Patents for G01B 7 - Measuring arrangements characterised by the use of electric or magnetic means (32,725)
05/1999
05/12/1999EP0915518A2 Parasitic capacitance reduction for passive charge read out
05/12/1999EP0915319A1 Moving body and means for detecting position thereof
05/12/1999EP0914588A1 Procede et dispositif a self integree dans un pont de mesure
05/12/1999EP0827585A4 Compact, low-cost, semiconductor instrument
05/12/1999EP0745212B1 Process and device for determining the angular position of a rotating shaft
05/12/1999DE19749745A1 Non-contact working displacement measuring system especially for piston type tensioner
05/12/1999DE19747001A1 Elektrischer Widerstand sowie ein mit diesem elektrischen Widerstand hergestellter mechanisch elektrischer Wandler Electrical resistance as well as a manufactured with this electrical resistance mechanical-electric transducer
05/12/1999CN2318603Y Laser high precision scale measurement code reading apparatus
05/11/1999US5903205 Induction-type rotational position detecting device
05/11/1999US5902928 Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator
05/11/1999US5901458 Electronic caliper using a reduced offset induced current position transducer
05/11/1999CA2096261C Split array dipole moment detection and localization
05/06/1999WO1999022212A1 Structure equipped with electric contacts formed through said structure substrate and method for obtaining said structure
05/06/1999WO1999022210A1 Electric resistor and a mechanical electrical transformer produced with said electric resistor
05/06/1999EP0913668A1 Process for measuring the phase angle of position sensors with sinusoidal output signals
05/06/1999EP0913665A1 Fine movement mechanism and scanning probe microscope
05/06/1999EP0913508A2 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
05/06/1999DE19801092A1 Determining absolute positions for stroke determining cylinder and direction relative to stroke
05/06/1999DE19747376A1 Capacitively measuring the distance from a semiconducting surface, e.g. for measuring the flatness and thickness of semiconducting surfaces
05/06/1999DE19740485C1 Arrangement for determining the thickness and lateral and vertical positions of overhead power cables for electric trains and for detecting shocks
05/04/1999US5900729 Magnetic force microscopy probe with integrated coil
05/04/1999US5900728 Alternating current magnetic force microscopy system with probe having integrated coil
04/1999
04/29/1999DE19847355A1 Sprung contact deformation measuring device for electric socket
04/28/1999EP0911973A2 Solid state capacitive switch
04/28/1999EP0911642A2 Methods and apparatus for determining the location of a magnetic probe within the anatomy of a patient by means of ESR
04/28/1999EP0910784A1 Eddy current inspection technique
04/28/1999EP0910523A1 Seat belt tension measurement device using a bend sensor
04/28/1999EP0891152A4 Independently positionable transducers for location system
04/28/1999EP0883374A4 Movable transmit or receive coils for location system
04/28/1999EP0668987B1 Co-ordinate measuring instrument with a feeler in the form of a solid body oscillator
04/28/1999CN1215150A Inductive position sensor with multi-tap receiver coil
04/27/1999US5898304 Sensor arrangement including a neural network and detection method using same
04/27/1999US5898300 Travel sensor having approximately constant measured signal temperature dependence across an entire measurement range
04/27/1999US5898298 Inductor/capacitor-based measuring system for a moving body
04/27/1999US5898106 Method and apparatus for obtaining improved vertical metrology measurements
04/27/1999US5897511 Organism vibration measuring device and method
04/22/1999WO1999019691A1 Position sensor
04/22/1999WO1998041080A3 Passive peak deflection sensor
04/22/1999DE19843718A1 Thickness detector for measuring the thickness of paper
04/22/1999DE19746199A1 Magnetoresistive angle sensor for angle and position measurement
04/21/1999EP0909937A1 Semiconductor strain sensor, method of manufacturing the sensor, and scanning probe microscope
04/21/1999EP0909372A1 Manually operated angle pickup
04/21/1999CN2315529Y Plastic deformation measurer for material
04/21/1999CN2315528Y Inductive metal plate thickness measurer
04/21/1999CN2315527Y Thickness detection head for high temperature environment
04/21/1999CN2315526Y High pressure differential resistor type displacement meter
