Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2014
05/06/2014US8718988 Method for determining and/or predicting the maximum power capacity of a battery
05/06/2014US8718968 Circuit breaker interrupter travel curve estimation
05/06/2014US8718967 Flexible storage interface tester with variable parallelism and firmware upgradeability
05/06/2014US8718959 Method and apparatus for high-speed fault detection in distribution systems
05/06/2014US8718123 Test apparatus and test method
05/06/2014US8717976 Method and apparatus for transmitting control information in wireless communications system that supports coordinated multi-point (CoMP) including multiple transmission points
05/06/2014US8717927 Combining channel quality measurements based on sounding reference signals and demodulation reference signals
05/06/2014US8717926 Method and device for switching from dual stream to single stream in uplink MIMO mode
05/06/2014US8717919 Systems and methods for space-time determinations with reduced network traffic
05/06/2014US8717916 Systems and methods for learning MSS of services
05/06/2014US8717913 Method and system for user based network analysis and planning
05/06/2014US8717909 Methods and apparatus for route installation acknowledgement and acknowledgement aggregation in BGP
05/06/2014US8717907 Adjustment of radio detection level for request signals based observed false detection
05/06/2014US8717903 Testing method and apparatus applied to IP phone system
05/06/2014US8717902 Method and apparatus for reducing traffic in a communications network
05/06/2014US8717891 Shaping apparatus and method
05/06/2014US8717890 Application, usage and radio link aware transport network scheduler
05/06/2014US8717889 Flow-control in a switch fabric
05/06/2014US8717884 Address-sharing system
05/06/2014US8717881 Reassigning signals to cable channels
05/06/2014US8717877 Method for completing smooth cut-over, device and equipment for performing cut-over operations
05/06/2014US8717874 Updating a switch software image in a distributed fabric protocol (DFP) switching network
05/06/2014US8717873 Modem adaptation control for facsimile over internet protocol
05/06/2014US8717869 Methods and apparatus to detect and restore flapping circuits in IP aggregation network environments
05/06/2014US8717530 Array substrate for transreflective liquid crystal display, manufacturing method thereof and liquid crystal display
05/06/2014US8717061 All-in-one motor assessment precision sizing system and capacitance calculator unit
05/06/2014US8717060 Method of monitoring a semiconductor device
05/06/2014US8717059 Die having wire bond alignment sensing structures
05/06/2014US8717058 Semiconductor apparatus and method of detecting characteristic degradation of semiconductor apparatus
05/06/2014US8717057 Integrated tester chip using die packaging technologies
05/06/2014US8717056 Probing assembly for testing integrated circuits
05/06/2014US8717055 Probe devices formed from multiple planar layers of structural material with tip regions formed from one or more intermediate planar layers
05/06/2014US8717054 Methods of creating probe structures from a plurality of planar layers
05/06/2014US8717053 DC-AC probe card topology
05/06/2014US8717052 Testing fuse configurations in semiconductor devices
05/06/2014US8717051 Method and apparatus for accurately measuring currents using on chip sense resistors
05/06/2014US8717050 Method for panel reliability testing and device thereof
05/06/2014US8717049 System and method for testing computer under varying environmental conditions
05/06/2014US8717048 System for post-processing of electronic components
05/06/2014US8717038 Wiring testing device
05/06/2014US8717037 Electronic control device
05/06/2014US8717036 Method and apparatus for detecting a phase-to-earth fault
05/06/2014US8717032 Electronic circuit breaker and a method of providing protection switching
05/06/2014US8716037 Measurement of CMOS device channel strain by X-ray diffraction
05/06/2014US8715519 Plasma reactor with adjustable plasma electrodes and associated methods
05/01/2014WO2014066402A1 Circuit and layout design methods and logic cells for soft error hard integrated circuits
05/01/2014WO2014065746A1 Method and arrangement for determining conductor length
05/01/2014WO2014065674A1 Method and system for monitoring a condition of electrical cables
05/01/2014WO2014065615A1 Apparatus and method for estimating state of charge of battery
05/01/2014WO2014065614A1 Apparatus and method for estimating state of charge of battery
