Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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07/04/2012 | CN102539843A Switch fatigue testing frame with sideway mechanism |
07/04/2012 | CN102539842A Switching fatigue testing jig with moving mechanism |
07/04/2012 | CN102539841A Female seat installation device |
07/04/2012 | CN101923106B Four-way sinusoidal signal generator |
07/04/2012 | CN101881788B Test turntable for transverse electromagnetic wave transmission cell and test method thereof |
07/04/2012 | CN101833020B Testing device |
07/04/2012 | CN101813713B Probe unit for testing planar display panel |
07/04/2012 | CN101813712B Connecting needle for wired fixture |
07/04/2012 | CN101750525B Manufacture method of test socket and elastic test probe used by same |
07/04/2012 | CN101672863B Testing component and testing device applying same |
07/04/2012 | CN101546618B Composition of matter for composite plastic contact elements featuring controlled conduction pathways, and related manufacturing processes |
07/04/2012 | CN101515030B Probe needle trace transfer member and probe apparatus |
07/04/2012 | CN101452030B Test device with switching element on socket substrate |
07/04/2012 | CN101449172B A detection device for a switch cabinet with an input terminal module |
07/04/2012 | CN101359000B Electrical signal connector |
07/04/2012 | CN101122616B Contactor assembly |
07/03/2012 | US8212580 Scalable wideband probes, fixtures, and sockets for high speed IC testing and interconnects |
06/28/2012 | WO2012086979A1 Method for manufacturing 4-point probe holder using single crystal and single crystal 4-point probe holder manufactured by same |
06/28/2012 | WO2012086653A1 Testing system and package retainer |
06/28/2012 | WO2012083420A1 Universal mate-in cable interface system |
06/28/2012 | US20120161806 Probe manufacturing method, probe structure, probe apparatus, and test apparatus |
06/28/2012 | US20120161753 Electric power measuring device |
06/27/2012 | EP2210115B1 Full grid cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full grid cartridge and adapter for testing an unpopulated printed circuit board |
06/27/2012 | CN202285039U 一种印刷电路板耐电压测试装置 A printed circuit board testing device withstand voltage |
06/27/2012 | CN202285024U 一种大功率高压脉冲水负载 One kind of high-power high-voltage pulse water load |
06/27/2012 | CN202285023U 屏蔽测试系统 Shielded Test System |
06/27/2012 | CN102522725A Intelligent overcurrent protection circuit for integrated circuit test system |
06/27/2012 | CN102520371A Lamp tube detection device |
06/27/2012 | CN102520335A Test method of wafer |
06/27/2012 | CN102520332A Wafer testing device and method for the same |
06/27/2012 | CN102520287A Pneumatic multi-contact high-voltage heavy-current change-over switch |
06/27/2012 | CN102520234A External detection type coaxial bipolar high-low voltage alternating current acousto-optic electroscope |
06/27/2012 | CN102520220A 电源电路 Power circuit |
06/27/2012 | CN102520219A Novel path signal source used for detecting power cable |
06/27/2012 | CN102520218A Programmable trouble power simulator |
06/27/2012 | CN102520217A Low resource-consumption multipath waveform generator and realizing method thereof |
06/27/2012 | CN102520216A Metal insulation chip test needle frame |
06/27/2012 | CN102520215A Adjustable clamp for testing battery and mounting method thereof |
06/27/2012 | CN102520214A Full-diameter core resistivity clamp |
06/27/2012 | CN101893681B Test system and method |
06/27/2012 | CN101839961B Test system and method |
06/27/2012 | CN101726639B Rack-mounted heat load and application thereof |
06/27/2012 | CN101706557B Automatic detector for communication storage battery |
06/27/2012 | CN101317099B Contact element and checkout system |
06/27/2012 | CN101173970B Chip-based prober for high frequency measurements and methods of measuring |
06/26/2012 | US8205466 Indoor and outdoor units of an air conditioning system connected via two wiring configurations |
06/21/2012 | WO2012082510A2 Probe card stiffener with decoupling |
06/21/2012 | WO2012081677A1 Probe card |
06/21/2012 | US20120153980 Probe assembly |
06/21/2012 | US20120153979 E-Field Probe Integrated with Package Lid |
