Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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04/27/1988 | EP0264591A2 Method for measuring the optical axes of a projector guide beam and device for carrying out the method |
04/26/1988 | US4740806 Range finding device |
04/21/1988 | WO1988002847A2 Extended-range moire contouring |
04/21/1988 | WO1988002846A1 Optical measuring probe |
04/21/1988 | WO1988002845A1 Optical probe |
04/21/1988 | WO1988002843A1 Position-determining apparatus |
04/21/1988 | WO1988002713A1 Apparatus for track-based detection of the wheel profile of passing railway wheels |
04/21/1988 | DE3634869A1 Device for scanning a body by means of at least one luminous beam |
04/20/1988 | EP0264223A2 Datuming of analogue measurement probes |
04/20/1988 | EP0264057A2 Automatic focusing system for observing means for inspecting an object |
04/20/1988 | EP0263858A1 Device for checking the straightness and, if required, the height and/or distortions in vessels made of transparent material, preferably bottles |
04/20/1988 | CN87207289U Extinction and luminosity compatible elliptic polarimeter |
04/19/1988 | US4739175 Apparatus for inspecting configuration of terminal legs of an electronic device |
04/19/1988 | US4739161 Fine displacement transducer employing plural optical fibers |
04/19/1988 | US4739158 Apparatus for the detection of pattern edges |
04/19/1988 | US4738533 Plywood surface defect detecting head |
04/19/1988 | US4738532 Method of calibrating an optical measuring system |
04/19/1988 | US4738527 Apparatus and method for determining position with light |
04/19/1988 | CA1235513A1 Method of film inspection with a microscopical image analyzer |
04/19/1988 | CA1235507A1 Apparatus for continuous measurement of condition for a paper web in the course of laying |
04/14/1988 | DE3633681A1 Device for determining the distance between two bodies |
04/13/1988 | EP0263261A1 Opto-electronic displacement detector |
04/12/1988 | US4737920 Method and apparatus for correcting rotational errors during inspection of reticles and masks |
04/12/1988 | US4737846 Device for detecting defects in single faced corrugated fiberboards |
04/12/1988 | US4737651 Optical apparatus for the measurement of coat weight of coated products |
04/12/1988 | US4737650 Inspection apparatus |
04/12/1988 | US4737645 Printer supplies monitoring system |
04/12/1988 | US4737032 Surface mensuration sensor |
04/12/1988 | US4737031 Method and device for determination of desired middle line of a cylindrical object such as a log |
04/12/1988 | US4736851 Process and apparatus for the automatic inspection by transparency contrast in particular of containers |
04/12/1988 | CA1235226A1 Electronic foot measuring apparatus and method |
04/07/1988 | WO1988002097A3 Process for extending the resolution of a line or matrix camera |
04/07/1988 | DE3731531A1 Method for extending the resolution of a line camera or matrix camera |
04/06/1988 | EP0263089A2 Method and arrangement for the measurement of wheel alignment angles in the front axle and suspension assembly of a motor vehicle |
04/06/1988 | EP0263016A1 Displacement and proximity detector with three optical fibres |
04/06/1988 | EP0262646A2 Shape measuring instrument |
04/06/1988 | EP0262525A1 Method and apparatus for measuring the position of the weft threads or stitch courses in textiles |
04/06/1988 | EP0262349A2 Photoelectric angle measuring device |
04/06/1988 | EP0262142A1 Device for controlling the geometry of a mechanical structure. |
04/05/1988 | US4735508 Method and apparatus for measuring a curvature of a reflective surface |
04/05/1988 | CA1234908A1 Method and apparatus for real-time high-speed inspection of objects for identifying defects |
03/30/1988 | EP0262089A2 Device for measurement of the surface of an object |
03/30/1988 | EP0262055A1 Flow-measuring process |
03/30/1988 | EP0261621A1 Apparatus for the determination of the dimensions of an object by means of photography |
03/30/1988 | EP0261228A1 Tape rule device |
03/30/1988 | EP0120910B1 Determining toe of rear and front vehicle wheels |
03/29/1988 | US4734923 Lithographic system mask inspection device |
03/29/1988 | US4734766 Method and system for locating and inspecting seam weld in metal seam-welded pipe |
