparatus for precision sem measurements |
09/26/1985 | WO1985004245A1 Optical article dimension measuring system |