Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
07/2012
07/04/2012CN102539843A Switch fatigue testing frame with sideway mechanism
07/04/2012CN102539842A Switching fatigue testing jig with moving mechanism
07/04/2012CN102539841A Female seat installation device
07/04/2012CN101923106B Four-way sinusoidal signal generator
07/04/2012CN101881788B Test turntable for transverse electromagnetic wave transmission cell and test method thereof
07/04/2012CN101833020B Testing device
07/04/2012CN101813713B Probe unit for testing planar display panel
07/04/2012CN101813712B Connecting needle for wired fixture
07/04/2012CN101750525B Manufacture method of test socket and elastic test probe used by same
07/04/2012CN101672863B Testing component and testing device applying same
07/04/2012CN101546618B Composition of matter for composite plastic contact elements featuring controlled conduction pathways, and related manufacturing processes
07/04/2012CN101515030B Probe needle trace transfer member and probe apparatus
07/04/2012CN101452030B Test device with switching element on socket substrate
07/04/2012CN101449172B A detection device for a switch cabinet with an input terminal module
07/04/2012CN101359000B Electrical signal connector
07/04/2012CN101122616B Contactor assembly
07/03/2012US8212580 Scalable wideband probes, fixtures, and sockets for high speed IC testing and interconnects
06/2012
06/28/2012WO2012086979A1 Method for manufacturing 4-point probe holder using single crystal and single crystal 4-point probe holder manufactured by same
06/28/2012WO2012086653A1 Testing system and package retainer
06/28/2012WO2012083420A1 Universal mate-in cable interface system
06/28/2012US20120161806 Probe manufacturing method, probe structure, probe apparatus, and test apparatus
06/28/2012US20120161753 Electric power measuring device
06/27/2012EP2210115B1 Full grid cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full grid cartridge and adapter for testing an unpopulated printed circuit board
06/27/2012CN202285039U 一种印刷电路板耐电压测试装置 A printed circuit board testing device withstand voltage
06/27/2012CN202285024U 一种大功率高压脉冲水负载 One kind of high-power high-voltage pulse water load
06/27/2012CN202285023U 屏蔽测试系统 Shielded Test System
06/27/2012CN102522725A Intelligent overcurrent protection circuit for integrated circuit test system
06/27/2012CN102520371A Lamp tube detection device
06/27/2012CN102520335A Test method of wafer
06/27/2012CN102520332A Wafer testing device and method for the same
06/27/2012CN102520287A Pneumatic multi-contact high-voltage heavy-current change-over switch
06/27/2012CN102520234A External detection type coaxial bipolar high-low voltage alternating current acousto-optic electroscope
06/27/2012CN102520220A 电源电路 Power circuit
06/27/2012CN102520219A Novel path signal source used for detecting power cable
06/27/2012CN102520218A Programmable trouble power simulator
06/27/2012CN102520217A Low resource-consumption multipath waveform generator and realizing method thereof
06/27/2012CN102520216A Metal insulation chip test needle frame
06/27/2012CN102520215A Adjustable clamp for testing battery and mounting method thereof
06/27/2012CN102520214A Full-diameter core resistivity clamp
06/27/2012CN101893681B Test system and method
06/27/2012CN101839961B Test system and method
06/27/2012CN101726639B Rack-mounted heat load and application thereof
06/27/2012CN101706557B Automatic detector for communication storage battery
06/27/2012CN101317099B Contact element and checkout system
06/27/2012CN101173970B Chip-based prober for high frequency measurements and methods of measuring
06/26/2012US8205466 Indoor and outdoor units of an air conditioning system connected via two wiring configurations
06/21/2012WO2012082510A2 Probe card stiffener with decoupling
06/21/2012WO2012081677A1 Probe card
06/21/2012US20120153980 Probe assembly
06/21/2012US20120153979 E-Field Probe Integrated with Package Lid
06/21/2012DE112009005186T5 Signalerfassungsvorrichtungen und schaltungsplatinen Signal detection devices and circuit circuit boards
