| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 07/13/2010 | US7755768 Apparatus for and a method of determining a characteristic of a layer or layers |
| 07/13/2010 | US7755761 Self-normalizing contour drilling machine |
| 07/08/2010 | WO2010077902A2 Dual fiber grating and methods of making and using same |
| 07/08/2010 | WO2010077900A1 Structured light imaging system and method |
| 07/08/2010 | WO2010077864A1 Optical solid-state heading sensor |
| 07/08/2010 | WO2010077793A2 Method and apparatus for determining sheet position during production and handling |
| 07/08/2010 | WO2010076540A1 Optical fibre device for interferometric analysis of the surface condition of an object |
| 07/08/2010 | WO2010076054A1 Method for measuring a chassis and device for measuring the chassis geometry of a motor vehicle |
| 07/08/2010 | WO2010075964A1 Device and method for determining the surface shape of the cornea of an eye by analyzing the mirror images of spatially distributed patterns |
| 07/08/2010 | US20100174507 Method and system for measuring angles based on 360 degree images |
| 07/08/2010 | US20100174497 Electromagnetic field distribution measurement apparatus |
| 07/08/2010 | US20100172720 Positional deviation detection apparatus and process system employing the same |
| 07/08/2010 | US20100172570 Pattern inspection method and its apparatus |
| 07/08/2010 | US20100172544 Method of measuring, on the fly, the height of an electrolysis anode |
| 07/08/2010 | US20100172212 Edge detecting apparatus and automatic device with same |
| 07/08/2010 | US20100171966 Alignment apparatus for semiconductor wafer |
| 07/08/2010 | US20100171965 Method for Measuring the Thickness or Curvature of Thin Films |
| 07/08/2010 | US20100171964 Method and Apparatus to Provide Corrections for a Radiation-Therapy Beam |
| 07/08/2010 | US20100171963 Apparatus for measurement of three-dimensional shape |
| 07/08/2010 | US20100171962 System and Method for Probe Mark Analysis |
| 07/08/2010 | US20100171961 Method for the contactless measurement of three-dimensional objects with two layers by single-view backlit shadowgraphy |
| 07/08/2010 | US20100171955 Displacement sensor |
| 07/08/2010 | US20100171946 Microscope and method for total internal reflection-microscopy |
| 07/08/2010 | US20100171823 Alignment apparatus for semiconductor wafer |
| 07/08/2010 | US20100171704 Optoelectronic Device for Determining Relative Movements or Relative Positions of Two Objects |
| 07/08/2010 | US20100170437 Dynamic Film Thickness Control System/Method and its Utilization |
| 07/08/2010 | US20100170100 Integral illuminated optical center finder and marking tool |
| 07/08/2010 | US20100170099 Positioning system for laser alignment tools |
| 07/08/2010 | DE102008064562A1 Vorrichtung zum optischen Inspizieren einer zumindest teilweise glänzenden Oberfläche an einem Gegenstand Apparatus for optically inspecting an at least partially glossy surface on an object |
| 07/08/2010 | DE102008055158A1 Verfahren zur 3D-Vermessung der Oberfläche eines Objekts, insbesondere für zahnmedizinische Zwecke Method for 3D measurement of the surface of an object, especially for dental purposes |
| 07/08/2010 | DE102008019150B4 Vorrichtung und Verfahren zur Brillouin-Frequenzbereichsanalyse Apparatus and method for Brillouin frequency domain analysis |
| 07/08/2010 | DE102007037726B4 Verfahren zur berührungslosen Messung von Verformungen einer Oberfläche eines Messobjektes Method for the contactless measurement of deformations of a surface of a measurement object |
| 07/08/2010 | DE102005042616B4 Drehstellungssensor Rotary position sensor |
| 07/08/2010 | DE10129651B4 Verfahren zur Kompensation der Dispersion in Signalen von Kurzkohärenz- und/oder OCT-Interferometern Method for compensating the dispersion in signals from short-coherence and / or OCT interferometers |
| 07/07/2010 | EP2204697A2 Marker structure, lithographic projection apparatus, method for substrate alignment using such a structure, and substrate comprising such marker structure |
| 07/07/2010 | EP2204635A1 Method, control program and system for determining at least one suspension value of a steerable vehicle |
| 07/07/2010 | EP2203711A1 Method and system for optically inspecting parts |
| 07/07/2010 | CN201522959U Intelligent high pressure vacuum circuit breaker |
| 07/07/2010 | CN201522407U Hard-meter measuring unit |
| 07/07/2010 | CN201522358U Balancing machine by using disk type electro-magnet actuating device to drive |
| 07/07/2010 | CN201522269U Turnover bearing clearance measuring machine |
| 07/07/2010 | CN201522268U Digital rotation angle measurer |
| 07/07/2010 | CN201522267U 面形传感器 Surface shape sensor |
| 07/07/2010 | CN201522266U Computer-based binocular vision false-tooth scanning device |
| 07/07/2010 | CN201522265U VCM magnetic steel vision detecting system |
| 07/07/2010 | CN201522264U Aeroengine airtight ring transmittance detecting device |
| 07/07/2010 | CN201522263U 光电式垂线遥测坐标仪 Photoelectric vertical coordinate instrument telemetry |
| 07/07/2010 | CN201522262U 自动补偿测量装置 Automatic compensation measuring device |
