Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
08/2010
08/03/2010US7767503 Hybrid SOI/bulk semiconductor transistors
08/03/2010US7767502 Method for manufacturing electronic device using thin film transistor with protective cap over flexible substrate
08/03/2010US7767499 Method to form upward pointing p-i-n diodes having large and uniform current
08/03/2010US7767487 Formation of contacts on semiconductor substrates
08/03/2010US7767129 Imprint templates for imprint lithography, and methods of patterning a plurality of substrates
08/03/2010CA2457791C Coatings with low permeation of gases and vapors
07/2010
07/29/2010WO2010085458A1 Electrical contacts for cmos devices and iii-v devices formed on a silicon substrate
07/29/2010WO2010085241A1 Multilayer memristive devices
07/29/2010WO2010085225A1 Controlled placement of dopants in memristor active regions
07/29/2010WO2010085000A1 Imaging element and imaging apparatus using the same
07/29/2010WO2010084774A1 Nonvolatile memory cell, resistance variable nonvolatile memory device and method for designing nonvolatile memory cell
07/29/2010WO2010084725A1 Semiconductor device, method for manufacturing same, and display device
07/29/2010WO2010084534A1 Thin film diode and method for manufacturing same
07/29/2010WO2010084533A1 Power supply wiring structure of semiconductor integrated circuit
07/29/2010WO2010084059A2 Thermoelectric semiconductor component
07/29/2010WO2010048236A3 Non-volatile memory having silicon nitride charge trap layer
07/29/2010WO2010035144A3 Transistor, image sensor with the same and method for manufacturing the same
07/29/2010WO2009152108A8 GeSbTe MATERIAL INCLUDING SUPERFLOW LAYER(S), AND USE OF Ge TO PREVENT INTERACTION OF Te FROM SbXTeY AND GeXTeY RESULTING IN HIGH Te CONTENT AND FILM CRISTALLINITY
07/29/2010US20100190331 System for Depositing a Film Onto a Substrate Using a Low Vapor Pressure Gas Precursor
07/29/2010US20100190306 Method of manufacturing semiconductor device capable of suppressing impurity concentration reduction in doped channel region arising from formation of gate insulating film
07/29/2010US20100190303 Semiconductor device having sufficient process margin and method of forming same
07/29/2010US20100190289 Solid-state imaging device
07/29/2010US20100190287 Semiconductor image sensor and method for fabricating the same
07/29/2010US20100190281 Organic electroluminescent device, method of manufacturing the same, and electronic apparatus
07/29/2010US20100188877 Storage device
07/29/2010US20100188593 Thin-film transistor array substrate, method of manufacturing same and liquid crystal display device
07/29/2010US20100188564 Imaging device holding structure and imaging device
07/29/2010US20100188547 Solid-state image capturing apparatus, driving method thereof and electronic apparatus
07/29/2010US20100188545 Pmos pixel structure with low cross talk for active pixel image sensors
07/29/2010US20100188544 Solid-state imaging device, imaging apparatus, and signal reading method of solid-state imaging device
07/29/2010US20100188543 Solid-state image capturing apparatus, driving method thereof and electronic apparatus
07/29/2010US20100188536 Solid-state imaging element, solid-state imaging device, camera, and drive method
07/29/2010US20100188518 Imaging apparatus and method of driving imaging apparatus
07/29/2010US20100188491 Solid-state imaging device, endoscope apparatus, and drive method of solid-state imaging device
07/29/2010US20100188163 Semiconductor device
07/29/2010US20100188144 Semiconductor integrated circuit, method for driving semiconductor integrated circuit, method for driving electronic apparatus, display device, and electronic apparatus
07/29/2010US20100187988 Transparent contacts for organic devices
07/29/2010US20100187651 Integrated circuit package and method of forming the same
07/29/2010US20100187648 Photoelectic conversion device and manufacturing method
07/29/2010US20100187640 Insulated gate semiconductor device
07/29/2010US20100187639 Semiconductor device and fabrication method
07/29/2010US20100187637 Bipolar device compatible with cmos process technology
07/29/2010US20100187636 Method to increase strain enhancement with spacerless fet and dual liner process
07/29/2010US20100187635 Semiconductor device comprising nmos and pmos transistors with embedded si/ge material for creating tensile and compressive strain
07/29/2010US20100187629 Tensile strain source using silicon/germanium in globally strained silicon
07/29/2010US20100187614 Selective nitridation of gate oxides
07/29/2010US20100187613 Method of Setting a Work Function of a Fully Silicided Semiconductor Device, and Related Device
07/29/2010US20100187612 Semiconductor device and method of manufacturing the same
07/29/2010US20100187611 Contacts in Semiconductor Devices
