| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 04/27/2010 | US7705303 Defect inspection and charged particle beam apparatus |
| 04/27/2010 | US7705302 Scanning electron microscope |
| 04/27/2010 | US7705301 Electron beam apparatus to collect side-view and/or plane-view image with in-lens sectional detector |
| 04/27/2010 | US7705300 Charged particle beam adjusting method and charged particle beam apparatus |
| 04/27/2010 | US7705294 Method of visualizing target objects in a fluid-carrying pipe |
| 04/27/2010 | CA2375244C Method and apparatus for x-ray diffraction analyses |
| 04/22/2010 | WO2010044544A2 Sample holder for measuring residual stress and method for quantitatively analyzing crystal phase using the same |
| 04/22/2010 | WO2010044351A1 Supersensitization of defect inspection method |
| 04/22/2010 | WO2010006188A3 Method and apparatus for laser machining |
| 04/22/2010 | US20100099979 Spatial characterization of a structure located within an object by identifying 2d representations of the structure within section planes |
| 04/22/2010 | US20100098951 Black adhesion promoter composition and its detection |
| 04/22/2010 | US20100098374 Optoelectronic component based on premold technology |
| 04/22/2010 | US20100098213 X-ray imaging apparatus |
| 04/22/2010 | US20100098212 Methods and Devices for Quantitative Analysis of X-Ray Images |
| 04/22/2010 | US20100098211 Method and apparatus for measuring enrichment of uf6 |
| 04/22/2010 | US20100098209 Spectrum-preserving heel effect compensation filter made from the same material as anode plate |
| 04/22/2010 | US20100096550 Projection electron beam apparatus and defect inspection system using the apparatus |
| 04/22/2010 | US20100096549 Sample Inspection Apparatus, Sample Inspection Method and Sample Inspection System |
| 04/22/2010 | DE102009043067A1 Röntgen-CT-System zur Röntgen-Phasenkontrast- und/oder Röntgen-Dunkelfeld-Bildgebung X-ray CT system for X-ray phase contrast and / or X-ray dark field imaging |
| 04/22/2010 | DE102008052006A1 Verfahren und Vorrichtung zur Herstellung von Proben für die Transmissionselektronenmikroskopie Method and apparatus for the preparation of samples for transmission electron microscopy |
| 04/22/2010 | DE102008050851A1 Röntgenanalyseinstrument mit verfahrbarem Aperturfenster X-ray analysis instrument with movable aperture window |
| 04/21/2010 | EP2176877A2 Device for providing a high energy x-ray beam |
| 04/21/2010 | EP1592347B1 Dual function ct scan |
| 04/21/2010 | EP1203394B1 METHOD FOR PREPARING A CsX PHOTOSTIMULABLE PHOSPHOR AND PHOSPHORS THEREFROM |
| 04/21/2010 | EP1159761B1 Electronic nanostructure device |
| 04/21/2010 | CN201440132U Curved-surface crystal optical splitting device of wavelength dispersion X-ray fluorescence spectrometer |
| 04/21/2010 | CN201440131U Semi-trailer vehicular radiation detection system |
| 04/21/2010 | CN201440130U Flaw detection manipulator with travelling type framework |
| 04/21/2010 | CN1971258B Method for evaluating stability of cefoperazone sodium leechdom |
| 04/21/2010 | CN1589741B X-ray CT apparatus |
| 04/21/2010 | CN1442115B Method of producing three D multi resolution ratio inspected object stereo graph |
| 04/21/2010 | CN101696947A Intelligent method for fusing X-ray dual-energy transmission with Compton backscatter images |
| 04/21/2010 | CN101028193B X-ray imaging device and x-ray imaging method |
| 04/20/2010 | US7702075 Energy spectrum modulation apparatus, material discrimination method and device, image processing method |
| 04/20/2010 | US7702073 Systems and methods for developing a secondary collimator |
| 04/20/2010 | US7702071 Method for performing power diffraction analysis |
| 04/20/2010 | US7702070 Device and method for inspecting contraband in aviation cargo container |
| 04/20/2010 | US7702069 X-ray security inspection machine |
| 04/20/2010 | US7702068 Contraband detection systems and methods |
| 04/20/2010 | US7702067 Measurement of lead by X-ray fluorescence |
| 04/20/2010 | US7702066 Portable aspects for x-ray fluorescence visualizer, imager, or information provider |
| 04/20/2010 | US7702064 Method for providing 3D x-ray image data record and an x-ray imaging system with a measuring facility for detecting the breathing phase of a patient |
| 04/20/2010 | US7700931 Ion beam processing apparatus |
| 04/20/2010 | US7700918 Sample electrification measurement method and charged particle beam apparatus |
| 04/20/2010 | US7700916 Logical CAD navigation for device characteristics evaluation system |
| 04/20/2010 | US7700915 Method, computer program and apparatus for the characterization of molecules |
| 04/20/2010 | US7700365 detecting via liquid chromatography, mass spectrometry |
| 04/20/2010 | CA2405387C High-precision method and apparatus for evaluating creep damage |
| 04/15/2010 | WO2010042544A2 Apparatus and method of detecting electromagnetic radiation |
| 04/15/2010 | WO2010041193A2 Method and apparatus to improve ct image acquisition using a displaced geometry |
| 04/15/2010 | US20100092062 Device and method for localization of a tissue variation for a biopsy |
| 04/15/2010 | US20100091947 Differential Interference Phase Contrast X-ray Imaging System |
| 04/15/2010 | US20100091946 Imaging system for imaging a region of interest from energy-dependent projection data |