| 07/07/2010 | CN201522162U Ice storage barrel with infrared measuring device |
| 07/07/2010 | CN101770641A Rapid extracting method for structure light welding seam image characteristic points |
| 07/07/2010 | CN101770539A Optical grating displacement sensor distance measuring device based on FPGA |
| 07/07/2010 | CN101769987A Detector device |
| 07/07/2010 | CN101769969A Device and method for measuring piezoelectric constant loop and dielectric constant loop of ferroelectric material |
| 07/07/2010 | CN101769878A Array tester, method for measuring a point of substrate of the same and method for measuring a position coordinate photographed by a camera assembly |
| 07/07/2010 | CN101769821A Lens refractive index and thickness measuring method and device based on differential confocal technology |
| 07/07/2010 | CN101769727A Online automatic detection system of local straight degree of circular-section workpiece |
| 07/07/2010 | CN101769726A Welded pipe end straightness online detection device |
| 07/07/2010 | CN101769725A F-P board angular displacement measuring instrument by feedback compensation method |
| 07/07/2010 | CN101769724A Method for measuring helical angle of inner-grooved copper tube |
| 07/07/2010 | CN101769723A Electronic device and object shape parameter measurement method thereof |
| 07/07/2010 | CN101769722A Method for heterodyne temporal series speckle interferometry of object deformation |
| 07/07/2010 | CN101769721A Optical measurement device |
| 07/07/2010 | CN101769720A Space displacement sensor |
| 07/07/2010 | CN101769719A Lens travel testing table for lens driving device |
| 07/07/2010 | CN101769718A Device for detecting and adjusting coaxial coplanarity of laser focus and micropore |
| 07/07/2010 | CN101769717A Extended range focus detection apparatus |
| 07/07/2010 | CN101769716A System and method for detecting geometric dimension of water outlet |
| 07/07/2010 | CN101769475A Image measuring apparatus light source and automatic positioning system using same |
| 07/07/2010 | CN101387502B Synthetic measuring method for roundness of external circle, coaxiality of inner hole and external circle and verticality of end plane for shaft sleeve parts |
| 07/07/2010 | CN101382417B Non-contact six- freedom degree displacement measuring device |
| 07/06/2010 | US7752009 Method and apparatus for checking the height of a mail item on the fly for franking purposes |
| 07/06/2010 | US7751871 Method and device for carrying out optical pick up |
| 07/06/2010 | US7751657 Inclinometer system |
| 07/06/2010 | US7751610 Image recognition method and image recognition apparatus |
| 07/06/2010 | US7751067 Substrate-alignment using detector of substrate material |
| 07/06/2010 | US7751066 Projector and three-dimensional input apparatus using the same |
| 07/06/2010 | US7751065 Optical displacement meter, optical displacement measuring method, optical displacement measuring program, computer-readable recording medium, and device that records the program |
| 07/06/2010 | US7751064 Interference objective for annular test surfaces |
| 07/06/2010 | US7751063 Multiple channel interferometric surface contour measurement system |
| 07/06/2010 | US7751061 Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer |
| 07/06/2010 | US7751060 Position measuring method, position measuring system, and exposure apparatus |
| 07/06/2010 | US7751059 Method for correcting disturbances in a level sensor light path |
| 07/06/2010 | US7751058 Optical rotation counter |
| 07/06/2010 | US7751057 Magnetomotive optical coherence tomography |
| 07/06/2010 | US7751047 Alignment and alignment marks |
| 07/06/2010 | US7751046 Methods and systems for determining a critical dimension and overlay of a specimen |
| 07/06/2010 | US7751045 Methods and system for aligning optical packages |
| 07/06/2010 | US7751036 Apparatus of inspecting defect in semiconductor and method of the same |
| 07/06/2010 | US7749666 System and method for measuring and analyzing lithographic parameters and determining optimal process corrections |
| 07/06/2010 | CA2328442C Method and device for determining the filling level in containers |
| 07/01/2010 | WO2010075385A2 Methods and system for confocal light scattering spectroscopic imaging |
| 07/01/2010 | WO2010075218A2 Coupling alignment apparatus and method |
| 07/01/2010 | WO2010074874A1 Method and system for estimating contact patterns |
| 07/01/2010 | WO2010074416A2 Selecting and supplying apparatus for molding tablet |
| 07/01/2010 | WO2010074098A1 Optical tomographic imaging apparatus and imaging method for optical tomographic image |
| 07/01/2010 | WO2010073935A1 Method for measuring thickness of metal film, and method and apparatus for processing substrate |
| 07/01/2010 | WO2010073547A1 Image processing device and pseudo-3d image creation device |
| 07/01/2010 | WO2010073174A1 System and method for image capturing |
| 07/01/2010 | WO2010072912A1 Device for three-dimensional scanning with dense reconstruction |
| 07/01/2010 | WO2010072816A1 Method for 3d measurement of the surface of an object, in particular for dental purposes |