Patents
Patents for H01L 27 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate (229,248)
02/2003
02/04/2003US6515269 Integrally connected image sensor packages having a window support in contact with a window and the active area
02/04/2003US6515268 Photoelectric converter having a light receiving portion with an improved readout gate
02/04/2003US6514854 Method of producing semiconductor integrated circuit device having a plug
02/04/2003US6514839 ESD implantation method in deep-submicron CMOS technology for high-voltage-tolerant applications with light-doping concentrations
02/04/2003US6514834 Method of manufacturing a semiconductor device having a low leakage current
02/04/2003US6514831 Nitride read only memory cell
02/04/2003US6514827 Method for fabricating a dual metal gate for a semiconductor device
02/04/2003US6514823 Method of making loadless four-transistor memory cell with different gate insulation thicknesses for N-channel drive transistors and P-channel access transistors
02/04/2003US6514821 Method for planarizing dielectric layer of flash memory
02/04/2003US6514819 High capacity stacked DRAM device and process for making a smaller geometry
02/04/2003US6514818 Nonvolatile ferroelectric memory without a separate cell plate line and method of manufacturing the same
02/04/2003US6514817 Method of forming shallow trench
02/04/2003US6514813 Method of fabricating a semiconductor device
02/04/2003US6514812 Structure and manufacturing method of semiconductor device having uneven surface at memory cell capacitor part
02/04/2003US6514811 Method for memory masking for periphery salicidation of active regions
02/04/2003US6514807 Method for fabricating semiconductor device applied system on chip
02/04/2003US6514805 Trench sidewall profile for device isolation
02/04/2003US6514802 Method of providing a frontside contact to a substrate of SOI device
02/04/2003US6514799 Method for substrate noise distribution
02/04/2003US6514789 Component and method for manufacture
02/04/2003US6514785 CMOS image sensor n-type pin-diode structure
02/04/2003US6514782 Method of making a III-nitride light-emitting device with increased light generating capability
02/04/2003US6514780 Method for manufacturing an integrated circuit having a particular functionality required by a user of the circuit and having first structures to produce the particular functionality and second structures
02/04/2003US6514779 Large area silicon carbide devices and manufacturing methods therefor
02/04/2003US6514649 Forming electroluminescent device with sharp edges and without color or positional displacement
02/04/2003CA2240701C Apparatus and method of separating sample and substrate fabrication method
01/2003
01/30/2003WO2003009421A1 Apparatus for effecting transfer of electromagnetic energy
01/30/2003WO2003009398A2 Structure and method for fabricating an optical bus
01/30/2003WO2003009391A1 Trench-gate semiconductor device and its manufacturing method
01/30/2003WO2003009387A1 Semiconductor structure for edge mounting applications
01/30/2003WO2003009386A1 Method for producing bonding wafer
01/30/2003WO2003009385A1 Semiconductor device, semiconductor storage device and production methods therefor
01/30/2003WO2003009384A1 Semiconductor storage
01/30/2003WO2003009383A1 Capacitor arrangement and method for producing such a capacitor arrangement
01/30/2003WO2003009382A2 Semiconductor structures with integrated control components
01/30/2003WO2003009377A2 Semiconductor structures with coplaner surfaces
01/30/2003WO2003009376A2 Semiconductor structures and devices
01/30/2003WO2003009375A2 Semiconductor back side processing
01/30/2003WO2003009374A1 Production method of semiconductor device
01/30/2003WO2003009369A2 Sol solution for producing glass coatings for electrically conductive materials that can be used in anodic bonding
01/30/2003WO2003009356A1 Fabrication of buried devices within a semiconductor structure
01/30/2003WO2003009355A1 Rf, optical, photonic, analog, and digital functions in a semiconductor structure
01/30/2003WO2003009354A1 Semiconductor structure including a monocrystalline compound semiconductor layer
01/30/2003WO2003009337A2 Ferroelectric circuit element that can be fabricated at low temperatures and method for making same
01/30/2003WO2003009336A2 Small area cascode fet structure operating at mm-wave frequencies
01/30/2003WO2003009302A1 Semiconductor memory device
01/30/2003WO2003009057A1 Thin film transistors suitable for use in flat panel displays
01/30/2003WO2003008999A2 Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
01/30/2003WO2003008663A1 Formation of titanium nitride films using a cyclical deposition process
01/30/2003WO2002080275A3 Memory cell arrays and method for the production thereof
01/30/2003WO2002052625A3 Process of forming p-n layer
01/30/2003WO2002045233B1 Energy pathway arrangement
01/30/2003WO2002045178A3 Protective cover and attachment method for moisture sensitive devices
