Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2012
05/30/2012CN101975561B Method for calibrating the geometry of a multi-axis metrology system
05/30/2012CN101963494B Stone slab surface profile size measurement device and measurement method thereof
05/30/2012CN101957177B Steel plate crown measurement method with error compensation
05/30/2012CN101949689B Optical coherence tomography system correction method
05/30/2012CN101929880B Novel Brillouin optical time domain analyzer
05/30/2012CN101929846B Method for scanning wafer surface image
05/30/2012CN101929842B Optical fiber common point target used in station-moving test process of electronic theodolite
05/30/2012CN101922923B Method for detecting perpendicularity and true position of normal axis
05/30/2012CN101871767B System and method for detecting form and position tolerance of components
05/30/2012CN101865664B Portable dynamic deflection displacement measuring device and method
05/30/2012CN101819030B Method and system for monitoring surface roughness of magnetic control spattering target
05/30/2012CN101799281B Parallel detecting system of rollers
05/30/2012CN101793504B Three-dimensional object profile measuring instrument with laser ranging probe
05/30/2012CN101750205B Lens decentration detecting device
05/30/2012CN101723273B Method and device for measuring wire rope of laying winch
05/30/2012CN101713647B Lens shape measuring method and apparatus
05/30/2012CN101685000B Computer system and method for image boundary scan
05/30/2012CN101636632B Optical instrument and method for obtaining distance and image information
05/30/2012CN101545758B Contact displacement meter
05/30/2012CN101539389B Positioning method for keeping measurement attitude of warhead surface trace in uniform standard
05/30/2012CN101520844B Blood vessel authentication apparatus
05/30/2012CN101479566B Method and device for assessing joins of workpieces
05/30/2012CN101432864B Method and system for classifying defect distribution, method and system for specifying causative equipment
05/30/2012CN101388354B Height position detector for work held on chuck table
05/30/2012CN101258448B Exposure apparatus
05/29/2012US8190393 Helicopter blade position detector
05/29/2012US8189876 Sediment assessment
05/29/2012US8189205 Surface inspection tool and surface inspection method
05/29/2012US8189203 Reticle inspection systems and method
05/29/2012US8189202 Interferometer for determining overlay errors
05/29/2012US8189201 Microscopy system, microscopy method, and a method of treating an aneurysm
05/29/2012US8189195 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
05/29/2012US8189194 Direct illumination machine vision technique for processing semiconductor wafers
05/29/2012US8189180 Optical fiber transmission line measurement apparatus and system
05/29/2012US8186069 Multi-beam laser optical alignment method and system
05/24/2012WO2012067940A2 Interferometer with a virtual reference surface
05/24/2012WO2012067771A1 Through-the-lens illuminator for optical comparator
05/24/2012WO2012067648A1 Surface data acquisition, storage, and assessment system
05/24/2012WO2012067508A1 Color coded topographer and method of determining a mathematical model of a corneal surface
05/24/2012WO2012067041A1 Method for inspecting foreign material on substrate and apparatus for inspecting foreign material on substratrate
05/24/2012WO2012066774A1 Image pickup device and distance measuring method
05/24/2012WO2012066501A1 Depth mapping using time-coded illumination
05/24/2012WO2012066301A1 Surface coating for inspection
05/24/2012WO2012066139A1 Apparatus and method for inspecting pcb-mounted integrated circuits
05/24/2012WO2012065267A1 Methods and apparatus for alignment of interferometer
05/24/2012WO2010147252A9 Device for measuring non-uniformity of glass substrate
05/24/2012US20120130598 Object detection system having adjustable focus
05/24/2012US20120127487 Methods and apparatuses for measuring the thickness of glass substrates
05/24/2012US20120127486 Method of inspecting a substrate
05/24/2012US20120127485 Pressure application apparatus and pressure application method
05/24/2012US20120127484 Optical position detecting device and apparatus provided with position detecting function
05/24/2012US20120127483 Thread form measurement device
05/24/2012US20120127481 Method and apparatus for determining a deviation of an actual shape from a desired shape of an optical surface
05/24/2012US20120127480 Topography device for a surface of a substrate
