| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 04/12/1989 | EP0310874A2 Improved process for examining tubes |
| 04/12/1989 | EP0310865A1 X-ray diagnostic apparatus with an image intensifier television system |
| 04/12/1989 | EP0310816A1 Automatic frequency following in a corpuscular beam-measuring method using a modulated primary beam |
| 04/12/1989 | EP0310750A2 Methods and apparatus for X-ray analysis of rapidly moving multicomponent materials |
| 04/12/1989 | CN2035888U Portable x ray flaw detector |
| 04/11/1989 | US4821306 System for detecting two X-ray energies |
| 04/11/1989 | US4821304 Detection methods and apparatus for non-destructive inspection of materials with radiation |
| 04/11/1989 | US4821303 Combined thermal analyzer and x-ray diffractometer |
| 04/11/1989 | US4821302 Method and apparatus for transient unit cell measurement |
| 04/11/1989 | US4821301 X-ray reflection method and apparatus for chemical analysis of thin surface layers |
| 04/11/1989 | US4820922 Radiation image recording and read-out apparatus with sectored image recording capability |
| 04/11/1989 | US4820919 Method of determining the density of substrata |
| 04/06/1989 | DE3731715A1 Method and arrangement for detecting the secondary particles released on a sample by a corpuscular beam |
| 04/05/1989 | EP0310303A1 Beltless core conveyor system for wellsite analysis |
| 04/05/1989 | EP0309813A1 X-ray diagnostic apparatus |
| 04/04/1989 | US4819256 Radiographic sensitivity for detection of flaws and cracks |
| 04/04/1989 | US4818877 Source of illuminating radiation |
| 03/29/1989 | EP0308678A1 Process and device for measuring the phase of signals at a test point by means of an unmodulated particle beam |
| 03/29/1989 | EP0308677A1 Process and device for measuring the phase of signals at a test point by means of a modulated particle beam |
| 03/29/1989 | EP0308493A1 Thickness/density measuring apparatus. |
| 03/28/1989 | US4817122 Apparatus for radiation analysis |
| 03/28/1989 | US4817121 Apparatus for checking baggage with x-rays |
| 03/28/1989 | US4817120 Multichannel X-ray spectrometer |
| 03/22/1989 | EP0308304A1 Method for analysing a sample by etching with a beam of particles, and apparatus therefor |
| 03/21/1989 | US4815116 Method and apparatus for x-ray analysis of rapidly moving multicomponent materials |
| 03/21/1989 | US4815115 Method of photographing an object with a panoramic X-ray apparatus fitted with automatic exposure |
| 03/21/1989 | US4814615 Method and apparatus for detecting defect in circuit pattern of a mask for X-ray exposure |
| 03/21/1989 | US4813147 Apparatus for interacting with both sides of a two-sided strip |
| 03/16/1989 | EP0214183A4 Method for determining internal stresses in polycrystalline solids. |
| 03/15/1989 | EP0307302A1 Apparatus for controlling criticality and concentration extent of a fissile material |
| 03/15/1989 | EP0307271A1 Apparatus for characterizing fissile material, comprising a neutron radiation detector embedded in the interior of a gamma radiation detecting scintillator |
| 03/15/1989 | EP0307096A2 Growth rate monitor for molecular beam epitaxy |
| 03/15/1989 | EP0306790A2 Cathodoluminescence detector |
| 03/15/1989 | EP0127650B1 Procedure and means for measuring with the aid of an x-ray tube the distribution of fillers or equivalent in a web |
| 03/14/1989 | US4812748 Method and apparatus for operating a scanning microscope |
| 03/14/1989 | US4812651 Spectrometer objective for particle beam measuring instruments |
| 03/14/1989 | US4812650 Growth rate monitor for molecular beam epitaxy |
| 03/14/1989 | CA1251287A1 Ion beam implanter control system |
| 03/09/1989 | DE3728822A1 Eichverfahren fuer die geschwindigkeitsskala eines moessbauer-spektrometers Calibration procedure for the speed scale of Moessbauer spectrometer |
| 03/08/1989 | EP0306276A2 Method and apparatus for vitrifying and analysing powdery and granular materials |
| 03/08/1989 | EP0306081A2 Apparatus for slit radiography |
| 03/08/1989 | CN1003542B X-射线扫描仪 X- ray scanners |
| 03/07/1989 | US4811373 For measuring bone contact |
| 03/07/1989 | US4810879 For investigating a selected area of a specimen |
| 03/07/1989 | US4810776 Process for producing epoxy resin having a low-EHC-content from chlorine-substituted crude epoxy resin of high EHC-content and apparatus for automatically controlling such process |
