Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
07/04/2012 | CN101359033B Signal loss detector for high-speed serial interface of a programmable logic device |
07/04/2012 | CN101334448B Test platform and method for testing PC board |
07/04/2012 | CN101295873B Medium-voltage power distribution network single-phase ground fault route selection method based on fault procedure analysis |
07/04/2012 | CN101266548B Device and method for in-system programming for programmable logic device |
07/04/2012 | CN101122616B Contactor assembly |
07/04/2012 | CN101101320B Multifunction sensor system for electrical machines |
07/04/2012 | CN101051525B Semiconductor storage device |
07/04/2012 | CA2762796A1 Remote monitoring and control of led based street lights |
07/03/2012 | US8214847 Distributed messaging system with configurable assurances |
07/03/2012 | US8214774 Method for implementing functional changes into a design layout of an integrated device, in particular a system-on-chip, by means of mask programmable filling cells |
07/03/2012 | US8214716 Method for processing noise interference in data accessing device with serial advanced technology attachment interface |
07/03/2012 | US8214705 IC with first and second external register present leads |
07/03/2012 | US8214704 Scan testing system and method |
07/03/2012 | US8214703 Testing multi-core processors |
07/03/2012 | US8214702 Distributed joint test access group test bus controller architecture |
07/03/2012 | US8214701 Hardware and software debugging |
07/03/2012 | US8214172 Systems and methods for locating defective components of a circuit |
07/03/2012 | US8214171 Semiconductor memory device including test mode circuit |
07/03/2012 | US8214170 Test pattern compression |
07/03/2012 | US8214169 Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits |
07/03/2012 | US8214164 Abnormal battery depletion detection in an implantable device |
07/03/2012 | US8213584 Method and apparatus for analyzing proposed service features in a communication network |
07/03/2012 | US8213454 Self-adapting mechanism for managing data streams in a multiple access shared network |
07/03/2012 | US8213453 Quality of service (QoS) configuration for network devices with multiple queues |
07/03/2012 | US8213334 Optimizing a physical data communications topology between a plurality of computing nodes |
07/03/2012 | US8213331 Managing data transfer in a network environment |
07/03/2012 | US8213329 Base station apparatus and communication control method |
07/03/2012 | US8213322 Dynamically distributed weighted fair queuing |
07/03/2012 | US8213321 Controller area network condition monitoring and bus health on in-vehicle communications networks |
07/03/2012 | US8213320 Method and switching device for stack port configuration |
07/03/2012 | US8213318 System for remote supervision and diagnosis using mobile program |
07/03/2012 | US8213316 Method and apparatus for improving voice recording using an extended buffer |
07/03/2012 | US8213314 Virtual space-time code for relay networks |
07/03/2012 | US8213310 High-priority communications session within a wireless communications system |
07/03/2012 | US8213309 Systems and methods for reducing latency and reservation request overhead in a communications network |
07/03/2012 | US8213307 Resource allocation in wireless communication network |
07/03/2012 | US8213299 Methods and systems for locating redundant telephony call processing hosts in geographically separate locations |
07/03/2012 | US8213298 Best path selecting device, best path selecting method, and program |
07/03/2012 | US8213294 Mechanism for detecting and clearing I/O fabric lockup conditions for error recovery |
07/03/2012 | US8212752 Display device and a method for testing the same |
07/03/2012 | US8212583 Method and system for testing yawing system for wind turbine |
07/03/2012 | US8212582 Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel |
07/03/2012 | US8212581 Defective emitter detection for electroluminescent display |
07/03/2012 | US8212579 Fixing apparatus for a probe card |
07/03/2012 | US8212578 Test head positioner system |
07/03/2012 | US8212577 Needle trace transfer member and probe apparatus |
07/03/2012 | US8212576 Method and apparatus for self-regulated burn-in of an integrated circuit |
07/03/2012 | US8212571 Vehicle power supply device |
07/03/2012 | US8212570 Amplifier circuit for a current transformer |
07/03/2012 | US8212569 Coupled bi-stable circuit for ultra-sensitive electric field sensing utilizing differential transistor pairs |
07/03/2012 | US8211720 Method for detecting stress migration properties |
06/30/2012 | CA2750356A1 Apparatus and method for evaluating health of tab changer |
06/28/2012 | WO2012087808A1 Method and system for diagnosing a fault or open circuit in a network |
