Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
04/2013
04/17/2013CN202885786U Trinocular camera three-dimensional contour measuring system with two-dimensional laser contour scanning sensor
04/17/2013CN202885785U A automatic laser non-contact measuring device used for measuring the outline of the transverse section and the vertical section of a steel rail
04/17/2013CN202885784U Video extensometer
04/17/2013CN202885783U Stroke detection module of plastic drainage plate insertion machine construction remote monitoring and recording system
04/17/2013CN202885782U Optical sensor, monitoring system and processing machine
04/17/2013CN202885781U Non-contact type height measuring device for surrounding edge of mattress
04/17/2013CN202885780U Grating ruler reading head connecting base for measuring machine
04/17/2013CN202885779U Non-pairing wedge degree measurement tool for engine gear trains
04/17/2013CN202881570U Weaving machine starting characteristic measuring system
04/17/2013CN202877143U Automatic board edge detector
04/17/2013CN103052968A Object detection device, object detection method, and program
04/17/2013CN103052863A Glass bottle inspection device
04/17/2013CN103048907A Reflection sensor and image forming apparatus
04/17/2013CN103048790A Single-color laser beam-expanding collimation system
04/17/2013CN103048789A Optical system producing long-distance light with similar non-diffraction grating type linear structure
04/17/2013CN103048697A Optical curtain device capable of measuring advancing direction, axial number and two-dimensional shape of vehicle
04/17/2013CN103048486A Device and method for measuring rotation speeds and positions of rotors of birotor permanent magnet wind-driven generator
04/17/2013CN103048482A Device and method for measuring minute-angle motion quantity of vibrating table
04/17/2013CN103048335A Method for judging effectiveness of positioning surface of polishing substrate with crystal orientation (111)
04/17/2013CN103048329A Pavement crack detecting method based on active contour model
04/17/2013CN103048047A Phase element containing normal incident broadband polarized spectrometer and optical measurement system
04/17/2013CN103047949A Bearing retainer high-precision simulation test technology
04/17/2013CN103047948A Non-contact detection system for punching position of water dropper of drip irrigation tube
04/17/2013CN103047946A Virtual data-based axisymmetric parameter distribution image reconstruction method
04/17/2013CN103047945A Angle displacement measurement device of movable back beam outer pipe
04/17/2013CN103047944A Three-dimensional object measuring method and device
04/17/2013CN103047943A Method for detecting vehicle door outer plate shape and size based on single-projection encoding structured light
04/17/2013CN103047942A Visual acquisition system and method for geometrical characteristics of graded crushed rocks of railway and road beds
04/17/2013CN103047941A Measuring machine table, measuring system and vehicle glass test system
04/17/2013CN103047940A Method and device for measuring volume deformation of large-volume concrete bottom plate by using laser wireless distance meter
04/17/2013CN103047939A Evaluating method for engineering applicability of fiber bragg grating strain sensor
04/17/2013CN103047938A Method and device for detecting icing thickness of power transmission line
04/17/2013CN103047937A Pavement meteorology detection method and pavement meteorology sensor
04/17/2013CN103047936A Displacement sensor for detecting spherical motion
04/17/2013CN103047935A Method for detecting top surface of substrate and scribing apparatus
04/17/2013CN103047934A Optical fiber sensing microspur measurement system
04/17/2013CN103047933A Method and system for identifying height of electronic device
04/17/2013CN103047932A Device and method for measuring size and movement speed of bubbles in concentrated phase gas-solid fluidized bed
04/17/2013CN103047931A Dynamic position measuring device of back beam
04/17/2013CN103047930A Vehicle-mounted subway tunnel disease data automatic acquisition system
04/17/2013CN103047929A Apparatus for measuring volume of powder layer
04/17/2013CN103043532A Detection method and detection system for crane and coil diameter of the steel wire rope of super-lift winch
04/17/2013CN103043216A Freezing detector
04/17/2013CN102338752B Automobile sandwich glass detection system
04/17/2013CN102322822B Three-dimensional measurement method for triple-frequency color fringe projection
04/17/2013CN102305599B Tire section structure surveying instrument and method
04/17/2013CN102288133B Installation deflection angle calibration method of gyro indirect stable system
04/17/2013CN102288132B Method for measuring vertex curvature radius deviation of aspheric surface by using laser tracking instrument
04/17/2013CN102288115B Method for precisely measuring roller geometric dimension on line
04/17/2013CN102252776B High-temperature curing device for fiber bragg grating sensor
04/17/2013CN102198857B Assessment method for wing level of airplane based on robot and height detection unit
04/17/2013CN102072706B Multi-camera positioning and tracking method and system
