Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2012
05/02/2012EP2447664A1 Device for recording measurement information from an internal surface of a hollow body, in particular a borehole of a single or dual shaft extruder cylinder
05/02/2012EP2446223A1 Information processing apparatus, information processing method, and program
05/02/2012EP2445650A1 Improved film thickness measurement
05/02/2012EP1362218B1 (dental) surface mapping and generation
05/02/2012CN202210064U Full-automatic Rockwell hardness tester
05/02/2012CN202210063U Indentation measurement structure of Rockwell hardness tester
05/02/2012CN202209936U Contact type off-machine tool setting measuring device
05/02/2012CN102439429A Method for determining the recovery grade in artificial fiber carpets
05/02/2012CN102439415A Image-centering method
05/02/2012CN102439395A Shape measuring device, observation device, and image processing method
05/02/2012CN102439394A Method and system for the remote inspection of a structure
05/02/2012CN102435783A Calibration method and calibration device for toy ejection velocity measurement instrument
05/02/2012CN102435612A Calibrating method for control voltage in control on grating phase shifting driven by piezoelectric ceramic
05/02/2012CN102435515A High-precision measurement system for three-dimensional microdeformation of mechanical device in high-low-temperature case
05/02/2012CN102435394A Blade pneumatic imbalance detection method and device of wind generating set
05/02/2012CN102435362A Flexible parallelogram mechanism based force sensor realizing two-stage force resolutions
05/02/2012CN102435177A Online correction method of position and orientation parameters of single transmitting station for indoor measurement positioning system
05/02/2012CN102435174A Method and device for detecting barrier based on hybrid binocular vision
05/02/2012CN102435157A Comprehensive checkout stand for high-speed hydraulic power chuck
05/02/2012CN102435153A Profile degree testing method for polyester filament yarn
05/02/2012CN102435152A Measuring apparatus of micro electronic mechanical system (MEMS) two-dimension (2d) scanning mirror scanning angle
05/02/2012CN102435151A Arc detection method for slab casting machine based on holographic method
05/02/2012CN102435150A Method and device for detecting surface precision of dish parabolic reflecting mirror
05/02/2012CN102435149A Geometric tolerance measurement device for deep holes
05/02/2012CN102435148A Laser feedback effect-based microscopic three-dimensional profile measurement system
05/02/2012CN102435147A Optical fiber borehole strainmeter for measuring state quantity
05/02/2012CN102435146A Optical lens center thickness measuring system and method
05/02/2012CN102435145A Sensor capable of sensing frost thickness, refrigerator having sensor and working method thereof
05/02/2012CN102435144A Stock thickness anomaly detection device
05/02/2012CN102435143A System for automatically detecting vehicle inner and outer dimensions
05/02/2012CN102435142A Active infrared action identifying method
05/02/2012CN102435141A Device and method for measuring sizes of running vehicles
05/02/2012CN102435140A Method for constructing geographic coordinate system with laser tracker
05/02/2012CN102435139A Head tracking system with improved detection of head rotation
05/02/2012CN102435138A Method for determining gap dimensions and/or flushness of bodywork sections of a motor vehicle and control program
05/02/2012CN102435137A Special connecting piece bearing jig for module board automated visual inspection (AVI) equipment
05/02/2012CN102434403A System and method used for checking wind turbine
05/02/2012CN102431576A Fault dynamic detecting and data processing method and system of wheel set
05/02/2012CN102430887A Method for assembling and detecting internal members of ultralong apparatus
05/02/2012CN102032876B Method for detecting using state of multi-span continuous beam of existing railway
05/02/2012CN102012220B Device and method for measuring friction angle or repose angle of granular material
05/02/2012CN101957176B Robot and camera combined calibration based method for detecting high-precision car door
05/02/2012CN101949687B Detection method of automobile door based on vision measurement
05/02/2012CN101915547B Time domain OCT measurement method and time domain OCT system
05/02/2012CN101901502B Global optimal registration method of multi-viewpoint cloud data during optical three-dimensional measurement
05/02/2012CN101776645B Simulation test method of thermal fatigue failure of blade with thermal barrier coating
05/02/2012CN101556144B Laser longitude and latitude multifunctional fast arc-measuring apparatus as well as measuring and calculating method thereof
05/02/2012CN101520501B Probe card inclination adjusting method and inclination detecting method
05/02/2012CN101387627B Method for predicting shelf life of UHT milk
05/02/2012CN101131316B System and device for measuring the thickness an optical disc and corresponding machine-readable medium
