| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 05/29/1996 | EP0713569A1 Matched thermal expansion support system |
| 05/29/1996 | CN1031902C Method for measuring surface electronic energy sepectrum and apparatus thereof |
| 05/28/1996 | US5521377 Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples |
| 05/23/1996 | WO1996015442A1 Method and equipment for determining the content of an element |
| 05/22/1996 | CN2227833Y Growth stress detector for high temp. oxidizing film |
| 05/21/1996 | US5519225 System and method for using a dual modality detector for inspecting objects |
| 05/21/1996 | US5519214 Method for analysis of drilling fluids |
| 05/21/1996 | US5518124 Method and apparatus for the separation of materials using penetrating electromagnetic radiation |
| 05/15/1996 | EP0711996A1 An apparatus for measuring the sulfur component contained in oil |
| 05/15/1996 | EP0711419A1 Method and device for carrying out detection of at least one non-visible object containing a given material |
| 05/15/1996 | CN2227336Y Digital drop meter |
| 05/09/1996 | WO1996013839A1 Inspection system and spatial resolution technique for detecting explosives using combined neutron interrogation and x-ray imaging |
| 05/09/1996 | WO1996013712A1 Polychannel, multiple-total-external reflection neutron radiography |
| 05/09/1996 | WO1996013708A1 Thin film sample support |
| 05/09/1996 | CA2204010A1 Inspection system and spatial resolution technique for detecting explosives using combined neutron interrogation and x-ray imaging |
| 05/08/1996 | EP0710834A1 A mobile apparatus and method for non destructively inspecting stationary components |
| 05/02/1996 | WO1996013017A1 X-ray computed tomography (ct) system for detecting thin objects |
| 05/02/1996 | DE4438993A1 Determining external contour and-or geometric dimensions of bodies |
| 05/01/1996 | EP0708976A1 Process for operating a time-of-flight secondary ion mass spectrometer |
| 04/25/1996 | WO1996012175A1 Nuclear gauge with compensation for sample irregularities |
| 04/25/1996 | DE4436688A1 Spiral computer tomograph for human body investigation |
| 04/25/1996 | CA2196288A1 Nuclear gauge with compensation for sample irregularities |
| 04/24/1996 | EP0708326A2 Arrangement for the inspection of welded plate sections |
| 04/23/1996 | US5511103 Method of X-ray mapping analysis |
| 04/23/1996 | US5510622 X-ray detector array with reduced effective pitch |
| 04/23/1996 | US5510616 Cigarette density profile measurement system |
| 04/18/1996 | DE4436263A1 Three dimensional solid measurement display method |
| 04/18/1996 | DE19538253A1 Surface analysis of solid particles for establishing atom and electron concentrations |
| 04/16/1996 | US5509043 Asymmetrical 4-crystal monochromator |
| 04/10/1996 | EP0705359A1 Continuous elemental analysis of process flows |
| 04/09/1996 | US5506406 Method and apparatus for determining the concentration of a heavy element in a rock face |
| 04/09/1996 | US5506185 Ceramic oxyanion emitter |
| 04/04/1996 | WO1996010172A1 Apparatus for analysing fluid flow |
| 04/04/1996 | WO1996009880A2 A mixer and apparatus for analysing fluid flow |
| 04/04/1996 | CA2201116A1 Apparatus for analysing fluid flow |
| 03/26/1996 | US5502306 Electron beam inspection system and method |
| 03/26/1996 | US5502305 Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples |
| 03/21/1996 | DE19536707A1 X-ray diffractometry system |
| 03/21/1996 | DE19533821A1 High speed EM:screened data transmitter for tomographic X-ray scanner |
| 03/21/1996 | DE19533820A1 High speed differential data transmitter for tomographic X-ray scanner |
| 03/20/1996 | EP0701703A1 Method and device for identifying designated materials in the composition of an object |
| 03/13/1996 | EP0701120A1 Powdery, granular and conglomerate material treating apparatus and analyzing method using the apparatus |
| 03/13/1996 | EP0701119A1 Method of evaluating a silicon single crystal |
| 03/13/1996 | EP0700516A1 Method and device for determining the attenuation function of an object with respect to the transmission of a reference material thickness |
| 03/13/1996 | CN2222351Y X-ray orientation device |
| 03/12/1996 | US5498874 Defect detecting apparatus and method |
| 03/06/1996 | CN1117837A Universal high-frequency radiation safety gain equipment |
| 03/05/1996 | US5497407 Contaminating-element analyzing method |
| 02/28/1996 | EP0698894A1 Imaging methods and imaging devices |
| 02/22/1996 | WO1996005714A1 Method and apparatus for soldering inspection of circuit board |
| 02/22/1996 | WO1996005504A1 Imaging system for plastic components |