| 03/07/1989 | US4810447 System for improved flaw detection in polycrystalline diamond |
| 02/28/1989 | US4809314 Method of aligning a linear array X-ray detector |
| 02/28/1989 | US4809312 Method and apparatus for producing tomographic images |
| 02/28/1989 | US4809309 X-ray examination apparatus with a locally divided auxiliary detector |
| 02/28/1989 | US4809308 Method and apparatus for performing automated circuit board solder quality inspections |
| 02/21/1989 | US4807270 Radiological scanning apparatus |
| 02/21/1989 | US4807268 Scanning monochrometer crystal and method of formation |
| 02/21/1989 | US4807267 X-ray computed tomography apparatus |
| 02/21/1989 | US4806755 Micromechanical atomic force sensor head |
| 02/21/1989 | US4806754 High luminosity spherical analyzer for charged particles |
| 02/15/1989 | EP0303238A2 Non destructive process for identifying surface finishing irregularities and variations of internal tension of materials |
| 02/15/1989 | CN2032716U Insertion type measurer for moisture and density |
| 02/14/1989 | US4804242 Connector for optical fiber |
| 02/14/1989 | CA1250061A1 Method of measuring layer thickness and composition of alloy plating |
| 02/08/1989 | EP0302841A2 A device for the control and automatic positioning of equipment trolleys used in verifying pipeline weldments by radiography |
| 02/07/1989 | US4803715 Thickness measurement with automatic correction for changes in composition |
| 02/07/1989 | US4803711 X-ray inspection apparatus |
| 02/07/1989 | US4803639 X-ray inspection system |
| 02/07/1989 | US4803357 Method and arrangement for detecting secondary particles triggered on a specimen by a primary particle beam |
| 02/07/1989 | US4803356 Method and apparatus for measuring degree of vacuum in an electron microscope |
| 02/07/1989 | US4803355 Mass spectrometer |
| 02/01/1989 | EP0301505A2 Sample tilting device in electron microscope |
| 01/31/1989 | US4802195 Device for method for manipulating a part |
| 01/26/1989 | WO1989000738A1 Method and apparatus for reconstituting picture |
| 01/26/1989 | WO1989000685A1 Process and installation for analysing a flow of bulk materials by neutron bombardment |
| 01/25/1989 | EP0300242A1 Process and apparatus for the control of the partial density of metal and acid in pickling baths |
| 01/25/1989 | CN2031528U Strong magnetic body fixer for metal defect |
| 01/24/1989 | US4800580 X-ray analysis apparatus |
| 01/24/1989 | US4800274 High resolution atomic force microscope |
| 01/24/1989 | US4799382 Method for determining reservoir characteristics of a porous material |
| 01/18/1989 | EP0299951A2 Process and apparatus for mask inspection |
| 01/18/1989 | EP0299813A1 System for visualizing a latent image, and method of applying it |
| 01/17/1989 | US4799247 X-ray imaging particularly adapted for low Z materials |
| 01/17/1989 | US4799246 Apparatus for measuring the thickness of thin layers |
| 01/17/1989 | US4799245 Integrated CT scanner gantry |
| 01/17/1989 | US4798989 Scanning tunneling microscope installed in electron microscope |
| 01/04/1989 | EP0297249A1 Composite cavity structure for an explosive detection system |
| 01/04/1989 | EP0297138A1 Gantry for tomograph |
| 01/03/1989 | US4796284 Polycrystalline X-ray spectrometer |
| 01/03/1989 | US4795903 Analysis of fluids |
| 12/29/1988 | WO1988010435A1 Storage phosphor read-out method |
| 12/29/1988 | WO1988010094A1 Process and device for investigating cellular changes in a living organism |
| 12/28/1988 | EP0296871A2 Tunnelling scanning microscope |
| 12/28/1988 | EP0296737A1 X-ray radiation sensor |
| 12/28/1988 | EP0296339A1 Cooling device for a computerised tomography apparatus |
| 12/28/1988 | EP0296262A1 Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method |
| 12/27/1988 | US4794646 Charged beam pattern defect inspection apparatus |
| 12/27/1988 | US4794256 Fast neutron process measurement system |
| 12/27/1988 | US4793844 Melting, tableting, cooling in graphite ring |
| 12/22/1988 | DE3719348A1 Moessbauer-spektrometer Moessbauer spectrometer |
| 12/21/1988 | EP0295653A2 High luminosity spherical analyzer for charged particles |
| 12/21/1988 | EP0295523A1 X-ray diagnostic arrangement with a storage screen |
| 12/21/1988 | EP0295429A2 Explosive detection system |
| 12/20/1988 | US4792900 Medical diagnostic imaging apparatus |
| 12/15/1988 | DE3717850A1 X-ray diagnostics device with a fluorescent storage screen |