05/01/2012US8170649 Arrangement and method for assessing tissue qualities
05/01/2012US8169624 Transmissive dimension measuring device
05/01/2012US8169623 Optical apparatus and method for measuring the attitude of an object in outer space
05/01/2012US8169622 Optical sensor for mounting to a washing machine or dish washer
05/01/2012US8169621 3-dimensional imaging by acoustic warping and defocusing
05/01/2012US8169619 Detector element matrix for an optical position measuring instrument
05/01/2012US8169618 Optical structure measuring apparatus and optical probe thereof
05/01/2012US8169604 Parameter detection system
05/01/2012US8169603 Lens-testing apparatus and lens-testing method having a plurality of combinations of object distances
05/01/2012US8169593 Lithographic apparatus and device manufacturing method
05/01/2012US8168955 Photon event distribution sampling apparatus and method
05/01/2012CA2628129C Method and device for assessing joins of workpieces
05/01/2012CA2558672C Device for measuring the topography of an optical surface
05/01/2012CA2537846C Sheet-surface analyser and method of analysing a sheet-surface
04/2012
04/26/2012WO2012053998A1 A surface roughness measurement method and setup
04/26/2012WO2012053977A1 Apparatus and methods for acquiring an image of a goods package
04/26/2012WO2012053521A1 Optical information processing device, optical information processing method, optical information processing system, and optical information processing program
04/26/2012WO2012052037A1 Method for operating an alignment head system
04/26/2012WO2012052036A1 Alignment head system
04/26/2012WO2012051700A1 Wide angle bistatic scanning optical ranging sensor
04/26/2012WO2012028119A3 Interferometer for measuring the length of gauge blocks
04/26/2012WO2012023256A3 Three-dimensional measurement apparatus, method for three-dimensional measurement, and computer program
04/26/2012WO2012021271A3 High speed acquisition vision system and method for selectively viewing object features
04/26/2012WO2012019603A3 Measuring probe for inserting into a measurement chamber or a measurement channel
04/26/2012WO2012018800A3 Method for acquiring simultaneous and overlapping optical and charged particle beam images
04/26/2012WO2012009437A3 High resolution autofocus inspection system
04/26/2012US20120099120 Exposure condition determining method and surface inspection apparatus
04/26/2012US20120099119 Laser-based coordinate measuring device and laser-based method for measuring coordinates
04/26/2012US20120099118 Optical Position-Measuring Device
04/26/2012US20120099117 Single laser beam measurment system
04/26/2012US20120099116 Thickness variation measuring device, system using same, surface microscope using same, thickness variation measuring method, and surface image acquiring method using same
04/26/2012US20120099114 Optical Interferometric Sensor
04/26/2012US20120099107 Workpiece Alignment Device
04/26/2012US20120099100 Automated warm-up and stability check for laser trackers
04/26/2012US20120099097 System and method for uniform and localized wall thickness measurement using fiber optic sensors
04/26/2012US20120098961 Shape measuring apparatus, robot system, and shape measuring method
04/26/2012US20120097851 Method and Device for Measuring the Thickness of a Fountain Solution Layer or Ink Emulsion Layer in Offset Printing
04/26/2012US20120097837 Position detecting device using reflection type photosensors
04/26/2012US20120097002 Scanning device and method for detecting the contour of an object
04/26/2012DE19945167B4 Verfahren und Vorrichtung zum Detektieren des Ursprungs einer Messung Method and apparatus for detecting the origin of a measurement
04/26/2012DE102011084979A1 Bildmessgerät Image meter
04/26/2012DE102011084707A1 Fotoelektrischer Kodierer und Fotoelektrisches Kodiersystem The photoelectric encoder and photoelectric coding
04/26/2012DE102010049401A1 Vorrichtung zum Erfassen von Messinformationen von einer inneren Oberfläche eines Hohlkörpers, insbesondere einer Bohrung eines ein- oder zweiwelligen Extruderzylinders A device for detecting measurement information from an inner surface of a hollow body, in particular a bore of a single- or twin-screw extruder cylinder
04/26/2012DE102010049310A1 Abtastvorrichtung und Verfahren zum Ermitteln der Kontur eines Objekts Scanning device and method for determining the contour of an object
04/26/2012DE10125008B4 Abtastender Grossbereich-Oberflächenformanalysator Scanningly large range Oberflächenformanalysator
04/26/2012CA2815393A1 Wide angle bistatic scanning optical ranging sensor
04/25/2012EP2444773A1 Method and devices for measuring the load bearing capacity of hard bases
04/25/2012EP2444213A1 Scanning device and method for determining the contours of an object
04/25/2012EP2444210A1 Shape measuring system and shape measuring method
04/25/2012EP2443440A2 Euv high throughput inspection system for defect detection on patterned euv masks, mask blanks, and wafers
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