05/01/2014WO2014065031A1 Balancer circuit and battery unit using same
05/01/2014WO2014065006A1 Charger cell capacitance display device
05/01/2014WO2014064998A1 Solar simulator
05/01/2014WO2014064507A1 Battery system
05/01/2014WO2014064349A1 Method for using an electrical energy storage system
05/01/2014WO2014064207A1 Assembly for testing the electrical contact in a carbon-fiber component
05/01/2014WO2014064000A1 Test circuit for a high-voltage direct current circuit breaker
05/01/2014WO2014063915A1 Method for testing external measuring units
05/01/2014WO2014063793A1 Frame for an energy storage device, battery cell comprising the frame and the energy storage device, battery comprising two of said battery cells and method for producing the frame
05/01/2014WO2014063784A1 A method for the diagnostics of electromechanical system based on impedance analysis
05/01/2014WO2014063569A1 Measuring system for measuring ion current field distribution characteristics under direct current transmission
05/01/2014WO2014032767A3 Electrochemical energy storage cell and electrochemical energy storage device comprising at least one electrochemical energy storage cell of said type
05/01/2014WO2013087670A3 Method and device for displaying a charge state of vehicle energy accumulator
05/01/2014WO2012148848A3 Method and system for hybrid reticle inspection
05/01/2014WO2012135103A3 Security system for underground conduit
05/01/2014US20140122955 Prbs test memory interface considering ddr burst operation
05/01/2014US20140122954 Core circuit test architecture
05/01/2014US20140122953 Blocking the effects of scan chain testing upon a change in scan chain topology
05/01/2014US20140122952 Boundary scan chain for stacked memory
05/01/2014US20140122951 SCAN TEST OF DIE LOGIC IN 3D ICs USING TSV PROBING
05/01/2014US20140122950 Semiconductor integrated circuit device
05/01/2014US20140122949 Efficient scan latch systems and methods
05/01/2014US20140122928 Network Processor Online Logic Test
05/01/2014US20140122010 Lcd driver verification system
05/01/2014US20140122005 System and method for generating a yield forecast based on wafer acceptance tests
05/01/2014US20140120777 Connector for Selectively Coupling an Electrical Load to a Device under Test
05/01/2014US20140120434 Method for determining membrane protonic resistance of a fuel cell stack
05/01/2014US20140120392 Electricity storage module
05/01/2014US20140120389 Method for Detecting a Triggering of a Security Device
05/01/2014US20140119072 Method and System for Detecting an Arc Fault in a Photovoltaic Power System
05/01/2014US20140118872 Protection circuit and gate driving circuit for semiconductor switching device
05/01/2014US20140118022 Modular testing of a power supply
05/01/2014US20140118021 System and method for selecting a derating factor to balance use of components having disparate electrical characteristics
05/01/2014US20140118020 Structures and methods for determining tddb reliability at reduced spacings using the structures
05/01/2014US20140118019 Method of testing a semiconductor structure
05/01/2014US20140118016 Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes
05/01/2014US20140118003 Fault diagnosis and preliminary location system and method for transformer core looseness
05/01/2014US20140118002 Disconnection detecting apparatus and method
05/01/2014US20140118000 Current differential protection
05/01/2014US20140117999 Fault diagnosis system, fault diagnosis device, fault diagnosis method, program, computer-readable medium, and device under test
05/01/2014US20140117998 Display device and bonding test system
05/01/2014US20140117997 Battery Pack Maintenance for Electric Vehicle
05/01/2014US20140117996 Test system for a battery pack and a method for testing the battery pack
05/01/2014US20140117995 Methods and apparatus for testing an electronic trip device
05/01/2014US20140117994 Calibrating a lighting device comprising a semiconductor light source
05/01/2014US20140117991 Glow plug inspecting method, glow plug manufacturing method, sheathed heater inspecting method, and sheathed heater manufacturing method
05/01/2014US20140117939 Secondary battery management system and method for exchanging battery cell information
05/01/2014US20140117839 Cathode selection method
04/2014
04/30/2014EP2725686A1 System and method for allocating identifier to multi-bms
04/30/2014EP2725682A1 Method, apparatus and computer program product for optimized device-to-device charging