| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 08/20/1980 | EP0014626A1 Method and apparatus for continuously determining the level of the charge in a blast furnace |
| 08/20/1980 | EP0014398A2 Device for the contactless measuring of thickness or distance |
| 08/19/1980 | US4218623 Device for detecting displacement of an optical image |
| 08/19/1980 | US4218144 Measuring instruments |
| 08/19/1980 | CA1083807A1 Alignment device and method |
| 08/12/1980 | US4217649 Digitizer for locating the position of a stylus point on a writing surface |
| 08/12/1980 | US4217053 Apparatus and method to test workpieces for size, relative position, material integrity, and the like |
| 08/06/1980 | EP0013729A1 Optical measuring device for etching rates of opaque materials |
| 08/06/1980 | EP0013725A1 Remote width measurement system |
| 08/05/1980 | US4215939 Glue drop detector |
| 08/05/1980 | US4215938 Method and apparatus for correcting the error of a position measuring interferometer |
| 08/05/1980 | US4215937 Method and apparatus for detecting optimum alignment of optical fibers in a connector arrangement |
| 08/05/1980 | US4215480 Distance measuring gauge |
| 08/05/1980 | CA1083244A1 Electronic comparator for process control |
| 07/29/1980 | US4214373 Grade checker |
| 07/29/1980 | CA1082811A1 Diffraction pattern amplitude analysis for use in fabric inspection |
| 07/29/1980 | CA1082486A1 Arrangement and photometer for measuring and controlling the thickness of optically active thin layers |
| 07/23/1980 | EP0013325A2 Optical measuring arrangement for determining the distance between edge shaped structures on surfaces |
| 07/22/1980 | US4213708 Graininess sensor |
| 07/22/1980 | US4213707 Device for improving the accuracy of optical measuring apparatus and the like |
| 07/22/1980 | US4213704 Method and apparatus for sensing the position of a writing laser beam |
| 07/15/1980 | US4212541 Method and apparatus for testing a forward-moving strand |
| 07/15/1980 | US4212540 Testing the divergence of a beam from a laser |
| 07/15/1980 | US4212534 Device for contact-free measuring of the distance of a surface of an object from a reference plane |
| 07/09/1980 | EP0013036A1 A method of optical inspection for surface defects and the use of apparatus for carrying out said method |
| 07/08/1980 | US4212073 Method and system for surface contouring |
| 07/01/1980 | CA1080504A1 Measurement of thin films minimizing wave interference effects |
| 06/24/1980 | US4209257 Apparatus for detecting defects in patterns |
| 06/24/1980 | US4209255 Single source aiming point locator |
| 06/24/1980 | US4209252 Optical probe assembly for detecting the position of an object surface and method |
| 06/24/1980 | CA1080369A1 Scanning electron microscope micrometer scale and method of fabricating same |
| 06/24/1980 | CA1080324A1 Electro-optical monitoring system |
| 06/24/1980 | CA1079965A1 Arrangement for sensing the geometric characteristics of an object |
| 06/24/1980 | CA1079955A1 Method of determining parallax effects in a stereoscopic optical system |
| 06/17/1980 | US4208589 Optical scanner |
| 06/17/1980 | US4207835 Arrangement and photometer for measuring and controlling the thickness of optically active thin layers |
| 06/17/1980 | CA1079813A1 Arc length measurement and control by optical scanning |
| 06/11/1980 | EP0011744A1 Light grid arrangement |
| 06/11/1980 | EP0011723A1 Process and device for the interferometric measurement of changing film thicknesses |
| 06/11/1980 | EP0011708A1 Method and device for measuring the evenness, roughness or curvature radius of an area to be measured |
| 06/10/1980 | US4207594 Electronic indirect measuring system |
| 06/10/1980 | US4207593 Method and apparatus for the automatic recognition and evaluation of optical crack indications on the surface of workpieces |
| 06/10/1980 | US4207472 Lumber inspection and optimization system |
| 06/10/1980 | US4207467 Film measuring apparatus and method |
| 06/10/1980 | US4207463 Rotation angle sensor |
| 06/10/1980 | US4207003 Sensing device for ink film thickness in printing presses |
| 06/10/1980 | US4207002 Apparatus for detecting an output image of an optical correlation |
| 06/10/1980 | US4207001 Particle size analyzer |
| 06/10/1980 | US4207000 Waveguide method for determining stress at the convex surface of a body |