03/29/1988 | US4734577 Continuous strain measurement along a span |
03/29/1988 | US4734572 Dual light source locating and tracking system |
03/29/1988 | US4733969 Laser probe for determining distance |
03/29/1988 | US4733968 Datum sensing using optical grating |
03/24/1988 | WO1988002098A1 Laser probe |
03/24/1988 | WO1988002097A2 Process for extending the resolution of a line or matrix camera |
03/24/1988 | DE3631652A1 Measuring arrangement for contactless thickness determination |
03/24/1988 | DE3631187A1 Method and device for determining the distance between marks on measured objects |
03/24/1988 | DE3629784A1 Photometric rotation sensor for transparent originals |
03/23/1988 | EP0260933A2 Fiber optic displacement measuring apparatus |
03/23/1988 | EP0260522A2 Method and apparatus for scanning a laser beam to examine the surface of semiconductor wafer |
03/23/1988 | EP0260295A1 Dart scorer |
03/22/1988 | US4733080 Textile structure measurment |
03/22/1988 | US4732486 Contact-free optical linear measurement device |
03/22/1988 | US4732485 Optical surface profile measuring device |
03/22/1988 | US4732484 Apparatus for measuring the dimensions of a minute object |
03/22/1988 | US4732483 Interferometric surface profiler |
03/22/1988 | US4732481 Polarization interferometer |
03/22/1988 | US4732473 Apparatus for, and methods of, determining the characteristics of semi-conductor wafers |
03/22/1988 | US4732471 Laser alignment system with modulated field |
03/17/1988 | DE3724932A1 Arrangement for interferometrically measuring distance and thickness |
03/17/1988 | DE3630702A1 Device for measuring a workpiece |
03/16/1988 | EP0259601A2 System for automatically inspecting a workpiece for holes |
03/16/1988 | EP0259350A1 Apparatus for sorting cutlery. |
03/15/1988 | US4731853 Three-dimensional vision system |
03/15/1988 | US4731745 Automatic dimension analyzer |
03/15/1988 | US4731650 Spatial characteristic determination |
03/15/1988 | US4731526 Process for picking up navigation data |
03/15/1988 | US4730930 Scanning apparatus and method |
03/15/1988 | US4730929 Method and device for the contactless measurement of movement |
03/15/1988 | US4730928 Position measurement by laser beam |
03/15/1988 | US4730927 Method and apparatus for measuring positions on the surface of a flat object |
03/10/1988 | WO1988001734A1 Electro-optic space positioner with background compensator |
03/10/1988 | WO1988001367A3 Spurious electromagnetic energy discriminator for electro-optical inspection systems |
03/10/1988 | DE3721296A1 Device for measuring and machining workpieces |
03/09/1988 | EP0258810A2 Method and apparatus for inspecting the appearances of articles |
03/09/1988 | EP0258588A2 Optical surface-measuring device |
03/08/1988 | US4730213 Method measuring transparent elements and an opaque medium |
03/08/1988 | US4730116 Sheet thickness measuring apparatus by optical scanning |
03/08/1988 | US4729423 Process and apparatus for the optical checking of the shape and dimensions of the ends of tubes in a steam generator |
03/03/1988 | DE3721247A1 Arrangement for determining the surface contour of objects by means of moiré technique |
03/03/1988 | DE3629648A1 Method and arrangement for optically determining the deviations of the actual position of a measurement object from a desired position |
03/03/1988 | DE3629391A1 Method and arrangement for determining the freedom from play of coupling sockets which are used in demountable connections (joints) of optical fibres |
03/02/1988 | EP0257804A2 The method of and apparatus for the positional detection of objects |
03/02/1988 | EP0257553A2 Apparatus for detecting a position of an electronic part |
03/02/1988 | EP0257305A2 Circuit arrangement for a position-sensitive radiation detector |
03/02/1988 | EP0257229A2 Fotometer |
03/02/1988 | CN87202304U Optical fiber, laser detector for surface-roughness |
03/01/1988 | US4728196 Arrangement for determining a surface structure, especially for roughness |
03/01/1988 | US4728194 Method of and apparatus for optically measuring displacement |
03/01/1988 | CA1233523A1 Optical encoder |
03/01/1988 | CA1233350A1 Impression-taking device using optical means, particularly for the automatic making of prosthesis |