Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
07/2009
07/07/2009US7556993 Thin film semiconductor device, polycrystalline semiconductor thin film production process and production apparatus
07/07/2009US7556990 CMOS image sensor having improved signal efficiency and method for manufacturing the same
07/07/2009US7556988 Thin film transistor substrate of horizontal electric field type liquid crystal display device and fabricating method thereof
07/07/2009US7556975 Method for manufacturing backside-illuminated optical sensor
07/07/2009US7556916 Method for burying resist and method for manufacturing semiconductor device
07/07/2009US7555829 Method for adjusting an output parameter of a circuit
07/07/2009CA2449632C Method of fabrication of electronic devices using microfluidic channels
07/07/2009CA2393514C Photodetector and method for detecting radiation
07/07/2009CA2277607C Method and apparatus for iteratively, selectively tuning the impedance of integrated semiconductor devices using a focussed heating source
07/02/2009WO2009081867A1 Semiconductor device and method for manufacturing semiconductor devicedispositif à semi-conducteurrs et procédé de fabrication d'un dispositif à semi-conducteurs
07/02/2009WO2009081763A1 Semiconductor device and method for manufacturing the same
07/02/2009WO2009081595A1 Nonvolatile semiconductor storage device, and method for manufacturing the same
07/02/2009WO2009081559A1 Organic electroluminescent display device
07/02/2009WO2009081497A1 Solid-state imaging element, solid-state imaging device and manufacturing method thereof
07/02/2009WO2009081325A1 Light emitting diode
07/02/2009WO2009081289A1 Semiconductor storage device, operating and manufacturing thereof
07/02/2009WO2009080640A2 Method for providing a series connection in a solar cell system
07/02/2009WO2009079983A1 Led chip with discharge protection
07/02/2009WO2009079798A1 Display system with a solar cell and device having the same
07/02/2009WO2009057924A3 4t-2s step & repeat unit pixel
07/02/2009WO2009048301A3 Resistive random access memory device and method of the same
07/02/2009WO2009030980A3 Photonic via waveguide for pixel arrays
07/02/2009US20090170330 Method of forming a micro pattern of a semiconductor device
07/02/2009US20090170255 Integrated circuit modification using well implants
07/02/2009US20090170228 Method of forming pattern having step difference and method of making thin film transistor and liquid crystal display using the same
07/02/2009US20090170015 Dye-containing negative curable composition, color filter, method of producing the same, and solid-state image sensor
07/02/2009US20090167973 Thin film transistor array panel and method for manufacturing the same, and liquid crystal display
07/02/2009US20090167148 Current-driven light-emitting display apparatus and method of producing the same
07/02/2009US20090166883 Semiconductor integrated circuit having improved power supply wiring
07/02/2009US20090166804 Forming inductor and transformer structures with magnetic materials using damascene processing for integrated circuits
07/02/2009US20090166801 Fuse of semiconductor device and method for manufacturing the same
07/02/2009US20090166800 Interlayer dielectric material in a semiconductor device comprising a doublet structure of stressed materials
07/02/2009US20090166797 High-voltage integrated circuit device including high-voltage resistant diode
07/02/2009US20090166792 Image sensor and method for manufacturing the same
07/02/2009US20090166787 Image sensor and method for manufacturing the same
07/02/2009US20090166784 Semiconductor device and method for fabricating semiconductor device
07/02/2009US20090166783 Solid-state imaging device, method of manufacturing the same, and camera and electronic apparatus using the same
07/02/2009US20090166778 Image sensor and method for manufacturing the same
07/02/2009US20090166775 Method for manufacturing image sensor
07/02/2009US20090166760 Semiconductor Device and Method of Manufacturing the Same
07/02/2009US20090166758 Integrated circuit structure with electrical strap
07/02/2009US20090166757 Stress engineering for sram stability
07/02/2009US20090166753 Semiconductor Device and Method of Manufacturing Such a Device
07/02/2009US20090166752 Semiconductor Devices and Methods of Manufacture Thereof
07/02/2009US20090166749 Semiconductor device and method for manufacturing the same
07/02/2009US20090166748 Semiconductor device and method of manufacturing the same
07/02/2009US20090166746 Semiconductor device
07/02/2009US20090166745 Semiconductor device and photomask
07/02/2009US20090166740 Reduced mask configuration for power mosfets with electrostatic discharge (ESD) circuit protection
07/02/2009US20090166739 Semiconductor Device
07/02/2009US20090166738 Ram cell including a transistor with floating body for information storage having asymmetric drain/source extensions
07/02/2009US20090166735 Semiconductor device and method of manufacturing the same
07/02/2009US20090166723 Semiconductor device with vertical channel transistor and low sheet resistance and method for fabricating the same