07/29/2010US20100187609 Boosting transistor performance with non-rectangular channels
07/29/2010US20100187607 Low cost fabrication of double box back gate silicon-on-insulator wafers with built-in shallow trench isolation in back gate layer
07/29/2010US20100187605 Monolithic semiconductor switches and method for manufacturing
07/29/2010US20100187598 Semiconductor device having switching element and method for fabricating semiconductor device having switching element
07/29/2010US20100187591 Non-volatile semiconductor memory device and method of manufacturing the same
07/29/2010US20100187589 Devices and methods for preventing capacitor leakage
07/29/2010US20100187588 Semiconductor memory device including a cylinder type storage node and a method of fabricating the same
07/29/2010US20100187587 Memory cell structure and method for fabrication thereof
07/29/2010US20100187586 Soi device and method for its fabrication
07/29/2010US20100187584 Semiconductor device and method for fabricating the same
07/29/2010US20100187581 Solid-state image sensing device and camera system using the same
07/29/2010US20100187575 Semiconductor Element and a Method for Producing the Same
07/29/2010US20100187574 Memory Cell For Modification of Revision Identifier In An Integrated Circuit Chip
07/29/2010US20100187573 Semiconductor integrated circuit
07/29/2010US20100187534 Semiconductor device and manufacturing method thereof
07/29/2010US20100187533 Thin film transistor array panel for a liquid crystal display
07/29/2010US20100187529 Laser-irradiated thin films having variable thickness
07/29/2010US20100187503 Semiconductor device and manufacturing method thereof
07/29/2010US20100187405 Photoelectric conversion device and manufacturing method thereof
07/29/2010US20100187404 Materials, systems and methods for optoelectronic devices
07/29/2010US20100187403 Solid-state image pickup apparatus, electronic apparatus, and method of manufacturing a solid-state image pickup apparatus
07/29/2010US20100187402 Method of performing hyperspectral imaging with photonic integrated circuits
07/29/2010US20100187401 Solid-state image pick-up device and pixel signal readout method
07/29/2010US20100187317 Semiconductor device
07/29/2010DE102010000033A1 Verfahren zum Herstellen eines Halbleiterbauelements A method of manufacturing a semiconductor device
07/29/2010DE102004063025B4 Speicherbauelement und Verfahren zur Herstellung desselben Memory device and method of manufacturing the same
07/29/2010DE102004050929B4 Ladungsfangende Speicherzelle, ladungsfangendes Speicherbauelement und Herstellungsverfahren Charge Catching memory cell, charge scavenging memory device and manufacturing method
07/29/2010DE102004012629B4 Speicherbauelement mit einem Feldeffekt-Halbleiterschalter und Verfahren zu seiner Herstellung Memory device having a field effect semiconductor switches and method for its preparation
07/28/2010EP2211397A2 Organic Light Emitting Diode Display
07/28/2010EP2211386A2 Light source apparatus and head-up display apparatus incorporating the light source apparatus
07/28/2010EP2210407A1 Dual sensitivity image sensor
07/28/2010EP2210293A1 Patterning method for light-emitting devices
07/28/2010EP2210292A2 Lateral organic optoelectronic devices and applications thereof
07/28/2010EP2210276A2 Method for producing an electrode made with molybdenum oxide
07/28/2010EP2210272A1 Tunable voltage isolation ground to ground esd clamp
07/28/2010EP2210132A1 Array of microlenses with integrated illumination
07/28/2010CN201536104U 一种静电保护电路 An electrostatic protection circuit
07/28/2010CN201534457U 一种智能玻璃 An intelligent glass
07/28/2010CN1905202B Stacked pixel for high resolution CMOS image sensor
07/28/2010CN1881601B Image sensor and pixel having an optimized floating diffusion
07/28/2010CN1832220B Method of manufacturing thin film transistor, thin film transistor manufactured by the method, and display device employing the same
07/28/2010CN1791990B A field effect transistor arrangement and method of manufacturing a field effect transistor arrangement
07/28/2010CN1714462B Organic memory device and method for forming memory element
07/28/2010CN1652331B Device for electrostatic discharge protection and circuit thereof
07/28/2010CN1531077B Inlaid method for preparing thin-membrane transistor conducting wire structure
07/28/2010CN101790789A Electrostatic-discharge protection using a micro-electromechanical-system switch
07/28/2010CN101789494A Organic electroluminescence device and display unit
07/28/2010CN101789445A Semiconductor device
07/28/2010CN101789443A Pixel structure and manufacturing method thereof and manufacturing method of electronic device
07/28/2010CN101789442A Light-emitting device and method for driving the same, and electronic device
07/28/2010CN101789441A Display apparatus, and method of manufacturing same