Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2012
05/22/2012US8184540 Packet lifetime-based memory allocation
05/22/2012US8184536 Apparatus and method for error concealment for a digital wireless phone
05/22/2012US8184533 Systems and method for quality of service control over multiple accesses
05/22/2012US8184531 Method of managing an interface comprising means for controlling remote terminals
05/22/2012US8184528 Network backhaul systems and methods
05/22/2012US8184526 Systems and methods for Connectivity Fault Management extensions for automated activation of services through association of service related attributes
05/22/2012US8184525 Method and apparatus for detecting and fixing faults in an inline-power capable ethernet system
05/22/2012US8183879 Measuring arrangement, semiconductor arrangement and method for operating a semiconductor component as a reference source
05/22/2012US8183878 Electrical testing device and electrical testing method with control of probe contact pressure
05/22/2012US8183877 Material for probe pins
05/22/2012US8183872 Hose with fault detection capability
05/22/2012US8183871 Method and device for fault location in a two-terminal transmission or distribution power line
05/22/2012US8183869 Circuit interrupter with continuous self-testing feature
05/22/2012CA2708602C Method and apparatus for device-dependent calibration of relays for high accuracy operation at zero-crossing of input power signal
05/21/2012DE202012004533U1 Abdeckhaube für einen Prüfadapter Cover for a test fixture
05/18/2012WO2012065064A1 Feedback scan isolation and scan bypass architecture
05/18/2012WO2012064403A1 Achieving greater test efficiencies using acknowledgement signal suppression
05/18/2012WO2012064116A2 Test tray for testing light-emitting diodes
05/18/2012WO2012063902A1 Device for inspecting electric field variation resistance of electronic devices and method for detecting electric field variation resistance of electronic devices
05/18/2012WO2012063858A1 Probe unit
05/18/2012WO2012063606A1 Diagnosis apparatus for vehicle battery
05/18/2012WO2012062863A1 Methods and systems for production testing of dco capacitors
05/18/2012WO2012062814A1 Method for verifying electrical connection between generator and inverter using handheld device
05/18/2012WO2012062510A1 Method for qualifying a data cable for etcs signalling data
05/18/2012WO2012062309A2 Decentralized generation plant, in particular wind turbine, test circuit, and test method
05/18/2012WO2012062142A1 Method and apparatus for collecting voltage differential parameters of individual battery cells in battery pack
05/18/2012WO2012062061A1 Method and device for detecting voltage of terminal battery
05/18/2012WO2012062037A1 Traveling wave fault location method of transmission line based on electronic transformer
05/18/2012WO2012062024A1 Device and method for measuring quenching propagation speed of superconducting coil
05/18/2012WO2012061979A1 Cable fatigue monitor and method thereof
05/18/2012WO2012061970A1 Batteries testing and sorting system and the method thereof
05/18/2012WO2012033802A3 Electrically conductive pins for microcircuit tester
05/18/2012WO2012005513A3 Home appliance diagnosis system and diagnosis method for same
05/18/2012WO2012005512A3 Apparatus for diagnosing home appliances
05/18/2012WO2011020650A3 Circuit assembly for a motor vehicle
05/17/2012US20120124440 Lbist diagnostic scheme
05/17/2012US20120124439 Wrapper Cell for Hierarchical System on Chip Testing
05/17/2012US20120124438 Serial i/o using jtag tck and tms signals
05/17/2012US20120124437 Integrated circuit having a scan chain and testing method for a chip
05/17/2012US20120124435 Avoiding bist and mbist intrusion logic in critical timing paths
05/17/2012US20120124434 Configurable mux-d scan flip-flop design
05/17/2012US20120124433 Feedback Scan Isolation and Scan Bypass Architecture
05/17/2012US20120123727 Self-service circuit testing systems and methods
05/17/2012US20120123726 Test apparatus, test method, and storage medium
05/17/2012US20120123724 Detecting an Unstable Input to an IC
05/17/2012US20120123712 Determining remaining life fraction for battery networks in-situ
05/17/2012US20120123708 Method and system for transient and intermittent earth fault detection and direction determination in a three-phase median voltage electric power distribution system
05/17/2012US20120121952 Battery status detecting device and battery pack where the battery status detecting device is provided
05/17/2012US20120120983 Method and apparatus for monitoring the maximum available capacity of a battery
05/17/2012US20120120530 Ground fault detecting and controlling method for parallel-structured high voltage system