| 02/22/1996 | DE4430615A1 Large surface area powder diffractometry permitting the simultaneous reproduction of large surface area samples |
| 02/22/1996 | DE4428920A1 Material prepn. and application of X=ray fluorescence analysis |
| 02/21/1996 | EP0697109A1 X-ray spectrometer with a grazing take-off angle |
| 02/21/1996 | CN2220640Y Miniature multifunction accessory for polycrystal X ray |
| 02/20/1996 | US5493596 High-energy X-ray inspection system |
| 02/20/1996 | US5493594 Method and apparatus for inspection of solder joints by x-ray fluoroscopic imaging |
| 02/20/1996 | US5493593 Tilted detector microscopy in computerized tomography |
| 02/20/1996 | US5493122 Energy resolving x-ray detector |
| 02/20/1996 | US5493115 Methods for analyzing a sample for a compound of interest using mass analysis of ions produced by slow monochromatic electrons |
| 02/14/1996 | EP0696354A1 Fluid composition meter |
| 02/14/1996 | CN1116709A Method for measurement of material heat expansion in X-ray powder diffraction meter |
| 02/13/1996 | US5491738 X-ray diffraction apparatus |
| 02/13/1996 | US5491737 Material handling and inspection apparatus and method |
| 02/08/1996 | WO1996003640A1 Method of obtaining an image of an object and a device for carrying out said method |
| 02/06/1996 | US5490218 Device and method for inspection of baggage and other objects |
| 02/06/1996 | US5490195 Method for measuring and extending the service life of fatigue-limited metal components |
| 02/06/1996 | US5490194 Method and apparatus for analyzing contaminative element concentrations |
| 02/06/1996 | US5489782 Method and apparatus for quantum-limited data acquisition |
| 02/06/1996 | US5489780 Radon gas measurement apparatus having alpha particle-detecting photovoltaic photodiode surrounded by porous pressed metal daughter filter electrically charged as PO-218 ion accelerator |
| 02/06/1996 | US5488832 Matched thermal expansion support system |
| 02/01/1996 | WO1996002660A1 Positional control of selenium insertion in polypeptides for x-ray crystallography |
| 01/25/1996 | WO1996002059A1 X-ray apparatus for applying a predetermined flux to an interior surface of a body cavity |
| 01/25/1996 | WO1996002058A1 Method of guiding beams of neutral and charged particles and a device for implementing said method |
| 01/25/1996 | WO1996001991A1 Device for obtaining an image of an object using a stream of neutral or charged particles and a lens for converting the said stream of neutral or charged particles |
| 01/25/1996 | DE19525605A1 X-ray computer tomography scanner detector element arrangement for medical diagnostics |
| 01/25/1996 | CA2170531A1 Device for producing the image of an object using the flux of neutral or charged particles, and a lens for converting such flux of neutral or charged particles |
| 01/23/1996 | US5486696 Procedure and apparatus for the analysis of surface and/or depth profiles |
| 01/17/1996 | CN2217799Y Potassium-uranium-thorium spectrometor |
| 01/16/1996 | US5484326 Semiconductor ingot machining method |
| 01/11/1996 | DE19524371A1 Fluorescent X-ray radiation analysis device |
| 01/10/1996 | EP0691537A1 Process of measuring the integral mass humidity in two phase currents |
| 01/09/1996 | US5483571 Radiographic moire |
| 01/09/1996 | US5483567 Computerized method for converting polar tomographic data to a cartesian image format |
| 01/09/1996 | US5483081 Method for detecting light emitted by two surfaces of a stimulable phosphor sheet |
| 01/09/1996 | US5483065 Electron beam microanalyzer |
| 01/04/1996 | WO1996000382A1 Analysing a material sample |
| 01/04/1996 | DE4423780A1 Focusing housing for geophysical neutron activation detector |
| 01/03/1996 | EP0355128B1 Automated laminography system for inspection of electronics |
| 01/02/1996 | US5481584 X-ray inspection system |
| 01/02/1996 | US5481109 Surface analysis method and apparatus for carrying out the same |
| 01/02/1996 | US5481108 Method for ion detection and mass spectrometry and apparatus thereof |
| 12/28/1995 | WO1995035491A1 A method of determining the density profile of a plate-shaped material |
| 12/28/1995 | WO1995035482A1 Method for measuring mass flows in flow ducts |
| 12/27/1995 | EP0689063A2 Electron detector with high back-scattered electron acceptance for particle beam apparatus |
| 12/27/1995 | EP0689048A1 Method for the obtention of the image of an object rotating around an axis by means of tangential radiography |
| 12/27/1995 | EP0689047A1 Method of compensating for radiation scatter in an x-ray imaging system |
| 12/26/1995 | US5479020 Metering device for a fluid |
| 12/21/1995 | WO1995034807A1 X-ray fluorescence spectrometer |
| 12/21/1995 | WO1995034781A1 Matched thermal expansion support system |