06/20/2012EP1866654B1 Method and device for tempering a substrate
06/20/2012CN202281824U 一种断路器智能延时试验台 A circuit breaker intelligent Delay Test Bench
06/20/2012CN202281788U 波形发生装置 Waveform generator
06/20/2012CN202281787U 一种交流信号发生系统 An AC signal generating system
06/20/2012CN202281786U 用于太阳能电池片测试机的定位装置 Positioning device for solar cell tester
06/20/2012CN202281785U 检测探针气冷装置 Air cooling device detection probe
06/20/2012CN202281784U 断路器实验支架 Breaker test stand
06/20/2012CN202281783U 一种磁通门传感器探头的磁芯外壳 One kind of core fluxgate sensor probe housing
06/20/2012CN202281782U 一种灌封型电流传感器 One kind of potting type current sensor
06/20/2012CN1837838B Measuring method, inspection method, inspection device for semiconductor device
06/20/2012CN102509530A Alignment detection device for flat display screen
06/20/2012CN102508130A Special voltage withstand testing device for cylindrical capacitors
06/20/2012CN102508087A Integrated test stand for transformers
06/20/2012CN102508069A Automatic test fixture for PCB (Printed Circuit Board) board
06/20/2012CN102508042A Open-ended coaxial probe and method for measuring dielectric spectrum property of biological tissues
06/20/2012CN102507994A Power signal source capable of providing frequency division dynamic waveforms
06/20/2012CN102507993A Burst signal generator with automatic initial phase calibration function
06/20/2012CN102507992A Test line for testing charging current and downloaded data
06/20/2012CN102507991A Rotary worktable of circuit board detection jig
06/20/2012CN102507990A Fixture of electrified test in dielectric material for satellite
06/20/2012CN102507989A Bottom box structure of ICT (Information and Communication Technology) test fixture
06/20/2012CN102507308A Self-triggering and intelligent unloading device for test load
06/20/2012CN101806818B Isolated array type voltage signal source circuit
06/20/2012CN101806816B Clamper of low voltage breaker test sample
06/20/2012CN101506666B Conductive contactor and conductive contactor unit
06/20/2012CN101487852B Detachable probing tip system for a measurement probing system
06/20/2012CN101424704B Replaceable probe apparatus for probing semiconductor wafer
06/20/2012CN101226766B Audio play device automatically adjusting play parameter
06/19/2012US8203353 Probes with offset arm and suspension structure
06/19/2012US8203352 Single support structure probe group with staggered mounting pattern
06/19/2012US8203345 Storage battery and battery tester
06/19/2012US8202684 Method for manufacturing probe sheet
06/14/2012WO2012077378A1 Material for electrical/electronic use
06/14/2012WO2012076407A1 Electronic device with shunt for current measurement
06/14/2012WO2012057502A3 Contact-type sealed probe apparatus adopting a voltage-applying system
06/14/2012WO2012033338A3 Probe card and method for manufacturing same
06/14/2012US20120146677 Probe Card
06/14/2012US20120146669 Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materials
06/14/2012DE10228291B4 Halbleitervorrichtungssockel Semiconductor device socket
06/14/2012DE102010063040A1 Contact pin for test apparatus i.e. in-circuit-test apparatus, to test printed circuit boards, has end section including two partial contacts each comprising contact surface with quadrature axial component extending to contact pin axis
06/13/2012EP2463668A2 A method and an apparatus for testing electrical properties
06/13/2012EP2463667A2 Flexible probe
06/13/2012EP2463666A2 Electronic device test set and contact used therein
06/13/2012EP1474695B1 Method and apparatus for testing electronic devices
06/13/2012CN202275136U 两台冲击电压发生器联合试验装置 Two impulse voltage generator Test Equipment
06/13/2012CN202275127U Automatic test jig for printed circuit board (PCB)
06/13/2012CN202275125U Mobile comprehensive debugging cabinet for reactive compensation device
06/13/2012CN202275096U 时间测量模块保护装置 Time measurement module protection device
06/13/2012CN202275095U 上电夹快装防脱工装 Quick Clips on anti-off tooling
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