07/02/2009US20090166721 Quasi-vertical gated npn-pnp esd protection device
07/02/2009US20090166703 Memory device with a length-controllable channel
07/02/2009US20090166702 Trench-type semiconductor device structure
07/02/2009US20090166701 One transistor/one capacitor dynamic random access memory (1T/1C DRAM) cell
07/02/2009US20090166699 Semiconductor Constructions
07/02/2009US20090166697 Semiconductor Device and Method of Fabricating the Same
07/02/2009US20090166693 Image Sensor and Manufacturing Method Thereof
07/02/2009US20090166692 Cmos image sensor and method for manufacturing the same
07/02/2009US20090166689 Image sensor and method for manufacturing the same
07/02/2009US20090166682 Methods and apparatus for forming memory lines and vias in three dimensional memory arrays using dual damascene process and imprint lithography
07/02/2009US20090166680 Unity beta ratio tri-gate transistor static radom access memory (SRAM)
07/02/2009US20090166679 Integrated circuit and manufacturing process facilitating selective configuration for electromagnetic compatibility
07/02/2009US20090166671 ESD protection circuit
07/02/2009US20090166646 Light-emitting element having pnpn-structure and light-emitting element array
07/02/2009US20090166643 Light emitting and image sensing device and apparatus
07/02/2009US20090166638 Display device and electronic device provided with the same
07/02/2009US20090166637 Display apparatus with storage electrodes having concavo-convex features
07/02/2009US20090166632 Gate driver-on-array structure and display panel
07/02/2009US20090166629 Reducing gate cd bias in cmos processing
07/02/2009US20090166620 Semiconductor chip
07/02/2009US20090166604 Resistance type memory device
07/02/2009US20090166547 Radiation image pickup apparatus and its control method
07/02/2009US20090166516 Photoelectric conversion device manufacturing method, semiconductor device manufacturing method, photoelectric conversion device, and image sensing system
07/02/2009US20090166515 Multi-point correlated sampling for image sensors
07/02/2009US20090166513 Solid-state imaging device
07/02/2009US20090166512 Organic Pixeled Flat Detector Having Increased Sensitivity
07/02/2009DE4444686B4 Halbleiterbauelement mit MOS-Transistor und Verfahren zu seiner Herstellung A semiconductor device comprising MOS transistor and method for its preparation
07/02/2009DE19755676B4 Verfahren zur Herstellung einer Schutzring-Anordnung einer Halbleitereinrichtung und Halbleitereinrichtung mit einer derartigen Schutzring-Anordnung A method for producing a protective ring arrangement of a semiconductor device and semiconductor device having such a protective ring arrangement
07/02/2009DE102008051443A1 Halbleiter-Bauelement Semiconductor component
07/02/2009DE102008046028A1 Bildsensor und Verfahren zu seiner Herstellung Image sensor and method for its preparation
07/02/2009DE102007063231A1 RAM-Zelle mit einem Transistor mit frei einstellbarem Körperpotential zur Informationsspeicherung mit asymmetrischen Drain/Source-Erweiterungsgebieten RAM cell with a transistor with freely adjustable body potential for information storage with asymmetrical drain / source extension regions
07/02/2009DE102007062708A1 Bildaufnehmer, sowie Verfahren und Verwendung Imager, techniques, and use
07/02/2009DE102007062053A1 Vorrichtung zur Detektion von Wärmestrahlung mit einem pyroelektrischen Detektor-Array, Verfahren zum Herstellen und Verwendung der Vorrichtung A device for detection of thermal radiation with a pyroelectric detector array, methods of making and using the apparatus
07/02/2009DE102005001902B4 Verfahren zur Herstellung einer sublithographischen Kontaktstruktur in einer Speicherzelle A process for preparing a sublithographic contact structure in a memory cell
07/02/2009DE10141948B4 Halbleiterspeichervorrichtung und Herstellungsverfahren dafür A semiconductor memory device and manufacturing method thereof
07/02/2009DE10020259B4 Verfahren zur Herstellung floatender Gates in einem Halbleiterbauelement A process for producing floating gates in a semiconductor device
07/02/2009CA2710450A1 Monolithically integrated antenna and receiver circuit for the detection of terahertz waves
07/01/2009EP2075854A2 Photodetection semiconductor device, photodetector, and image display device
07/01/2009EP2075851A2 Solar cell module and method for manufacturing solar cell module
07/01/2009EP2075846A2 Organic electroluminescent display device
07/01/2009EP2075845A1 Device for detecting electromagnetic radiation and ionising radiation with isotropic transfer layer
07/01/2009EP2075844A2 Photodetection semiconductor device, photodetector, and image display device
07/01/2009EP2075843A2 Semiconductor detector for electromagnetic or particle radiation
07/01/2009EP2075842A2 Semiconductor detector for electromagnetic or particle radiation
07/01/2009EP2075841A2 Imager, its manufacturing procedure and its use
07/01/2009EP2075840A2 Protection layer for wafer dicing and corresponding
07/01/2009EP2075839A1 Method for evaluating semiconductor wafer