Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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05/12/2010 | CN201463846U Newton's ring gasket |
05/12/2010 | CN201463845U Structural three-dimensional stereo vision measurement system mounting box with switchable working model |
05/12/2010 | CN201463844U Portable off-line measuring device for oscillation mark depth of casting blank |
05/12/2010 | CN201463843U Digital photography-based geotechnical engineering deformation remote monitoring system |
05/12/2010 | CN201463842U Axial spacing detector |
05/12/2010 | CN201463841U Six-point locating straight-line motion mechanism of square gauging spindle of length measuring instrument |
05/12/2010 | CN201463840U Precise mouse movement control device capable of measuring map distance |
05/12/2010 | CN201463839U Fully-automatic hand-held intelligent measuring instrument for mesh of fishing net |
05/12/2010 | CN201463838U Displacement acquisition device for self-balance loading method |
05/12/2010 | CN201463837U Touch lever type electronic altitude touch machine |
05/12/2010 | CN201463836U Foot length measuring system |
05/12/2010 | CN201463835U Device for detecting size and color difference of mechanism on line |
05/12/2010 | CN201463834U Laser tracker coordinate setting auxiliary device for large curved surface |
05/12/2010 | CN201456310U Calender on-line thickness measuring device |
05/12/2010 | CN201455401U Oscillating measuring device for flying shears |
05/12/2010 | CN1936496B Pattern light irradiation device, three-dimensional shape measuring device, and method of pattern light irradiation |
05/12/2010 | CN1924516B Sensor and recording apparatus using the same |
05/12/2010 | CN1896680B Method and apparatus for generating projecting pattern for realizing stereo parallelism |
05/12/2010 | CN1854681B Measuring device and method |
05/12/2010 | CN1847789B Method and apparatus for measuring position and orientation |
05/12/2010 | CN1823256B Information display apparatus |
05/12/2010 | CN1750247B Direct evaluating method and device for metal fine wire |
05/12/2010 | CN1749691B Infrared induction detecting method and apparatus |
05/12/2010 | CN1726501B Image scanning device having a system for determining the distance to a target |
05/12/2010 | CN1711817B Electronic parts mounting apparatus and method |
05/12/2010 | CN1702435B Interferometric miniature grating encoder read head using fiber optic receiver channels |
05/12/2010 | CN1650491B Method for detecting projecting adherend and method for producing super plug using said method |
05/12/2010 | CN101707890A Method for use with an optical aligner system for positioning a fixture relative to a vehicle |
05/12/2010 | CN101706997A Distributed optical fiber vehicle comprehensive information detection system and processing method thereof |
05/12/2010 | CN101706579A MEMS dynamic tester based on self-mixing effect of diode laser |
05/12/2010 | CN101706457A Device for automatic counting and pin checking of tube circuit |
05/12/2010 | CN101706427A Device and method for detecting force thermal magnetic coupling action of ferromagnetic thin film |
05/12/2010 | CN101706264A Projection three-dimensional measuring device |
05/12/2010 | CN101706263A Three-dimensional surface measurement method and measurement system |
05/12/2010 | CN101706262A Absolute non-interfering precision measuring method facing ultra-large spatial complex curved surface |
05/12/2010 | CN101706261A Device for measuring diameter of large shaft working piece by non-contact-type online measurement |
05/12/2010 | CN101706260A Sub-pixel-based diameter measuring method |
05/12/2010 | CN101706259A Concrete crack width test method based on wavefront coding technology and hand-held tester |
05/12/2010 | CN101706258A Resistance type light spot position sensor |
05/12/2010 | CN101706257A Method for detecting product produced by using mold and provided with irregularly-shaped inner hole or channel |
05/12/2010 | CN101706256A Full-automatic quality detection device of micro drill point for drilling PCB |
05/12/2010 | CN101706255A Detection method and detector of commutator segment interdeep |
05/12/2010 | CN101706254A Image measuring system and methods of generating and executing non-stop image measuring program |
05/12/2010 | CN101706253A Filtering phase discriminator type dynamic interferometry system |
05/12/2010 | CN101162140B Paper size feeler mechanism for image scanner |
05/12/2010 | CN101103246B Automatic judging system |
05/12/2010 | CN101069088B Surface inspection apparatus |
05/11/2010 | US7716026 Non-destructive method for inverse-calculating fiber probe aperture size and prediction method of fabrication profile of near field photolithography |
05/11/2010 | US7715644 Image calibration method, image calibration processing device, and image calibration processing terminal |
05/11/2010 | US7715026 Method, apparatus, and system for non-contact manual measurement of a wheel profile |
05/11/2010 | US7715025 Optical displacement measuring apparatus |