05/17/2012US20120119918 Methods and apparatus for operating an electronic trip device
05/17/2012US20120119807 Phase interpolator, semiconductor device and testing method thereof
05/17/2012US20120119779 Signal sensing device and circuit boards
05/17/2012US20120119778 Post silicide testing for replacement high-k metal gate technologies
05/17/2012US20120119777 Dynamic Voltage and Frequency Management
05/17/2012US20120119776 Test circuit and test method for detecting electrical defect in tft-lcd
05/17/2012US20120119775 Circuitry for hot-swappable circuit boards
05/17/2012US20120119774 Electrical testing apparatus for testing an electrical test sample and electrical testing method
05/17/2012US20120119773 Testing Auxiliary Apparatus
05/17/2012US20120119772 Inspecting jig
05/17/2012US20120119771 Method and apparatus for indexing an adjustable test probe tip
05/17/2012US20120119770 Automated multi-point probe manipulation
05/17/2012US20120119769 Apparatus for thermal testing of a printed circuit board
05/17/2012US20120119768 Method and System of Improved Reliability Testing
05/17/2012US20120119767 Power cycling test arrangement
05/17/2012US20120119766 Probe apparatus and method for correcting contact position
05/17/2012US20120119765 Battery simulation system having fault simulation
05/17/2012US20120119764 Test mode control circuit of semiconductor apparatus and control method thereof
05/17/2012US20120119761 Method of electrically characterizing a composite material for manufacturing an aircraft
05/17/2012US20120119755 Insulation resistance measurement device and insulation resistance measurement method
05/17/2012US20120119754 Method and device for insulation monitoring of non-grounded electrical dc and ac grids
05/17/2012US20120119753 System and Method of Detecting and Locating Intermittent Electrical Faults In Electrical Systems
05/17/2012US20120119752 Test apparatus and circuit module
05/17/2012US20120119751 Multi-pole arcing fault circuit breaker including a neutral current sensor
05/17/2012US20120119749 Charge state detection circuit, battery power supply device, and battery information monitoring device
05/17/2012US20120119748 Battery voltage measurement system and battery voltage measurement method
05/17/2012US20120119746 Systems and methods for intelligent, adaptive management of energy storage packs
05/16/2012EP2453248A1 Method and arrangement for determining inductances of synchronous reluctance machine
05/16/2012EP2453247A1 Partial discharge coupler for application on high voltage generator bus works
05/16/2012EP2453246A1 Leak current detector and method
05/16/2012EP2453213A1 Measureing device and measuring method for continuous physical quantity
05/16/2012EP2452392A1 Device for safely testing batteries
05/16/2012EP2452389A1 Method and arrangement for improved controllability of fuel cell stacks
05/16/2012EP2452201A2 Secondary battery temperature-estimating apparatus and method
05/16/2012EP2313790B1 Protection circuit
05/16/2012EP2286256B1 Dll for period jitter measurement
05/16/2012EP2107589B1 Switching device for grounding an inverter
05/16/2012DE102010063392A1 Mikroskop mit Sensorbildschirm Microscope with touch screen
05/16/2012DE102010060506A1 Verfahren und Einrichtung zur Überwachung einer Schalteinrichtung Method and apparatus for monitoring a switching device
05/16/2012DE102010051588A1 Method for examining electrical isolation of high voltage system of vehicle or fast charging system, involves preparing high voltage system with isolation in vehicle
05/16/2012DE102010043744A1 Circuit arrangement for monitoring switching of energy source for power supply of electric drive in hybrid or electric cars, has monitoring unit including measuring unit, and control device monitoring control of protecting unit
05/16/2012DE102008052467B4 Zwei Leiterplatten und ein Verfahren zum Detektieren einer Temperaturänderung einer Leiterplatte Two circuit boards and a method for detecting a temperature change of a printed circuit board
05/16/2012CN202222063U Integrated type LED intelligent lighting control device with electric power measurement and communication function
05/16/2012CN202221471U Ripple detection circuit used for power supply of earthquake data processing work station
05/16/2012CN202221470U Natural light irradiation I-V characteristic test system used for solar cell
05/16/2012CN202221469U Control system for calibration console of gas relay
05/16/2012CN202221468U Gas density relay calibrator
05/16/2012CN202221467U Motor sensor circuit board detection device
05/16/2012CN202221466U Electrical performance testing device of a crystal silicon solar battery double-sided assembly
05/16/2012CN202221465U Power capacitor tolerance blasting energy testing apparatus
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