01/30/2003WO2001097295A3 Micro-size led and detector arrays for minidisplay hyper-bright light emitting diodes, lighting, and uv detector and imaging sensor applications
01/30/2003WO2001086699A3 Low temperature grown optical detector
01/30/2003WO2001028001A9 Optical interconnect using multifunctional optical elements
01/30/2003US20030023946 Standard cell library generation using merged power method
01/30/2003US20030023945 Metal interconnection read only memory cell
01/30/2003US20030023937 Method and apparatus for design of integrated circuits
01/30/2003US20030023936 Method and apparatus for integrated circuit design with a software tool
01/30/2003US20030023935 Method and apparatus for integrated circuit design with library cells
01/30/2003US20030023913 Testing device of semiconductor integrated circuit and test method therefor
01/30/2003US20030023912 Integrated testing of serializer/deserializer in FPGA
01/30/2003US20030023897 Fault-tolerant solid state memory
01/30/2003US20030023805 Memory module and system, an information processing apparatus and a mehtod of use
01/30/2003US20030022646 Integrated switchless programmable attenuator and low noise amplifier
01/30/2003US20030022528 Improved Process for Deposition of Semiconductor Films
01/30/2003US20030022526 Process for fabricating a dielectric film using plasma oxidation
01/30/2003US20030022525 Semiconductor structure and device including a monocrystalline layer formed overlying a compliant substrate and a method of forming the same
01/30/2003US20030022521 Method for fabricating semiconductor device having ruthenium layer and equipment for fabricating the same
01/30/2003US20030022520 Light-assisted deposition method for fabricating a compliant substrate for epitaxial growth of monocrystalline materials
01/30/2003US20030022514 Method of forming contacts for a bit line and a storage node in a semiconductor device
01/30/2003US20030022500 Alternative related to SAS in flash EEPROM
01/30/2003US20030022488 Method for forming a gate electrode in a semiconductor device
01/30/2003US20030022484 Method of forming inter-dielectric layer in semiconductor device
01/30/2003US20030022478 Semiconductor device using bumps, method for fabricating same, and method for forming bumps
01/30/2003US20030022476 Data bus architecture for integrated circuit devices having embedded dynamic random access memory (DRAM) with a large aspect ratio providing reduced capacitance and power requirements
01/30/2003US20030022474 Manufacture of semiconductor devices with schottky barriers
01/30/2003US20030022466 Structure and method for fabricating semiconductor structure and linearized monolithic power amplifier utilizing the formation of a compliant substrate for materials used to form the same
01/30/2003US20030022460 Semiconductor device fabricating method
01/30/2003US20030022456 Interferometer gating of an optical clock for an integrated circuit
01/30/2003US20030022454 Capacitor and method of manufacturing the same
01/30/2003US20030022452 High-voltage transistor and fabrication process
01/30/2003US20030022447 Methods of fabricating electrically eraseable programmable read-only memory (EEPROM) devices including multilayer sense and select transistor gates
01/30/2003US20030022446 Nonvolatile semiconductor memory device and manufacturing method thereof
01/30/2003US20030022445 Semiconductor integrated circuit device and a method of manufacturing the same
01/30/2003US20030022444 Semiconductor device having thin electrode laye adjacent gate insulator and method of manufacture
01/30/2003US20030022443 Double-bit non-volatile memory structure and corresponding method of manufacture
01/30/2003US20030022442 Method of planarizing non-volatile memory device
01/30/2003US20030022441 Twin MONOS array metal bit organization and single cell operation
01/30/2003US20030022440 Low defect density process for deep sub-0.18mum flash memory technologies
01/30/2003US20030022439 Method of fabricating flash memory device using self-aligned non-exposure pattern formation process
01/30/2003US20030022438 Dynamic threshold-voltage field effect transistors and methods
01/30/2003US20030022437 Method of forming integrated circuitry, method of forming a capacitor, method of forming DRAM integrated circuitry, integrated circuitry and DRAM integrated circuitry
01/30/2003US20030022434 Semiconductor integrated circuit device and a method of manufacturing the same
01/30/2003US20030022433 Method for production of semiconductor device
01/30/2003US20030022430 Structure and method for fabricating configurable transistor devices utilizing the formation of a compliant substrate for materials used to form the same
01/30/2003US20030022429 Electrode structure and method of fabricating the same
01/30/2003US20030022428 Electromechanical memory having cell selection circuitry constructed with nanotube technology
01/30/2003US20030022426 Manufacturing method of semiconductor device