Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2014
12/09/2014US8904616 Method of monitoring a crimping process, crimping press and computer program product
12/04/2014US20140359388 Core circuit test architecture
12/04/2014US20140359387 Tap and linking module for scan access of multiple cores with ieee 1149.1 test access ports
12/04/2014US20140359386 Scan or jtag controllable capture clock generation
12/04/2014US20140359385 Circuit and layout techniques for flop tray area and power otimization
12/04/2014US20140359384 Communication device, test system and test method thereof
12/04/2014US20140358462 Apparatuses and methods for testing electrochemical cells by measuring frequency response
12/04/2014US20140358460 Electric vehicle and method for controlling same
12/04/2014US20140358459 Model-based battery monitoring
12/04/2014US20140358455 Systems and methods for overheat detection system event location
12/04/2014US20140358346 Optimized Power Supply Architecture
12/04/2014US20140356671 Integration of a voltage sense trace fuse into a battery interconnect board
12/04/2014US20140355160 Method, Device and Circuitry for Detecting a Failure on a Differential Bus
12/04/2014US20140354325 Semiconductor layout structure and testing method thereof
12/04/2014US20140354324 Method and apparatus for testing a semiconductor package having a package on package (pop) design
12/04/2014US20140354323 I-v characteristic measuring apparatus and i-v characteristic measuring method for solar cell, and recording medium recorded with program for i-v characteristic measuring apparatus
12/04/2014US20140354322 Probe card partition scheme
12/04/2014US20140354321 Automated test management system for electronic control module
12/04/2014US20140354319 High current kelvin connection and verification method
12/04/2014US20140354317 Circuit board inspection apparatus, circuit board inspection method and circuit board inspection tool
12/04/2014US20140354316 Circuit board inspection method, circuit board inspection apparatus and circuit board inspection tool
12/04/2014US20140354314 Thermal interface techniques and configurations
12/04/2014US20140354313 Method for Temporary Electrical Contacting of a Component Arrangement and Apparatus Therefor
12/04/2014US20140354312 Test handler, test carrier and test method thereof
12/04/2014US20140354311 Integrated circuit chip and multi-chip system including the same
12/04/2014US20140354310 Capacitive Sensor Testing
12/04/2014US20140354298 Apparatus and method for detecting partial discharge at turn-to-turn insulation in motor
12/04/2014US20140354297 Inverter system and method of detecting state of power cable of the inverter system
12/04/2014US20140354296 Signal test device
12/04/2014US20140354295 Loose plug detection
12/04/2014US20140354294 Solid state impedance tuners
12/04/2014US20140354293 Fault detection system
12/04/2014US20140354292 Method and apparatus for monitoring a multi-phase electrical system on a vehicle
12/04/2014US20140354291 Battery monitoring system, host controller, and battery monitoring device
12/04/2014US20140354290 Measurement device for testing a fuel cell stack
12/04/2014US20140354287 Apparatus for testing an electromechanical relay
12/04/2014US20140354285 Organic light emitting display panel
12/04/2014US20140354264 High speed clock cycle rate digital voltage monitor with triggered tracing for integrated circuits
12/04/2014US20140354233 Devices for testing a battery and methods for testing a battery
12/04/2014US20140354213 Intelligent independent battery management system and method
12/02/2014US8904256 Method and apparatus for low-pin count testing of integrated circuits
12/02/2014US8904255 Integrated circuit having clock gating circuitry responsive to scan shift control signal
12/02/2014US8904254 Combo dynamic flop with scan
12/02/2014US8904253 Method and apparatus for testing I/O boundary scan chain for SoC's having I/O's powered off by default
12/02/2014US8904252 Scan test circuit with scan clock
12/02/2014US8904251 Semiconductor device and test system for testing the same
12/02/2014US8904248 Noise rejection for built-in self-test with loopback
12/02/2014US8904247 Test pattern generation apparatus, test program generation apparatus, generation method, program, and test apparatus
12/02/2014US8904233 Electronic apparatus
12/02/2014US8904210 Visual indicator and adjustment of media and gaming attributes based on battery statistics
12/02/2014US8903674 Automated emergency power supply system (EPSS) test reporting criticality of EPSS test failure
12/02/2014US8903672 Methods for calibration of radio-frequency path loss in radio-frequency test equipment