| 06/10/1980 | CA1079059A1 Boring rig alignment apparatus and method using optical plumb line |
| 06/03/1980 | US4206441 Identification apparatus |
| 06/03/1980 | US4205973 Method and apparatus for measuring the volume and shape of a glass gob |
| 06/03/1980 | US4205917 Method of utilizing interferometric information from two different holograms exposed with short interval |
| 06/03/1980 | US4205452 Measuring set for determination of the sagittal depth and the average central curvature of gel contact lenses |
| 05/27/1980 | US4205304 Two dimensional light beam selection system |
| 05/27/1980 | US4204772 Optical measuring system |
| 05/27/1980 | CA1078489A1 Surface sensor |
| 05/27/1980 | CA1078172A1 Method of and device for effecting contact-free measurement by optical scanning |
| 05/20/1980 | US4204224 Process and apparatus for measuring the length of moving shaped articles particularly red-hot semifinished articles |
| 05/20/1980 | US4203799 Method for monitoring thickness of epitaxial growth layer on substrate |
| 05/20/1980 | US4203667 Covert recovery or signalling system |
| 05/20/1980 | CA1077719A1 Manufacture of flat glass having controlled width and nip width |
| 05/15/1980 | WO1980001002A1 Pattern inspection system |
| 05/13/1980 | US4203029 Automatic object counter |
| 05/13/1980 | US4202631 Apparatus for detecting defects in patterns |
| 05/13/1980 | US4202630 Method of and apparatus for recording surface irregularity of object |
| 05/13/1980 | US4202627 Photoelectric detecting apparatus |
| 05/06/1980 | US4201476 Laser dimension gauge |
| 05/06/1980 | US4201475 Device/process for contact free distance and thickness measurement |
| 05/06/1980 | CA1077158A1 Apparatus for measuring the profile of a railroad tunnel |
| 05/06/1980 | CA1076829A1 Optical method and apparatus for determining stress relaxation |
| 05/06/1980 | CA1076793A1 Optical dimension measuring device employing an elongated focused beam |
| 05/01/1980 | WO1980000873A1 Optoelectronic device for high precision dimensional measurements |
| 04/30/1980 | EP0010493A1 Optoelectronic device for high precision dimensional measurement |
| 04/30/1980 | EP0010241A2 Distance sensing apparatus |
| 04/30/1980 | EP0010110A1 Defect detecting device |
| 04/29/1980 | US4200787 Fiber optic elevation sensing apparatus |
| 04/29/1980 | US4200397 Apparatus for distinguishing between predetermined ranges of angles at which light rays leave a surface |
| 04/29/1980 | US4200396 Optically testing the lateral dimensions of a pattern |
| 04/22/1980 | US4199259 Detector pulse enhancement circuit |
| 04/22/1980 | US4199258 Distance measuring device and method |
| 04/22/1980 | US4199257 Projected reticle optical sighting system |
| 04/22/1980 | US4199255 Apparatus for use in grading hides, skins, pelts and the like |
| 04/22/1980 | US4199254 Method of measuring the quantity of movement of an object |
| 04/22/1980 | US4199226 Laser transmitting and receiving device |
| 04/22/1980 | US4198758 Chain measuring and conveyor control system |
| 04/22/1980 | CA1075892A1 Method of and apparatus for determining vehicle wheel alignment |
| 04/16/1980 | EP0009999A1 Apparatus for determining physical characteristics of plant root samples |
| 04/16/1980 | EP0009582A1 Device for measuring the distance between a point on a surface of an object and a null plane |
| 04/16/1980 | EP0009581A1 Method for determining the thickness of sheet material moving over rollers |
| 04/15/1980 | US4198165 Apparatus and method for measuring an object |
| 04/15/1980 | US4198164 Proximity sensor and method and apparatus for continuously measuring rail gauge |
| 04/15/1980 | US4197855 Device for measuring the location, the attitude and/or the change in location or, respectively, attitude of a rigid body in space |
| 04/15/1980 | CA1075457A1 Measuring probe using light |
| 04/08/1980 | US4197012 Process and apparatus for measuring discoloration |
| 04/08/1980 | US4196648 Automatic sawmill apparatus |
| 04/08/1980 | US4196629 Fiber optic machinery performance monitor |
| 04/08/1980 | CA1075341A1 Cw-laser illuminator detector |
| 04/02/1980 | EP0009453A1 Method for examining the dimensions and position of nuclear reactor-vessel components |
| 04/01/1980 | US4195929 Method for determining properties of optically isotropic and anisotropic materials |