| 04/15/2010 | US20100091945 Radiographic image detection apparatus and method for controlling the apparatus |
| 04/15/2010 | US20100091944 Method of quantitative analysis of hexavalent chromium in chromate coating and method for controlling hazardous element in encapsulating resin of resin encapsulation semiconductor device |
| 04/15/2010 | US20100091943 Apparatus and method for image processing |
| 04/15/2010 | US20100090109 Scanning electron microscope |
| 04/15/2010 | US20100090108 Method and Apparatus for Producing Samples for Transmission Electron Microscopy |
| 04/15/2010 | US20100090107 Method and handling apparatus for placing patterning device on support member for charged particle beam imaging |
| 04/15/2010 | US20100089663 Nondestructive Device and Method for Evaluating Ultra-Hard Polycrystalline Constructions |
| 04/15/2010 | DE102008051911A1 Vorrichtung und Verfahren zum automatisierten, berührungslosen Inline-Prüfen dünner Medien, zB Siliziumscheiben Apparatus and method for automated non-contact Inline Check thinner media, such as silicon wafers |
| 04/15/2010 | DE102008041815A1 Verfahren zur Analyse einer Probe A method for analyzing a sample |
| 04/15/2010 | CA2739598A1 Apparatus and method of detecting electromagnetic radiation |
| 04/14/2010 | EP2175456A2 X-ray analysis instrument with mobile aperture window |
| 04/14/2010 | CN201438181U Platform carrier for X-ray inspection machines |
| 04/14/2010 | CN201438180U Green-channel vehicle checking system |
| 04/14/2010 | CN1936557B X-ray CT apparatus, X-ray detector and method of manufacturing X-ray detector |
| 04/14/2010 | CN1920542B Simple pendulum type device for imaging experiment device in high-speed moving substances detection |
| 04/14/2010 | CN1779444B Safety CT inspector for liquid by ray resource |
| 04/14/2010 | CN1573321B Radiographic apparatus |
| 04/14/2010 | CN101334369B Method and apparatus for checking liquid article hidden drug |
| 04/14/2010 | CN101143097B Radiation ray detecting circuit and radiation ray detecting device |
| 04/13/2010 | US7697745 Enclosure inspection method and apparatus thereof |
| 04/13/2010 | US7697664 Systems and methods for determining an atomic number of a substance |
| 04/13/2010 | US7696991 Method and apparatus for analyzing twinned crystal |
| 04/13/2010 | US7696480 Method and apparatus for determining an object material |
| 04/13/2010 | US7696477 Electric-field-enhancement structures including dielectric particles, apparatus including same, and methods of use |
| 04/13/2010 | US7695675 Method of inactivating microorganisms in a fluid using ultraviolet radiation |
| 04/13/2010 | US7695673 Uses ionized gas; Ultra Violet (UV) radiation intensity is maximized |
| 04/13/2010 | CA2407511C Instrument for noncontact measurement of physical property |
| 04/13/2010 | CA2396695C System and method for monitoring changes in state of matter with terahertz radiation |
| 04/08/2010 | WO2010038883A1 Defect observation device and defect observation method |
| 04/08/2010 | WO2010038859A1 Pattern matching method and image processing device |
| 04/08/2010 | US20100086104 X-ray analysis instrument with adjustable aperture window |
| 04/08/2010 | US20100086103 Medical inspection apparatus |
| 04/08/2010 | US20100086102 Radiation imaging apparatus and method of driving the same, and radiation imaging system |
| 04/08/2010 | US20100085066 Methods and systems for the rapid detection of concealed objects |
| 04/08/2010 | US20100084563 Fluorescence imaging apparatus |
| 04/08/2010 | US20100084554 Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system |
| 04/08/2010 | US20100084553 Charged particle detection apparatus and detection method |
| 04/08/2010 | DE102009044134A1 Einrichtung und Verfahren für eine z-positions-abhängige Röntgenstrahlfilterung für ein Bildgebungssystem Apparatus and method for a z-position-dependent X-ray filtering for an imaging system |
| 04/08/2010 | DE102008050363A1 Crystal orientation determining method for e.g. lens, involves illuminating inspection region of surface of body with illumination beam, and detecting reflex produced by reflection at micro-gap surfaces by detection module |
| 04/08/2010 | DE102008049774A1 Prozessinterne Überwachung der Metallkontamination während der Bearbeitung von Mikrostrukturen In-process monitoring of metal contamination during processing of microstructures |
| 04/08/2010 | DE102008049163A1 Device for irradiating sample with X-ray radiation, has X-ray source, slit diaphragms and focusing element which is arranged between slit diaphragms |
| 04/08/2010 | DE102008048683A1 Verfahren zur Bestimmung von Phase und/oder Amplitude zwischen interferierenden benachbarten Röntgenstrahlen in einem Detektorpixel bei einem Talbot-Interferometer A method for determining the phase and / or amplitude between interfering adjacent X-rays in a detector pixel in a Talbot interferometer |
| 04/07/2010 | EP2171435A1 Detection of x-ray scattering |
| 04/07/2010 | EP1470413B1 Diffractometer and method for diffraction analysis |
| 04/07/2010 | CN201436585U Hyperbolic crystal X fluorescence spectrum analyzer |
| 04/07/2010 | CN1910448B X-ray inspection apparatus |
| 04/07/2010 | CN1676102B Stationary computed tomography system and method |