12/02/2014US8903667 State-of-charge estimation method, state-of-charge estimation device, and secondary-battery power system
12/02/2014US8903665 Method and device for protecting an elecronic payment terminal
12/02/2014US8903664 System and method for use in monitoring synchronous machines
12/02/2014US8903597 Multipurpose in-vehicle diagnostic II adapter
12/02/2014US8902792 Forming a convex polygon of mobile sensors
12/02/2014US8902785 Method, apparatus and system for finding and selecting partners
12/02/2014US8902782 Method of determining video quality
12/02/2014US8902771 Methods and apparatus for use in peer to peer communications devices and/or systems relating to rate scheduling, traffic scheduling, rate control, and/or power control
12/02/2014US8902765 Method and apparatus for congestion and fault management with time-to-live
12/02/2014US8902763 Method and apparatus for high speed downlink packet access link adaptation
12/02/2014US8902753 Method, system and computer readable medium for affecting bit rate
12/02/2014US8902734 System and method for providing communication connection resilience
12/02/2014US8902730 Redundant pseudowires for border gateway patrol-based virtual private local area network service multi-homing environments
12/02/2014US8902072 Apparatus and method for diagnosing abnormality in cell balancing circuit
12/02/2014US8901952 Circuit testing device and method for implementing same
12/02/2014US8901951 High density test structure array to support addressable high accuracy 4-terminal measurements
12/02/2014US8901950 Probe head for a microelectronic contactor assembly, and methods of making same
12/02/2014US8901949 Probe card for testing a semiconductor chip
12/02/2014US8901947 Probe out-of-position sensing for automated test equipment
12/02/2014US8901946 Identifying a signal on a printed circuit board under test
12/02/2014US8901945 Test board for use with devices having wirelessly enabled functional blocks and method of using same
12/02/2014US8901941 Instrument and method for detecting partial electrical discharges
12/02/2014US8901936 Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device
12/02/2014US8901934 Diagnosis of HEV/EV battery disconnect system
12/02/2014US8901920 Connector, probe, and method of manufacturing probe
12/02/2014US8901918 Load connection state detection circuit
12/02/2014US8901917 Element measurement circuit and method thereof
12/02/2014US8901915 Voltage or contact closure sensor
12/02/2014US8901892 Methods and systems for thermodynamic evaluation of battery state of health
12/02/2014US8901891 Voltage polarity determination circuit and charge amount measurement circuit
12/02/2014US8901660 Semiconductor structure and fault location detecting system
12/02/2014US8900888 Optoelectronic semiconductor chip and method for producing an optoelectronic semiconductor chip
12/02/2014US8900469 Etch rate detection for anti-reflective coating layer and absorber layer etching
12/01/2014DE202012101652U1 Prüfvorrichtung Tester
11/2014
11/27/2014US20140351665 Interface to full and reduced pin jtag devices
11/27/2014US20140351664 Testing an integrated circuit
11/27/2014US20140350878 Voltage measuring device
11/27/2014US20140350877 Battery parameters, state of charge (soc), and state of health (soh) co-estimation
11/27/2014US20140350876 Method and Devices for Making Available Information for the Purpose of Performing Maintenance and Servicing of a Battery
11/27/2014US20140350875 Relaxation model in real-time estimation of state-of-charge in lithium polymer batteries
11/27/2014US20140350781 Diagnostic device for a multi-voltage vehicle electrical system, a multi-voltage vehicle electrical system, and a method for operating a multi-voltage vehicle electrical system
11/27/2014US20140350773 Current measuring device and method
11/27/2014US20140349156 Method and Apparatuses for Providing Information for Maintenance and Service Purposes for a Battery Unit
11/27/2014US20140349155 Method and Devices for Making Available Information for the Purpose of Performing Maintenance and Servicing of a Battery Unit
11/27/2014US20140348021 System and Method for Routing Internet Traffic over Internet Links
11/27/2014US20140347770 Protection of photovoltaic modules of a photovoltaic generator against surge voltages relative to ground
11/27/2014US20140347768 Self-testing auto monitor ground fault circuit interrupter (gfci) with power denial
11/27/2014US20140347103 Fault-tolerant power semiconductor switching device control system
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