04/17/2013CN102059589B Device and method for detecting inclination angle error of laser displacement sensor
04/17/2013CN102023168B Method and system for detecting chips on semiconductor wafer surface
04/17/2013CN102023044B Direct measuring device and direct measuring method for loading capacity of grinder equipment
04/17/2013CN101836072B Interferometer
04/17/2013CN101660896B Semiconductor wafer film thickness detecting device on basis of infrared optical interference method
04/17/2013CN101281025B Eccentric inspection apparatus and eccentric adjusting apparatus
04/16/2013USRE44150 Self-compensating laser tracker
04/16/2013US8423320 Method and system for quantitative inline material characterization in semiconductor production processes based on structural measurements and related models
04/16/2013US8422762 Abnormality detecting apparatus for detecting abnormality at interface portion of contact arm
04/16/2013US8422729 System for configuring an optoelectronic sensor
04/16/2013US8422036 Edge sensing apparatus and method reducing sheet fly height error
04/16/2013US8422035 Distance-measuring method for a device projecting a reference line, and such a device
04/16/2013US8422034 Method and apparatus for using gestures to control a laser tracker
04/16/2013US8422033 Reflective optical sensor and image forming apparatus
04/16/2013US8422032 Position determination method
04/16/2013US8422031 Focusing methods and optical systems and assemblies using the same
04/16/2013US8422030 Fringe projection system with intensity modulating by columns of a plurality of grating elements
04/16/2013US8422029 Test method for surface figure of large convex mirrors
04/16/2013US8422028 Scanning microscope using an I/Q-interferometer
04/16/2013US8422027 Imaging optical system for producing control information regarding lateral movement of an image plane or an object plane
04/16/2013US8422026 Spectrally controllable light sources in interferometry
04/16/2013US8422025 Optical encoder for obtaining displacement information of object
04/16/2013US8422015 Movable body apparatus, pattern formation apparatus and exposure apparatus, and device manufacturing method
04/16/2013US8422006 System and method for testing lens module
04/16/2013US8418374 Apparatus for aligning and leveling a server rack rail
04/16/2013CA2696238C Physical quantity measuring apparatus utilizing optical frequency domain reflectometry, and method for simultaneous measurement of temperature and strain using the apparatus
04/16/2013CA2517397C Methods and apparatuses for the exact determination of an angle of rotation
04/13/2013CA2785405A1 System and method for depth from defocus imaging
04/11/2013WO2013052600A1 Using videogrammetry to fabricate parts
04/11/2013WO2013052100A1 Brake component monitoring
04/11/2013WO2013051716A1 Surface inspection system for semiconductor wafer
04/11/2013WO2013051382A1 Shape measuring device and shape measuring method
04/11/2013WO2013050417A1 Contactless method for determining the thickness of a sample, corresponding system
04/11/2013WO2013050316A1 Method and system for monitoring a parameter of a parabolic reflector
04/11/2013WO2013050227A1 Method and system for positioning an apparatus for monitoring a parabolic reflector aerially
04/11/2013WO2013050007A1 Method and apparatus for measuring shape deviations of mechanical parts
04/11/2013WO2013009065A3 Apparatus for 3d vision inspection of led component and method for vision inspection
04/11/2013US20130089935 Overlay and semiconductor process control using a wafer geometry metric
04/11/2013US20130088726 Method and Apparatus to Determine Depth Information For A Scene of Interest
04/11/2013US20130088725 Positioning method and positioning system based on light intensity
04/11/2013US20130088715 Automatic optimal positioning of spectrophotometer while measuring moving media
04/11/2013US20130088710 Optical Guide-Based Displacement/Force Sensor
04/11/2013US20130087695 Device and method for detecting presence of an object
04/11/2013DE102012108567A1 Verfahren und Vorrichtung zum Erlangen von Tiefeninformationen unter Verwendung eines Lichtmusters Method and apparatus for obtaining depth information by using a light pattern
04/11/2013DE102011115027A1 Kohärenzrasterinterferometer und Verfahren zur ortsaufgelösten optischen Vermessung der Oberflächengeometrie eines Objekts Kohärenzrasterinterferometer and method for spatially resolved optical measurement of the surface geometry of an object
04/11/2013DE102011114932A1 Method for determining contour of upper surface of object along measuring section, involves varying focusing of microscope objective relative to upper surface along measuring axis over scan range at measuring paths
04/11/2013DE102011054247A1 Sensor zur Erfassung von Objekten in einem Überwachungsbereich Sensor for detecting objects in a monitoring area
04/11/2013DE102009010086B4 Anordnung und Verfahren zur Messung der Temperatur und des Dickenwachstums von Siliziumstäben in einem Silizium-Abscheidereaktor Arrangement and method for measuring the temperature and thickness growth of silicon rods in a silicon deposition reactor