04/21/1999CN1214743A Device for measuring thickness and/or unevenness of wadding or non-wovens
04/20/1999US5896032 Position detection device positioning device and moving medium-type memory device
04/20/1999US5894678 Electronic linear tape measure using a low power induced current position transducer
04/14/1999EP0908719A1 Stage unit used for sample positioning and scanning probe microscope with such a stage unit
04/14/1999EP0908702A2 Inductive position transducer having a multi-tap receiver winding
04/14/1999EP0908697A1 Method and apparatus for measuring the volume of cells on printing rollers
04/14/1999EP0907891A1 Arrangement for the contactless inductive transmission of electric measurement values and/or electric energy between a rotor and a stator
04/14/1999CN2314342Y Instrument for measuring errors of holes and bores on bodies and boxes
04/14/1999CN1213769A Pitch-compensated induced current position transducer
04/14/1999CN1213608A Ejector pin with pressure sensor
04/08/1999WO1999017073A1 Device for detecting the position of two bodies
04/08/1999WO1999017072A1 Measurement of surface wear
04/08/1999DE19841325A1 Nondestructive method to determine position-course of metal body in non metallic magnetic material
04/08/1999DE19820160A1 Rotary angle measuring device for printers
04/08/1999DE19747566C1 Piezo driven tension wave drive with rigid splined unit and flexible unit having splines also wave generator
04/07/1999EP0907076A2 Methods of fabricating integrated, aligned tunneling tip pairs
04/07/1999EP0907068A1 Hall effect sensor system
04/07/1999EP0783662B1 Fine positioning apparatus with atomic resolution
04/06/1999US5892365 Capacitive sensor device for use at high temperature and pressure, including a coaxial cable with integrated end portion
04/06/1999US5890564 Apparatus to inspect hoisting ropes
04/06/1999CA2122684C Sensor array system for determining axle spacing
04/01/1999WO1999015851A1 Method and apparatus for obtaining improved vertical metrology measurements
04/01/1999DE19840465A1 Method and apparatus for determining the length of an electrode
03/1999
03/31/1999EP0905484A2 Pitch-compensated induced current position transducer
03/31/1999EP0905475A1 Semiconductor strain sensor, method of manufacturing the sensor, and scanning probe microscope
03/31/1999EP0904728A2 Implantable pressure indicator
03/31/1999CN1212365A Apparatus for measuring exchange force
03/31/1999CN1042765C Intelligent calibration instrument for gauge block
03/30/1999US5889461 Structure for mounting an operating member of an electrical part to an operating shaft
03/30/1999US5889401 Method and apparatus for determining the thickness of several layers superimposed on a substrate
03/30/1999US5887356 Multi-axis continuous probe
03/30/1999US5887351 Inclined plate 360 degree absolute angle sensor
03/30/1999CA2141553C Dual sensitivity stud sensor
03/25/1999WO1999014613A1 Sensor element
03/25/1999WO1999014555A1 Lever arm for a scanning microscope
03/25/1999WO1998052135A3 Capacitive fingerprint sensor with adjustable gain
03/25/1999DE19742016A1 Capacitor gauge for measuring internal diameter of bored holes in workpieces
03/25/1999DE19741579A1 System to determine position of permanent magnet
03/25/1999DE19740763A1 Cantilever arm manufacturing method for atomic force microscope (AFM)
03/25/1999DE19740049A1 Sensor for determining rotation angle
03/25/1999CA2302739A1 Lever arm for a scanning microscope
03/24/1999EP0903558A1 Arrangement of a position sensor in a piston-cylinder unit
03/24/1999EP0902880A1 Magnetic ring
03/24/1999EP0902873A1 Axial movement linear gauging head
03/24/1999EP0712533B1 Probe microscopy
03/24/1999CN1211811A Chemically differentiated imaging by scanning atomic force microscopy
03/24/1999CN1211670A Valve straight-motion type engine
03/24/1999CN1211486A Tool or tool clamp
03/23/1999US5886532 Nanometer distance regulation using electromechanical power dissipation
03/23/1999US5886522 Dual mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates
03/23/1999US5886521 Device and method for determining the thickness of an insulating coating on an electrical conductor of a cable and the diameter of the cable
03/23/1999US5886520 Position sensor having magnetic resistance effect devices for detecting a position of an object
03/23/1999US5886519 Multi-scale induced current absolute position transducer
03/23/1999US5886518 Nickel alloy magnetostrictive wire and displacement detection device using same