05/24/2012US20120127479 Pattern forming apparatus, mark detecting apparatus, exposure apparatus, pattern forming method, exposure method, and device manufacturing method
05/24/2012US20120127478 Reflector, optical element, interferometer system, stage device, exposure apparatus, and device fabricating method
05/24/2012US20120127477 Interferometer and distance calculation method therefor
05/24/2012US20120127473 Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture
05/24/2012US20120127277 Hand held portable three dimensional scanner
05/24/2012US20120126151 Methods and apparatus for determination of parameters related to a coiled tubing string
05/24/2012US20120126141 Surface coating for inspection
05/24/2012DE112010001378T5 Filmdickenmessgerät und Messverfahren Film thickness measuring device and method
05/24/2012DE102011086467A1 Verfahren zum untersuchen eines substrates A method for examining a substrate
05/24/2012DE102011084255A1 Imaging lens for use in metrology system that is utilized during manufacturing of semiconductor components, has mirrors for reproducing object field, where ratio between dimensions of imaging field and user surface is larger than three
05/24/2012DE102010061841A1 Method for directing metal strip of commission, involves determining and weighing initialization immersion depth for next straightening process according to deviation of strip-shape measuring data and initialization immersion depth
05/24/2012DE102010052678A1 Coordinate measuring and positioning system for acquisition of angular or spherical coordinates on cylindrical or spherical surfaces of e.g. drilling apparatus, has computing unit to determine movement coordinates
05/24/2012DE102010051921A1 Measuring device for coordinate measuring machine, has shaft attached at measuring head without forming recess in measuring head
05/24/2012CA2817104A1 Methods and apparatus for alignment of interferometer
05/23/2012EP2455709A1 Surface coating for inspection
05/23/2012EP2455708A1 A method and a system for automatic measurement and tracking of logs, industrial wood and boards
05/23/2012EP2454560A1 Optical fibre sensor and methods of manufacture
05/23/2012EP2454554A2 Equal-path interferometer
05/23/2012EP2135029B1 Method for measuring the thickness or curvature of thin films
05/23/2012EP1311874B1 Laser ultrasonic testing system and location mechanism therefor
05/23/2012CN202231777U Camera
05/23/2012CN202230056U Monitoring system of control valve
05/23/2012CN202230033U Detecting system for laser holes of ceramic substrate
05/23/2012CN202229750U Angle measuring device of wind power variable propeller system
05/23/2012CN202229741U Ceramic smooth finish laser detecting apparatus
05/23/2012CN202229740U Weft slope detection device
05/23/2012CN202229739U Absolute type angle measurement device
05/23/2012CN202229738U Powder accumulative layer angle measuring device
05/23/2012CN202229737U Portable measuring and analyzing device of grinding wheel three-dimensional feature
05/23/2012CN202229736U System for detecting diameter of cutter steel wire
05/23/2012CN202229735U Automatic size measuring machine of journal of high power locomotive
05/23/2012CN202229734U Online laser measurement device for thickness of thin plate
05/23/2012CN202229733U Thickness measuring device of cable and insulation and jacket materials of optical cable
05/23/2012CN202229732U Direct reading laser height-measuring instrument
05/23/2012CN202229731U Digital inventory system of material field
05/23/2012CN202229730U Nanometer measurement grating sensing system
05/23/2012CN202229729U Full automatic large-stroke gantry type image measuring instrument
05/23/2012CN202229728U Manual image measuring instrument
05/23/2012CN202229727U Three freedom-degree vehicle wheel alignment parameter stereoscopic vision flexible detection system
05/23/2012CN102474542A Methods for adjusting proximity detectors
05/23/2012CN102473062A Optical position detecting device
05/23/2012CN102472618A 束方向传感器 Beam direction sensor
05/23/2012CN102472617A 工件测量装置、防止碰撞装置和机床 Workpiece measurement device to prevent collision device and machine
05/23/2012CN102472613A 测量设备、测量方法和程序 Measuring equipment, measurement methods and procedures
05/23/2012CN102472612A 三维物体识别装置以及三维物体识别方法 Three-dimensional object recognition apparatus and method for a three-dimensional object recognition
05/23/2012CN102472611A 光学式膜厚计以及具有光学式膜厚计的薄膜形成装置 The optical film thickness meter and has an optical thickness meter forming apparatus