06/28/2012 | WO2012087594A1 Method and system for interference detection and mitigation |
06/28/2012 | WO2012086653A1 Testing system and package retainer |
06/28/2012 | WO2012086627A1 Full-charge detection device, and full-charge detection method |
06/28/2012 | WO2012086325A1 Process for manufacture of thin film solar cell, and thin film solar cell |
06/28/2012 | WO2012085562A1 Battery condition monitoring |
06/28/2012 | WO2012084535A1 Monitoring and fault diagnosis of an electric machine |
06/28/2012 | WO2012084102A1 Test of a testing device for determining a voltage state of a high-voltage vehicle electrical system |
06/28/2012 | WO2012084038A1 Method and apparatus for identifying partial discharges in a dc voltage intermediate circuit |
06/28/2012 | WO2012084028A1 Calibration module for a tester and tester |
06/28/2012 | WO2012083955A1 Single-position hall effect measurements |
06/28/2012 | WO2012083802A1 Detection device and method for detecting external connection of radio frequency interface |
06/28/2012 | WO2012083610A1 Estimating method for state-of-charge of lithium ion battery |
06/28/2012 | WO2012083420A1 Universal mate-in cable interface system |
06/28/2012 | WO2012060616A3 Input device test apparatus |
06/28/2012 | WO2012060597A3 Device and method for announcing the replacement time of a battery |
06/28/2012 | WO2012048069A3 System and method for verifying a reference voltage for battery cell monitoring |
06/28/2012 | US20120166903 Multiple-capture dft system to reduce peak capture power during self-test or scan test |
06/28/2012 | US20120166901 Integrated circuit for testing smart card and driving method of the circuit |
06/28/2012 | US20120166900 Testing circuits |
06/28/2012 | US20120166898 Single level of metal test structure for differential timing and variability measurements of integrated circuits |
06/28/2012 | US20120166847 Batteries for electric tools |
06/28/2012 | US20120166131 Integrated device test circuits and methods |
06/28/2012 | US20120166116 Apparatus for calculating residual capacity of secondary battery |
06/28/2012 | US20120166103 Fault Interrupting and Reclosing Device |
06/28/2012 | US20120161810 Method and device for detecting the failure of an excitation circuit of a polyphase alternator |
06/28/2012 | US20120161809 Power supply testing device and computer system having same |
06/28/2012 | US20120161808 Methods and Systems to Measure a Signal on an Integrated Circuit Die |
06/28/2012 | US20120161807 Single level of metal test structure for differential timing and variability measurements of integrated circuits |
06/28/2012 | US20120161806 Probe manufacturing method, probe structure, probe apparatus, and test apparatus |
06/28/2012 | US20120161805 Display device and method of testing the same |
06/28/2012 | US20120161804 Apparatus and method for terminating probe apparatus of semiconductor wafer |
06/28/2012 | US20120161802 Digital circuit testable through two pins |
06/28/2012 | US20120161801 Solar photovoltaic power generation module and inspecting method |
06/28/2012 | US20120161800 Measurement circuit and test apparatus |
06/28/2012 | US20120161781 Measurement circuit for capacitor |
06/28/2012 | US20120161780 Semiconductor device, test method, and test apparatus |
06/28/2012 | US20120161779 Discharge device and test system having the same |
06/28/2012 | US20120161778 System and method for detecting an earth ground fault of an external power supply connected to a vehicle |
06/28/2012 | US20120161776 Method and system for determining a state of charge of a battery |
06/28/2012 | US20120161775 Inspection method for an active matrix substrate |
06/28/2012 | US20120161684 System and method for synchronous machine health monitoring |
06/28/2012 | US20120161677 Battery module, battery system and electrically driven vehicle |
06/28/2012 | US20120161393 Jam detection in a card shuffler |
06/28/2012 | US20120160295 Solar cell classification method |
06/28/2012 | DE102011122440A1 Current sensor useful in battery, comprises sensor element, and signal processing arrangement, where test signal generator is coupled with processing arrangement for generating test signal pattern and is fed into processing arrangement |
06/28/2012 | DE102011120321B3 Method for monitoring quality and aging of electrical insulating material of e.g. distribution transformer for operating computer-based tangent delta measuring system, involves utilizing differences between dissipation factors and voltages |
06/28/2012 | DE102011004106A1 Leiterplatte, Verfahren zum Herstellen einer Leiterplatte und Prüfvorrichtung zum Prüfen einer Leiterplatte Printed circuit board, method of manufacturing a printed circuit board and test apparatus for testing a printed circuit board |