06/21/2012 | DE112009005186T5 Signalerfassungsvorrichtungen und schaltungsplatinen Signal detection devices and circuit circuit boards |
06/20/2012 | EP1866654B1 Method and device for tempering a substrate |
06/20/2012 | CN202281824U 一种断路器智能延时试验台 A circuit breaker intelligent Delay Test Bench |
06/20/2012 | CN202281788U 波形发生装置 Waveform generator |
06/20/2012 | CN202281787U 一种交流信号发生系统 An AC signal generating system |
06/20/2012 | CN202281786U 用于太阳能电池片测试机的定位装置 Positioning device for solar cell tester |
06/20/2012 | CN202281785U 检测探针气冷装置 Air cooling device detection probe |
06/20/2012 | CN202281784U 断路器实验支架 Breaker test stand |
06/20/2012 | CN202281783U 一种磁通门传感器探头的磁芯外壳 One kind of core fluxgate sensor probe housing |
06/20/2012 | CN202281782U 一种灌封型电流传感器 One kind of potting type current sensor |
06/20/2012 | CN1837838B Measuring method, inspection method, inspection device for semiconductor device |
06/20/2012 | CN102509530A Alignment detection device for flat display screen |
06/20/2012 | CN102508130A Special voltage withstand testing device for cylindrical capacitors |
06/20/2012 | CN102508087A Integrated test stand for transformers |
06/20/2012 | CN102508069A Automatic test fixture for PCB (Printed Circuit Board) board |
06/20/2012 | CN102508042A Open-ended coaxial probe and method for measuring dielectric spectrum property of biological tissues |
06/20/2012 | CN102507994A Power signal source capable of providing frequency division dynamic waveforms |
06/20/2012 | CN102507993A Burst signal generator with automatic initial phase calibration function |
06/20/2012 | CN102507992A Test line for testing charging current and downloaded data |
06/20/2012 | CN102507991A Rotary worktable of circuit board detection jig |
06/20/2012 | CN102507990A Fixture of electrified test in dielectric material for satellite |
06/20/2012 | CN102507989A Bottom box structure of ICT (Information and Communication Technology) test fixture |
06/20/2012 | CN102507308A Self-triggering and intelligent unloading device for test load |
06/20/2012 | CN101806818B Isolated array type voltage signal source circuit |
06/20/2012 | CN101806816B Clamper of low voltage breaker test sample |
06/20/2012 | CN101506666B Conductive contactor and conductive contactor unit |
06/20/2012 | CN101487852B Detachable probing tip system for a measurement probing system |
06/20/2012 | CN101424704B Replaceable probe apparatus for probing semiconductor wafer |
06/20/2012 | CN101226766B Audio play device automatically adjusting play parameter |
06/19/2012 | US8203353 Probes with offset arm and suspension structure |
06/19/2012 | US8203352 Single support structure probe group with staggered mounting pattern |
06/19/2012 | US8203345 Storage battery and battery tester |
06/19/2012 | US8202684 Method for manufacturing probe sheet |
06/14/2012 | WO2012077378A1 Material for electrical/electronic use |
06/14/2012 | WO2012076407A1 Electronic device with shunt for current measurement |
06/14/2012 | WO2012057502A3 Contact-type sealed probe apparatus adopting a voltage-applying system |
06/14/2012 | WO2012033338A3 Probe card and method for manufacturing same |
06/14/2012 | US20120146677 Probe Card |
06/14/2012 | US20120146669 Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materials |
06/14/2012 | DE10228291B4 Halbleitervorrichtungssockel Semiconductor device socket |
06/14/2012 | DE102010063040A1 Contact pin for test apparatus i.e. in-circuit-test apparatus, to test printed circuit boards, has end section including two partial contacts each comprising contact surface with quadrature axial component extending to contact pin axis |
06/13/2012 | EP2463668A2 A method and an apparatus for testing electrical properties |
06/13/2012 | EP2463667A2 Flexible probe |
06/13/2012 | EP2463666A2 Electronic device test set and contact used therein |
06/13/2012 | EP1474695B1 Method and apparatus for testing electronic devices |
06/13/2012 | CN202275136U 两台冲击电压发生器联合试验装置 Two impulse voltage generator Test Equipment |
06/13/2012 | CN202275127U Automatic test jig for printed circuit board (PCB) |
06/13/2012 | CN202275125U Mobile comprehensive debugging cabinet for reactive compensation device |
06/13/2012 | CN202275096U 时间测量模块保护装置 Time measurement module protection device |
06/13/2012 | CN202275095U 上电夹快装防脱工装 Quick Clips on anti-off tooling |