05/11/2010 | US7715024 Method of and apparatus for determining geometrical dimensions of a wheel rim, in particular when fitting and/or removing a motor vehicle tyre |
05/11/2010 | US7715023 Jig mounting apparatus |
05/11/2010 | US7715022 Apparatus and method for measuring shape |
05/11/2010 | US7715021 Microscope and microscope microexamination procedure method for the measurement of the surface profile of an object |
05/11/2010 | US7715020 Three-dimensional shape measuring system |
05/11/2010 | US7715019 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method |
05/11/2010 | US7715018 3-dimensional imaging by acoustic warping and defocusing |
05/11/2010 | US7715016 Image invariant optical speckle capturing device and method |
05/11/2010 | US7715007 Lateral shift measurement using an optical technique |
05/11/2010 | US7712334 Method for positioning a glass plate on rollers |
05/11/2010 | CA2486265C Combined bragg grating wavelength interrogator and brillouin backscattering measuring instrument |
05/06/2010 | WO2010050365A1 Reference wafer for calibrating dark-field inspection device, method for fabricating reference wafer for calibrating dark-field inspection device, method for calibrating dark-field inspection device, dark-field inspection device, and wafer inspection method |
05/06/2010 | WO2010050296A1 Optical tomographic image forming method |
05/06/2010 | WO2010050180A1 Device and method for detecting stopped state of vehicle, and alignment adjusting device |
05/06/2010 | WO2010050162A1 Road measurement device and method for measuring road |
05/06/2010 | WO2010049209A1 Method and device for determining a flatness of a metal strip |
05/06/2010 | WO2010048960A1 Scanner with feedback control |
05/06/2010 | WO2010015459A3 Optical sensor and method for measuring profiles |
05/06/2010 | WO2010015458A3 Optical sensor and method for measuring profiles |
05/06/2010 | WO2010005652A8 Methodology for evaluating valve seat characteristics with a vision-based system |
05/06/2010 | WO2009153067A3 Device for contactless distance measurement |
05/06/2010 | WO2009114519A3 Monitoring system for well casing |
05/06/2010 | US20100115671 inertial positioner and an optical instrument for precise positioning |
05/06/2010 | US20100114525 Method for determining the clearance and/or mismatch of an opening for a vehicle without referencing the opening |
05/06/2010 | US20100114522 Photolithography systems and associated alignment correction methods |
05/06/2010 | US20100114504 Process for contact-free determination of forces and/or torque acting on a hollow-cylindrical body as well as a measurement arrangement for implementing the process |
05/06/2010 | US20100110451 Coating Evaluation Process |
05/06/2010 | US20100110450 Method and system for inspecting blade tip clearance |
05/06/2010 | US20100110449 Device for Determining the Position of at Least One Structure on an Object, Use of an Illumination Apparatus with the Device and Use of Protective Gas with the Device |
05/06/2010 | US20100110448 Internal inspection system and method |
05/06/2010 | US20100110445 Slit aperture for diffraction range finding system and method for using the slit aperture to form a focused image |
05/06/2010 | US20100110444 Measurement apparatus |
05/06/2010 | US20100110434 Alignment for Edge Field Nano-Imprinting |
05/06/2010 | US20100110400 Scanning exposure apparatus, control method therefor, and device manufacturing method |
05/06/2010 | US20100110375 Optical image measurement device |
05/06/2010 | US20100109202 Substrate Alignment |
05/06/2010 | DE202010002205U1 Umlenkeinrichtung, insbesondere für Kanalinspektionseinrichtung Deflection, especially for sewer inspection equipment |
05/06/2010 | DE102009051708A1 Linearcodierer Linear encoder |
05/06/2010 | DE102009046184A1 Industrielle Vorrichtung Industrial Device |
05/06/2010 | DE102009030224A1 Vorrichtung mit einem Emitter-Kontakt, einem Kollektor-Kontakt und einem Spalt und Verfahren zu ihrer Herstellung Device with an emitter contact, a collector contact and a gap, and processes for their preparation |
05/06/2010 | DE102008054042A1 Absolute Positionscodierung und Positionsmessvorrichtung Absolute position encoding and position measuring device |
05/06/2010 | DE102008053977A1 Absolute Positionscodierung und Positionsmessvorrichtung Absolute position encoding and position measuring device |
05/06/2010 | DE102008053876A1 Flaschennaht- und Embossingausrichtung Flaschennaht- and Embossingausrichtung |
05/06/2010 | DE102008052634A1 Berührungslose Dichtigkeitsprüfung mittels Impulsen Contactless leak test using pulses |
05/06/2010 | DE102008043416A1 Mikromechanisches Bauteil und Verfahren zum Betreiben eines mikromechanischen Bauteils Micromechanical element and method for operating a micromechanical component |
05/06/2010 | CA2737902A1 Device and method for detecting stopped state of vehicle, and alignment adjusting device |
05/05/2010 | EP2182320A1 Method and system for inspecting blade tip clearance for a turbine |
05/05/2010 | EP2182319A1 Interferometric distance measuring apparatus |
05/05/2010 | EP2180832A2 Method and apparatus for the optical characterization of surfaces |